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Estonia

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Employment (1)

Tallinn University of Technology: Tallinn, EE

2021-08-10 to 2023-07-31 | Post Doctoral Researcher (Computer Systems)
Employment
Source: Self-asserted source
Foisal Ahmed

Education and qualifications (1)

Nara Institute of Science and Technology: Ikoma, JP

2017-10-01 to 2020-09-30 | Ph.D (Graduate School of Science and Technology)
Education
Source: Self-asserted source
Foisal Ahmed

Works (10)

Reliability-Critical Computation Offloading in UAV Swarms

IEEE Systems Journal
2024 | Journal article
Contributors: Dadmehr Rahbari; Foisal Ahmed; Maksim Jenihhin; Muhammad Mahtab Alam; Yannick Le Moullec
Source: check_circle
Crossref

A Survey on UAV Computing Platforms: A Hardware Reliability Perspective

Sensors
2022-08-21 | Journal article
Contributors: Foisal Ahmed; Maksim Jenihhin
Source: check_circle
Crossref
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Preferred source (of 2)‎

Systematic Unsupervised Recycled Field-Programmable Gate Array Detection

IEEE Transactions on Device and Materials Reliability
2022-06 | Journal article
Contributors: Yuya Isaka; Michihiro Shintani; Foisal Ahmed; Michiko Inoue
Source: check_circle
Crossref

Study on High-Accuracy and Low-Cost Recycled FPGA Detection

Proceedings - International Test Conference
2021 | Conference paper
EID:

2-s2.0-85123049487

Part of ISSN: 10893539
Contributors: Ahmed, F.; Shintani, M.; Inoue, M.
Source: Self-asserted source
Foisal Ahmed via Scopus - Elsevier

Unsupervised Recycled FPGA Detection Based on Direct Density Ratio Estimation

Proceedings - 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design, IOLTS 2021
2021 | Conference paper
EID:

2-s2.0-85112056221

Contributors: Isaka, Y.; Ahmed, F.; Shintani, M.; Inoue, M.
Source: Self-asserted source
Foisal Ahmed via Scopus - Elsevier

Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2021-08 | Journal article
Contributors: Foisal Ahmed; Michihiro Shintani; Michiko Inoue
Source: check_circle
Crossref
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Preferred source (of 2)‎

Cost-efficient recycled FPGA detection through statistical performance characterization framework

IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
2020 | Journal article
EID:

2-s2.0-85092023357

Part of ISSN: 17451337 09168508
Contributors: Ahmed, F.; Shintani, M.; Inoue, M.
Source: Self-asserted source
Foisal Ahmed via Scopus - Elsevier

Feature engineering for recycled FPGA Detection Based on WID variation modeling

Proceedings of the European Test Workshop
2019 | Conference paper
EID:

2-s2.0-85071154250

Part of ISSN: 15581780 15301877
Contributors: Ahmed, F.; Shintani, M.; Inoue, M.
Source: Self-asserted source
Foisal Ahmed via Scopus - Elsevier

Low cost recycled FPGA detection using virtual probe technique

Proceedings - 2019 IEEE International Test Conference in Asia, ITC-Asia 2019
2019 | Conference paper
EID:

2-s2.0-85074416776

Contributors: Ahmed, F.; Shintani, M.; Inoue, M.
Source: Self-asserted source
Foisal Ahmed via Scopus - Elsevier

Design of a high speed OFDM transmitter and receiver

8th International Conference on Electrical and Computer Engineering: Advancing Technology for a Better Tomorrow, ICECE 2014
2015 | Conference paper
EID:

2-s2.0-84923238713

Contributors: Ahmed, F.; Ali, M.L.; Asad, M.I.H.B.
Source: Self-asserted source
Foisal Ahmed via Scopus - Elsevier