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Scopus Author ID: 26666252800

Keywords

Computer Dependability, Electronic Design Automation, Edge AI, IoT

Countries

Iran

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Employment (2)

Shiraz University: Shiraz, IR

2020-09-01 to present | Associate Professor (School of Electrical and Computer Engineering)
Employment
Source: Self-asserted source
Mohsen Raji

Shiraz University: Shiraz, Fars, IR

2016-01-01 to 2020-09-01 | Assistant Professor (School of Electrical & Computer Engineering)
Employment
Source: Self-asserted source
Mohsen Raji

Education and qualifications (1)

Amirkabir University of Technology: Tehran, Tehran, IR

2011-09-20 to 2015-09-30 | Ph.D. (Computer Engineering & IT)
Education
Source: Self-asserted source
Mohsen Raji

Works (41)

Progressive Bitwidth Assignment Approaches for Efficient Capsule Networks Quantization

IEEE Access
2025 | Journal article
DOI: 10.1109/ACCESS.2025.3534434
Contributors: Mohsen Raji; Amir Ghazizadeh Ahsaei; Kimia Soroush; Behnam Ghavami
Source: check_circle
Crossref

Lifetime Reliability-aware FSM State Assignment for Sequential Circuits Optimization Considering Process Variations and BTI

2024-08-24 | Preprint
DOI: 10.22541/au.172453930.05032753/v1
Contributors: Mohsen Raji; Behnam Ghavami; Saeed Keshavarzi; Reza Mahmoudi
Source: check_circle
Crossref

Reliable Circuit Design Using a Fast Incremental-Based Gate Sizing Under Process Variation

IEEE Transactions on Device and Materials Reliability
2022-09 | Journal article
DOI: 10.1109/TDMR.2022.3175914
Contributors: Behnam Ghavami; Mohsen Raji; Milad Ibrami; Lesley Shannon
Source: check_circle
Crossref

UMOTS: an uncertainty-aware multi-objective genetic algorithm-based static task scheduling for heterogeneous embedded systems

The Journal of Supercomputing
2022-01 | Journal article
DOI: 10.1007/s11227-021-03887-1
Contributors: Mohsen Raji; Mohaddaseh Nikseresht
Source: check_circle
Crossref

Lifetime Reliability Improvement of Nano-Scale Digital Circuits Using Dual Threshold Voltage Assignment

IEEE Access
2021 | Journal article
DOI: 10.1109/ACCESS.2021.3103200
Contributors: Mohsen Raji; Reza Mahmoudi; Behnam Ghavami; Saeed Keshavarzi
Source: check_circle
Crossref

A methodology for the SPICE-Compatible modelling of metal-semiconductor-metal photodetectors for nanophotonic interconnects application

Microelectronics Journal
2021-09 | Journal article
DOI: 10.1016/j.mejo.2021.105170
Contributors: Arash Qodratnama; Farshad Khunjush; Mohsen Raji
Source: check_circle
Crossref

BTI-Aware Timing Reliability Improvement of Pulsed Flip-Flops in Nano-Scale CMOS Technology

IEEE Transactions on Device and Materials Reliability
2021-09 | Journal article
DOI: 10.1109/TDMR.2021.3102521
Contributors: Atousa Jafari; Mohsen Raji; Behnam Ghavami
Source: check_circle
Crossref

A Statistical Gate Sizing Method for Timing Yield and Lifetime Reliability Optimization of Integrated Circuits

IEEE Transactions on Emerging Topics in Computing
2021-04-01 | Journal article
DOI: 10.1109/TETC.2020.2987946
Contributors: S. M. Ebrahimipour; Behnam Ghavami; Mohsen Raji
Source: check_circle
Crossref

Timing Reliability Improvement of Master-Slave Flip-Flops in the Presence of Aging Effects

IEEE Transactions on Circuits and Systems I: Regular Papers
2020-12 | Journal article
DOI: 10.1109/TCSI.2020.3024601
Contributors: Atousa Jafari; Mohsen Raji; Behnam Ghavami
Source: check_circle
Crossref

Improving Combinational Circuit Reliability Against Multiple Event Transients via a Partition and Restructuring Approach

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2020-05 | Journal article
DOI: 10.1109/TCAD.2019.2907922
Contributors: Mohammad Reza Rohanipoor; Behnam Ghavami; Mohsen Raji
Source: check_circle
Crossref

Soft Error Reliability Improvement of Digital Circuits by Exploiting a Fast Gate Sizing Scheme

IEEE Access
2019 | Journal article
DOI: 10.1109/ACCESS.2019.2902505
Contributors: Mohsen Raji; M. Amin Sabet; Behnam Ghavami
Source: check_circle
Crossref

Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops: A Comparative Analysis

IEEE Transactions on Device and Materials Reliability
2019-09 | Journal article
DOI: 10.1109/TDMR.2019.2933998
Contributors: Atousa Jafari; Mohsen Raji; Behnam Ghavami
Source: check_circle
Crossref

