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Works (28)
International Journal of Information Technology and Management
2021
|
Journal article
EID:
2-s2.0-85104073927
Contributors:
Ellappan, V.;
Rajkumar, R.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Computer Aided Engineering and Technology
2020
|
Journal article
EID:
2-s2.0-85083054163
Contributors:
Ellappan, V.;
Rajkumar, R.
Source:
vijayan ellappan
via
Scopus - Elsevier
Journal of Testing and Evaluation
2019
|
Journal article
EID:
2-s2.0-85065125131
Contributors:
Ranjani, J.J.;
Selvapriya, A.S.;
Vijayan, E.
Source:
vijayan ellappan
via
Scopus - Elsevier
IOP Conference Series: Materials Science and Engineering
2017
|
Conference paper
EID:
2-s2.0-85037814705
Contributors:
Senthilkumar, K.;
Vivek, N.K.;
Vijayan, E.
Source:
vijayan ellappan
via
Scopus - Elsevier
IOP Conference Series: Materials Science and Engineering
2017
|
Conference paper
EID:
2-s2.0-85037808348
Contributors:
Ellappan, V.;
Ashwini, J.
Source:
vijayan ellappan
via
Scopus - Elsevier
IOP Conference Series: Materials Science and Engineering
2017
|
Conference paper
EID:
2-s2.0-85037808495
Contributors:
Ellappan, V.;
Chaki, S.;
Kumar, A.
Source:
vijayan ellappan
via
Scopus - Elsevier
Proceedings - 2017 2nd International Conference on Recent Trends and Challenges in Computational Models, ICRTCCM 2017
2017
|
Conference paper
EID:
2-s2.0-85034665019
Contributors:
Ellappan, V.;
Rajasekaran, R.
Source:
vijayan ellappan
via
Scopus - Elsevier
IOP Conference Series: Materials Science and Engineering
2017
|
Conference paper
EID:
2-s2.0-85037812958
Contributors:
Ellappan, V.;
Kumari, S.
Source:
vijayan ellappan
via
Scopus - Elsevier
IOP Conference Series: Materials Science and Engineering
2017
|
Conference paper
EID:
2-s2.0-85037814183
Contributors:
Senthilkumar, K.;
Ruchika Mehra Vijayan, E.
Source:
vijayan ellappan
via
Scopus - Elsevier
IOP Conference Series: Materials Science and Engineering
2017
|
Conference paper
EID:
2-s2.0-85037809695
Contributors:
Ellappan, V.;
Chopra, V.
Source:
vijayan ellappan
via
Scopus - Elsevier
IOP Conference Series: Materials Science and Engineering
2017
|
Conference paper
EID:
2-s2.0-85037807811
Contributors:
Senthilkumar, K.;
Ellappan, V.;
Ajay
Source:
vijayan ellappan
via
Scopus - Elsevier
IOP Conference Series: Materials Science and Engineering
2017
|
Conference paper
EID:
2-s2.0-85037811878
Contributors:
Senthilkumar, K.;
Ellappan, V.;
Arun, A.R.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Pharmacy and Technology
2016
|
Journal article
EID:
2-s2.0-84992370265
Contributors:
Vijayan, E.;
Hemalatha, S.;
Shaw, S.;
Ghoshal, A.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Pharmacy and Technology
2016
|
Journal article
EID:
2-s2.0-85018201454
Contributors:
Kumar, R.;
Ellappan, V.;
Kumar, P.J.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Pharmacy and Technology
2016
|
Journal article
EID:
2-s2.0-84992431101
Contributors:
Vijayan, E.;
Senthil Kumar, K.;
Singh, A.;
Khatoon, Y.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Pharmacy and Technology
2016
|
Journal article
EID:
2-s2.0-84992420756
Contributors:
Vijayan, E.;
Senthil Kumar, N.C.;
Shukla, N.;
Dwivedi, R.P.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Pharmacy and Technology
2016
|
Journal article
EID:
2-s2.0-84992390656
Contributors:
Vijayan, E.;
Senthilkumar, N.C.;
Nirmal Kumar, J.;
Rastogi, M.;
Himika, I.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Pharmacy and Technology
2016
|
Journal article
EID:
2-s2.0-85018205823
Contributors:
Dubey, A.K.;
Ellappan, V.;
Paul, R.;
Chopra, V.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Pharmacy and Technology
2016
|
Journal article
EID:
2-s2.0-85018207091
Contributors:
Khandelwal, R.;
Ellappan, V.;
Ajay;
Hamsadhvani, A.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Pharmacy and Technology
2016
|
Journal article
EID:
2-s2.0-84992383173
Contributors:
Vijayan, E.;
Senthilkumar, K.;
Kumari, P.;
Tolani, S.;
Bhadra, P.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Pharmacy and Technology
2016
|
Journal article
EID:
2-s2.0-84992391003
Contributors:
Vijayan, E.;
Senthil Kumar, N.C.;
Agnihotry, S.;
Subuhani, M.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Pharmacy and Technology
2016
|
Journal article
EID:
2-s2.0-85018206881
Contributors:
Ellappan, V.;
Upadhayay, D.;
Yadav, R.;
Vandana
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Pharmacy and Technology
2016
|
Journal article
EID:
2-s2.0-85018204701
Contributors:
Kumar, P.J.;
Ellappan, V.;
Badala, P.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Pharmacy and Technology
2016
|
Journal article
EID:
2-s2.0-84992436658
Contributors:
Vijayan, E.;
Senthilkumar, K.;
Shalini, A.M.;
Suganya, N.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Applied Engineering Research
2014
|
Journal article
EID:
2-s2.0-84939199672
Contributors:
Vijayan, E.;
Hemalatha, S.;
Senthilkumar, N.C.;
Yadav, K.S.;
Nayak, P.K.;
Gupta, P.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Applied Engineering Research
2014
|
Journal article
EID:
2-s2.0-84939181860
Contributors:
Vijayan, E.;
Chaurasia, R.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Applied Engineering Research
2014
|
Journal article
EID:
2-s2.0-84904497261
Contributors:
Vijayan, E.;
Arun Kumar, T.;
Anand, M.
Source:
vijayan ellappan
via
Scopus - Elsevier
International Journal of Applied Engineering Research
2014
|
Journal article
EID:
2-s2.0-84919753059
Contributors:
Vijayan, E.;
Hemalatha, S.;
Senthil Kumar, N.C.;
Franklin Rajkumar, V.;
Manekandan, G.R.S.
Source:
vijayan ellappan
via
Scopus - Elsevier