Jason Gow

ORCID iD
https://orcid.org/0000-0002-5208-7924
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Scopus Author ID: 22984865200

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Scopus to ORCID (2013-11-13)

ResearcherID: G-6686-2017

Sources:
ResearcherID (2017-04-27)

Biography

Jason's current research interests’ centre on the post irradiation behaviour of charge coupled devices (CCD) and CMOS image sensors (CIS), and how the creation of defects within the silicon band gap impacts device performance. Without a good understanding of the relationship between defect creation and charge transport the optimal detector performance cannot be achieved. Therefore to optimise the science outputs of a number of space based instruments, for example the Euclid visible imager, it is vital our understanding is improved allowing innovation in device operation and design and ensuring we continue to expand our understanding of the world around us. Jason's latest topic of interest is the behaviour of devices under cryogenic irradiation, where he has developed equipment and methods (published and presented at an international conference and workshop) to study the post irradiation behaviour of the device under test.
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