Process variation-aware gate sizing with fuzzy geometric programming

Computers & Electrical Engineering
2019-09 | Journal article
DOI: 10.1016/j.compeleceng.2019.07.015
Contributors: Behnam Ghavami; Mohsen Raji; Ramin Rasaizadi; Mashaallah Mashinchi
Source: check_circle
Crossref

A fast method for process reliability analysis of CNFET-based digital integrated circuits

Journal of Computational Electronics
2018 | Journal article
DOI: 10.1007/s10825-018-1134-8
EID:

2-s2.0-85042124594
Contributors: Saeedi, F.; Ghavami, B.; Raji, M.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

An Incremental Algorithm for Soft Error Rate Estimation of Combinational Circuits

IEEE Transactions on Device and Materials Reliability
2018 | Journal article
DOI: 10.1109/TDMR.2018.2865179
EID:

2-s2.0-85052577874
Contributors: Ghavami, B.; Raji, M.; Saremi, K.; Pedram, H.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

GPU-Accelerated Soft Error Rate Analysis of Large-scale Integrated Circuits

IEEE Design and Test
2018 | Journal article
DOI: 10.1109/MDAT.2018.2863703
EID:

2-s2.0-85051369293
Contributors: Sabet, M.A.; Ghavami, B.; Raji, M.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Redressing fork constraints in nanoscale quasi-delay-insensitive asynchronous pipelines

Journal of Supercomputing
2018 | Journal article
DOI: 10.1007/s11227-017-2056-0
EID:

2-s2.0-85018736195
Contributors: Raji, M.; Ghavami, B.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

A scalable solution to soft error tolerant circuit design using partitioning-based gate sizing

IEEE Transactions on Reliability
2017 | Journal article
DOI: 10.1109/TR.2016.2645479
EID:

2-s2.0-85009861374
Contributors: Sabet, M.A.; Ghavami, B.; Raji, M.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Soft error tolerant design of combinational circuits based on a local logic substitution scheme

Microelectronics Journal
2017 | Journal article
DOI: 10.1016/j.mejo.2017.08.006
EID:

2-s2.0-85027489700
Contributors: Rohanipoor, M.R.; Ghavami, B.; Raji, M.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Soft Error Rate Reduction of Combinational Circuits Using Gate Sizing in the Presence of Process Variations

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2017-01 | Journal article
DOI: 10.1109/TVLSI.2016.2569562
Contributors: Mohsen Raji; Behnam Ghavami
Source: check_circle
Crossref
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A Fast Statistical Soft Error Rate Estimation Method for Nano-scale Combinational Circuits

Journal of Electronic Testing: Theory and Applications (JETTA)
2016 | Journal article
DOI: 10.1007/s10836-016-5583-3
EID:

2-s2.0-84963724659
Contributors: Raji, M.; Ghavami, B.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Design of fault tolerant digital integrated circuits based on quadded transistor logic

2016 8th International Conference on Information and Knowledge Technology, IKT 2016
2016 | Conference paper
DOI: 10.1109/IKT.2016.7777765
EID:

2-s2.0-85010951384
Contributors: Rohanipoor, M.R.; Ghavami, B.; Raji, M.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Failure Characterization of Carbon Nanotube FETs under Process Variations: Technology Scaling Issues

IEEE Transactions on Device and Materials Reliability
2016 | Journal article
DOI: 10.1109/TDMR.2016.2543659
EID:

2-s2.0-84976328892
Contributors: Ghavami, B.; Raji, M.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

A practical metric for soft error vulnerability analysis of combinational circuits

Microelectronics Reliability
2015 | Journal article
DOI: 10.1016/j.microrel.2014.11.004
EID:

2-s2.0-84921500052
Contributors: Raji, M.; Pedram, H.; Ghavami, B.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Gate resizing for soft error rate reduction in nano-scale digital circuits considering process variations

Proceedings - 18th Euromicro Conference on Digital System Design, DSD 2015
2015 | Conference paper
DOI: 10.1109/DSD.2015.103
EID:

2-s2.0-84958212345
Contributors: Raji, M.; Ghavami, B.; Pedram, H.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Soft error rate estimation of combinational circuits based on vulnerability analysis

IET Computers and Digital Techniques
2015 | Journal article
DOI: 10.1049/iet-cdt.2014.0157
EID:

2-s2.0-84945945859
Contributors: Raji, M.; Pedram, H.; Ghavami, B.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

An efficient approach for soft error rate estimation of combinational circuits

Proceedings - 2014 17th Euromicro Conference on Digital System Design, DSD 2014
2014 | Conference paper
DOI: 10.1109/DSD.2014.67
EID:

2-s2.0-84928806924
Contributors: Raji, M.; Saeedi, F.; Ghavami, B.; Pedram, H.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Design and analysis of a robust carbon nanotube-based asynchronous primitive circuit

