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SciProfiles: 1167265

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Employment (4)

Sandia National Laboratories: Albuquerque, US

2024-04-01 to present | Distinguished Member of Technical Staff (Power Electronics and Energy Conversion Systems)
Employment
Source: Self-asserted source
Jack Flicker

Sandia National Laboratories: Albuquerque, US

2020-03-01 to 2024-04-01 | Principal Member of Technical Staff (Power Electronics and Energy Conversion Systems)
Employment
Source: Self-asserted source
Jack Flicker

Sandia National Laboratories: Albuquerque, US

2014-03-01 to 2020-03-01 | Senior Member of Technical Staff (Distribution Systems and Grid Integration)
Employment
Source: Self-asserted source
Jack Flicker

Sandia National Laboratories: Albuquerque, US

2011-11-21 to 2014-03-01 | Postdoctoral Appointee (Radiation Effects and Advanced Devices)
Employment
Source: Self-asserted source
Jack Flicker

Works (15)

Experimental Characterization Test of a Grid-Forming Inverter for Microgrid Applications: Preprint

2023-11 | Conference paper
DOI: 10.1109/ECCE53617.2023.10362850
OTHER-ID: 2205501
Contributors: Wang, Jing; ; Ganguly, Subhankar (ORCID:0000000333070614); ; Thiagarajan, Ramanathan; ; Shirazi, Mariko; ; Guruwacharya, Nischal; ; Flicker, Jack David; ; Kroposki, Benjamin
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV

Reliability evaluation of DC power optimizers for photovoltaic systems: Accelerated testing at high temperatures with fixed and cyclic power stresses

Engineering Failure Analysis
2023-10 | Journal article
DOI: 10.1016/j.engfailanal.2023.107484
OTHER-ID: 1989705
Contributors: Afridi, Muhammad; ; Tatapudi, Sai; ; Flicker, Jack; ; Srinivasan, Devarajan; ; Tamizhmani, Govindasamy
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV

Reliability of Microinverters for Photovoltaic Systems: High-Temperature Accelerated Testing with Fixed and Cyclic Power Stresses

Energies
2023-09 | Journal article | Author
DOI: 10.3390/en16186511
Contributors: Muhammad Zain Ul Abideen Afridi; Sai Tatapudi; Jack Flicker; Devarajan Srinivasan; Govindasamy Tamizhmani
Source: check_circle
Multidisciplinary Digital Publishing Institute

Inverter Reliability Estimation for Advanced Inverter Functionality

2022-11 | Conference paper
DOI: 10.1109/PVSC48317.2022.9938597
OTHER-ID: 1913956
Contributors: Flicker, Jack; ; Johnson, Jay; ; Reno, Matthew J.; ; Azzolini, Joseph A.; ; Hacke, Peter; ; Thiagarajan, Ramanathan
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV

Reverse Breakdown Time of Wide Bandgap Diodes.

2022-11 | Conference paper
DOI: 10.2172/2005972
OTHER-ID: 2005972
Contributors: Flicker, Jack; ; Kaplar, Robert; ; Schrock, Emily
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV

PV inverter reliability: Advanced Inverter Functionality.

2022-09 | Conference paper
DOI: 10.2172/2004723
OTHER-ID: 2004723
Contributors: Flicker, Jack
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV

Ultrawide Bandgap Semiconductors: Influence of Material Properties on Power Device Performance.

2022-08 | Conference paper
DOI: 10.2172/2004464
OTHER-ID: 2004464
Contributors: Goodnick, Stephen; ; Shoemaker, Jonah; ; Nemanich, Robert; ; Kaplar, Robert; ; Flicker, Jack; ; Binder, Andrew
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV

Automating Component-Level Stress Measurements for Inverter Reliability Estimation

Energies
2022-07 | Journal article | Author
DOI: 10.3390/en15134828
Contributors: Jack Flicker; Jay Johnson; Peter Hacke; Ramanathan Thiagarajan
Source: check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source (of 2)‎

Component Testing, Co-Optimization, and Trade-Space Evaluation.

2022-04 | Conference paper
DOI: 10.2172/2002922
OTHER-ID: 2002922
Contributors: Gill, Lee; ; Rashkin, Lee; ; Yates, Luke; ; Subramania, Ganapathi; ; Flicker, Jack; ; Binder, Andrew; ; Monson, Todd; ; Kaplar, Robert; ; Neely, Jason
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV

Analysis of the dependence of critical electric field on semiconductor bandgap

Journal of Materials Research
2022-02 | Journal article
DOI: 10.1557/s43578-021-00465-2
OTHER-ID: 1843053
Contributors: Slobodyan, Oleksiy (ORCID:000000029882407X); ; Flicker, Jack; ; Dickerson, Jeramy; ; Shoemaker, Jonah; ; Binder, Andrew; ; Smith, Trevor; ; Goodnick, Stephen; ; Kaplar, Robert; ; Hollis, Mark
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV

Dependence of Critical Electric Field on Semiconductor Bandgap - An Analytical Study.

2020-12 | Conference paper
DOI: 10.2172/1835966
OTHER-ID: 1835966
Contributors: Hollis, Mark; ; Slobodyan, Oleksiy; ; Flicker, Jack David; ; Dickerson, Jeramy Ray; ; Binder, Andrew; ; Smith, Trevor; ; Kaplar, Robert
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV

Hybrid Switched Capacitor Circuit (HSCC) Development for Use of WBG Diodes in High Gain Step-Up Converters.

2018-06 | Conference paper
OTHER-ID: 1529754
Contributors: Neely, Jason C.; ; Flicker, Jack David; ; Rashkin, Lee Joshua; ; Brocato, Robert W.; ; Delhotal, Jarod
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV

Design Optimization of GaN Vertical Power Diodes and Comparison to Si and SiC.

2018-01 | Conference paper
DOI: 10.1109/WiPDA.2017.8170498
OTHER-ID: 1513658
Contributors: Flicker, Jack David; ; Kaplar, Robert
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV

Design & Evaluation of a Hybrid Switched Capacitor Circuit with Wide-Bandgap Devices for Compact MVDC PV Power Conversion.

2017-08 | Conference paper
OTHER-ID: 1467796
Contributors: Neely, Jason C.; ; Stewart, Joshua; ; Flicker, Jack David; ; Delhotal, Jarod James; ; Gonzalez, Sigifredo; ; Kaplar, Robert; ; Lehr, Jane; ; Rashkin, Lee Joshua; ; Neely, Jason C.
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV

Switching Characterization of Vertical GaN PiN Diodes.

2016-10 | Conference paper
DOI: 10.1109/WiPDA.2016.7799924
OTHER-ID: 1405261
Contributors: Matthews, Christopher; ; Flicker, Jack David; ; Kaplar, Robert; ; Van Heukelom, Michael; ; Atcitty, Stanley; ; Kizilyalli, Isik; ; Aktas, Ozgur
Source: Self-asserted source
Jack Flicker via DOE OSTI.GOV
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