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Scopus Author ID: 57203981941

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Works (6)

Keep Your Distance: Determining Sampling and Distance Thresholds in Machine Learning Monitoring

2022 | Book chapter
DOI: 10.1007/978-3-031-15842-1_16
Contributors: Al-Harith Farhad; Ioannis Sorokos; Andreas Schmidt; Mohammed Naveed Akram; Koorosh Aslansefat; Daniel Schneider
Source: check_circle
Crossref

StaDRe and StaDRo: Reliability and Robustness Estimation of ML-Based Forecasting Using Statistical Distance Measures

2022 | Book chapter
DOI: 10.1007/978-3-031-14862-0_21
Contributors: Mohammed Naveed Akram; Akshatha Ambekar; Ioannis Sorokos; Koorosh Aslansefat; Daniel Schneider
Source: check_circle
Crossref

Engineering and hardening of functional fail-operational architectures for highly automated driving

Proceedings - 2019 IEEE 30th International Symposium on Software Reliability Engineering Workshops, ISSREW 2019
2019 | Conference paper
DOI: 10.1109/ISSREW.2019.00038
EID:

2-s2.0-85080955121
Contributors: Adler, R.; Akram, M.N.; Feth, P.; Fukuda, T.; Ishigooka, T.; Otsuka, S.; Schneider, D.; Yoshimura, K.
Source: Self-asserted source
Mohammed Naveed Akram via Scopus - Elsevier

Hardening of artificial neural networks for use in safety-critical applications- A mapping study

arXiv
2019 | Other
EID:

2-s2.0-85093560603

Part of ISSN: 23318422
Contributors: Adler, R.; Akram, M.N.; Bauer, P.; Feth, P.; Gerber, P.; Jedlitschka, A.; Jöckel, L.; Klaes, M.; Schneider, D.
Source: Self-asserted source
Mohammed Naveed Akram via Scopus - Elsevier

Dynamic risk assessment for vehicles of higher automation levels by deep learning

arXiv
2018 | Other
EID:

2-s2.0-85092867140

Part of ISSN: 23318422
Contributors: Feth, P.; Akram, M.N.; Schuster, R.; Wasenmüller, O.
Source: Self-asserted source
Mohammed Naveed Akram via Scopus - Elsevier

Dynamic risk assessment for vehicles of higher automation levels by deep learning

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
2018 | Book
DOI: 10.1007/978-3-319-99229-7_48
EID:

2-s2.0-85053867015

Part of ISSN: 16113349 03029743
Contributors: Feth, P.; Akram, M.N.; Schuster, R.; Wasenmüller, O.
Source: Self-asserted source
Mohammed Naveed Akram via Scopus - Elsevier
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