ACM Journal on Emerging Technologies in Computing Systems
2013 | Journal article
DOI: 10.1145/2422094.2422098
EID:

2-s2.0-84874883551
Contributors: Ghavami, B.; Raji, M.; Pedram, H.; Tahoori, M.B.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Statistical functional yield estimation and enhancement of CNFET-based VLSI circuits

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2013 | Journal article
DOI: 10.1109/TVLSI.2012.2197765
EID:

2-s2.0-84876790913
Contributors: Ghavami, B.; Raji, M.; Pedram, H.; Pedram, M.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Assessment of nano-scale Muller C-elements under variability based on a new fault model

CADS 2012 - 16th CSI International Symposium on Computer Architecture and Digital Systems
2012 | Conference paper
DOI: 10.1109/CADS.2012.6316431
EID:

2-s2.0-84869072553
Contributors: Raji, M.; Ghavami, B.; Zarandi, H.R.; Pedram, H.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Assessment of nano-scale asynchronous PCFB circuits under extreme process variation

Proceedings of the 3rd Asia Symposium on Quality Electronic Design, ASQED 2011
2011 | Conference paper
DOI: 10.1109/ASQED.2011.6111715
EID:

2-s2.0-84855886710
Contributors: Raji, M.; Ghavami, B.; Zarandi, H.R.; Pedram, H.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

CNT-count failure characteristics of Carbon Nanotube FETs under process variations

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
2011 | Conference paper
DOI: 10.1109/DFT.2011.31
EID:

2-s2.0-84855784473
Contributors: Ghavami, B.; Raji, M.; Pedram, H.; Arjmand, O.N.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

HVD: Horizontal-vertical-diagonal error detecting and correcting code to protect against with soft errors

Design Automation for Embedded Systems
2011 | Journal article
DOI: 10.1007/s10617-011-9078-2
EID:

2-s2.0-84855349842
Contributors: Kishani, M.; Zarandi, H.R.; Pedram, H.; Tajary, A.; Raji, M.; Ghavami, B.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Metallic-CNT and non-uniform CNTs tolerant design of CNFET-based circuits using independent N<sup>2</sup>-transistor structures

Proceedings - 2011 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2011
2011 | Conference paper
DOI: 10.1109/ISVLSI.2011.68
EID:

2-s2.0-80052565787
Contributors: Ghavami, B.; Raji, M.; Pedram, H.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Statistical leakage power optimization of asynchronous circuits considering process variations

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
2011 | Book
DOI: 10.1007/978-3-642-17752-1_13
EID:

2-s2.0-85037543303
Contributors: Raji, M.; Tajary, A.; Ghavami, B.; Pedram, H.; Zarandi, H.R.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Statistical leakage power optimization of asynchronous circuits considering process variations

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
2011 | Book
DOI: 10.1007/978-3-642-17752-1-13
EID:

2-s2.0-79551569927
Contributors: Raji, M.; Tajary, A.; Ghavami, B.; Pedram, H.; Zarandi, H.R.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Timing yield estimation of carbon nanotube-based digital circuits in the presence of nanotube density variation and metallic-nanotubes

Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011
2011 | Conference paper
DOI: 10.1109/ISQED.2011.5770806
EID:

2-s2.0-79959275349
Contributors: Ghavami, B.; Raji, M.; Pedram, H.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Defect and variation issues on design mapping of reconfigurable nanoscale crossbars

Proceedings - IEEE Annual Symposium on VLSI, ISVLSI 2010
2010 | Conference paper
EID:

2-s2.0-77957896474
Contributors: Ghavami, B.; Tajary, A.; Raji, M.; Pedram, H.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Process variation aware performance analysis of asynchronous circuits considering spatial correlation

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
2010 | Book
DOI: 10.1007/978-3-642-11802-9_5
EID:

2-s2.0-77951110065
Contributors: Raji, M.; Ghavami, B.; Zarandi, H.R.; Pedram, H.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Process variation-aware performance analysis of asynchronous circuits

Microelectronics Journal
2010 | Journal article
DOI: 10.1016/j.mejo.2009.12.013
EID:

2-s2.0-77649184967
Contributors: Raji, M.; Ghavami, B.; Pedram, H.; Zarandi, H.R.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Statistical static performance analysis of asynchronous circuits considering process variation

Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009
2009 | Conference paper
DOI: 10.1109/ISQED.2009.4810310
EID:

2-s2.0-67649651512
Contributors: Raji, M.; Ghavami, B.; Pedram, H.
Source: Self-asserted source
Mohsen Raji via Scopus - Elsevier

Peer review (6 reviews for 3 publications/grants)

Review activity for Journal of electronic testing. (3)
Review activity for Microelectronics and reliability. (1)
Review activity for The journal of supercomputing. (2)
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