ORCID iD
https://orcid.org/0000-0002-9299-1504
  • Keywords
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Dislocation theory,

Sources:
University of Hong Kong (2014-05-05)

Electron microscopy of materials,

Sources:
University of Hong Kong (2014-05-05)

Mechanical properties of thin-films,

Sources:
University of Hong Kong (2014-05-05)

Mechanical testing techniques such as nanoindentation,

Sources:
University of Hong Kong (2014-05-05)

Microstructural basis of mechanical properties in metallic materials,

Sources:
University of Hong Kong (2014-05-05)

Theoretical modelling of material defects including atomistic simulation and dislocation dynamics simulation

Sources:
University of Hong Kong (2014-05-05)

  • Other IDs
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Scopus Author ID: 7006827202

Sources:
University of Hong Kong (2014-05-05)

ResearcherID: C-1896-2009

Sources:
University of Hong Kong (2014-05-05)

HKU ResearcherPage: rp00225

Sources:
University of Hong Kong (2014-05-05)

No public information available.

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