Personal information
coordinate metrology, CMM, uncertainty determination, simulation, Monte Carlo, Laser Tracker, AACMM,
Poland
Activities
Employment (1)
2019-04
to
present
|
Associate Professor
(Laboratory of Coordinate Metrology)
Employment
Source:
Adam Gąska
Works (31)
Advances in Science and Technology Research Journal
2024-11-01
|
Journal article
Contributors:
Adam Gąska;
Piotr Gąska;
Maciej Gruza;
Wiktor Harmatys;
Tomasz Kowaluk;
Adam Styk;
Michał Jakubowicz;
Adam Wójtowicz;
Mariusz Andrzej Wiśniewski;
Jerzy Sładek
Source:
check_circle
Crossref
Advances in Science and Technology Research Journal
2023-12-01
|
Journal article
Contributors:
Przemysław Zięba;
Adam Gąska;
Wiktor Harmatys;
Marcin Krawczyk
Source:
check_circle
Crossref
Applied Sciences
2022-12-04
|
Journal article
Contributors:
Wiesław Zaborowski;
Wiktor Harmatys;
Adam Gąska
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
Materials
2022-06-10
|
Journal article
Contributors:
Wiktor Harmatys;
Piotr Gąska;
Adam Gąska;
Maciej Gruza;
Michał Jedynak;
Konrad Kobiela;
Michael Marxer
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
Applied Sciences
2021-10-08
|
Journal article
Contributors:
Maciej Gruza;
Adam Gąska;
Jerzy A. Sładek;
Slavenko M. Stojadinovic;
Vidosav D. Majstorovic;
Piotr Gąska;
Wiktor Harmatys
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
Applied Sciences
2021-09-10
|
Journal article
Contributors:
Slavenko M. Stojadinovic;
Vidosav D. Majstorovic;
Adam Gąska;
Jerzy Sładek;
Numan M. Durakbasa
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
Sensors
2021-04-03
|
Journal article
Contributors:
Wiktor Harmatys;
Adam Gąska;
Piotr Gąska;
Maciej Gruza;
Jerzy A. Sładek
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
Advances in Science and Technology Research Journal
2019-12-01
|
Journal article
Contributors:
Maciej Gruza;
Piotr Gąska;
Adam Gąska;
Wiktor Harmatys;
Michał Jedynak;
Konrad Kobiela
Source:
check_circle
Crossref
Applied Sciences
2018-12
|
Journal article
|
Author
Contributors:
Adam Gąska;
Piotr Gąska;
Maciej Gruza;
Jerzy Sładek
Source:
check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
Source:
check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
Applied Sciences
2016-05-11
|
Journal article
Contributors:
Adam Gąska;
Piotr Gąska;
Maciej Gruza
Source:
check_circle
Crossref
Measurement: Journal of the International Measurement Confederation
2015
|
Journal article
EID:
2-s2.0-84924908173
Contributors:
Gąska, A.;
Sładek, J.;
Ostrowska, K.;
Kupiec, R.;
Krawczyk, M.;
Harmatys, W.;
Gąska, P.;
Gruza, M.;
Owczarek, D.;
Knapik, R.
et al.
Source:
Adam Gąska
via
Scopus - Elsevier
Technisches Messen
2015
|
Journal article
EID:
2-s2.0-84931089212
Contributors:
Krawczyk, M.;
Gąska, A.;
Sładek, J.
Source:
Adam Gąska
via
Scopus - Elsevier
Technisches Messen
2014
|
Journal article
EID:
2-s2.0-84914154217
Contributors:
Kohut, P.;
Gaska, A.;
Holak, K.;
Ostrowska, K.;
Sładek, J.;
Uhl, T.;
Dworakowski, Z.
Source:
Adam Gąska
via
Scopus - Elsevier
11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry, LMPMI 2014
2014
|
Conference paper
EID:
2-s2.0-84907351761
Contributors:
Ostrowska, K.;
Ga̧ska, A.;
Kupiec, R.;
Sładek, J.
Source:
Adam Gąska
via
Scopus - Elsevier
2014
|
Conference paper
EID:
2-s2.0-84907337256
Contributors:
Ga̧ska, A.;
Sładek, J.;
Ostrowska, K.;
Kupiec, R.;
Krawczyk, M.;
Harmatys, W.;
Ga̧ska, P.;
Gruza, M.;
Szewczyk, D.;
Knapik, R.
et al.
Source:
Adam Gąska
via
Scopus - Elsevier
2014
|
Journal article
EID:
2-s2.0-84897661800
Contributors:
Ostrowska, K.;
Ga̧ska, A.;
Sładek, J.
Source:
Adam Gąska
via
Scopus - Elsevier
2014
|
Conference paper
EID:
2-s2.0-84907343315
Contributors:
Krawczyk, M.;
Ga̧ska, A.;
Sładek, J.
Source:
Adam Gąska
via
Scopus - Elsevier
2014
|
Journal article
EID:
2-s2.0-84903162344
Contributors:
Gaska, A.;
Krawczyk, M.;
Kupiec, R.;
Ostrowska, K.;
Gaska, P.;
Sladek, J.
Source:
Adam Gąska
via
Scopus - Elsevier
2014
|
Journal article
EID:
2-s2.0-84900842620
Contributors:
Gaska, A.;
Szewczyk, D.;
Gaska, P.;
Gruza, M.;
Sladek, J.
Source:
Adam Gąska
via
Scopus - Elsevier
2013
|
Conference paper
EID:
2-s2.0-84907350200
Contributors:
Ostrowska, K.;
Ga̧ska, A.;
Kupiec, R.;
Sładek, J.
Source:
Adam Gąska
via
Scopus - Elsevier
2013
|
Journal article
EID:
2-s2.0-84875189613
Contributors:
Ryniewicz, A.;
Ryniewicz, A.M.;
Madej, T.;
Sładek, J.;
Gaska, A.
Source:
Adam Gąska
via
Scopus - Elsevier
2013
|
Conference paper
EID:
2-s2.0-84907371118
Contributors:
Ga̧ska, A.;
Sładek, J.;
Ostrowska, K.;
Kupiec, R.;
Krawczyk, M.;
Harmatys, W.;
Ga̧ska, P.;
Gruza, M.;
Szewczyk, D.;
Knapik, R.
et al.
Source:
Adam Gąska
via
Scopus - Elsevier
2013
|
Journal article
EID:
2-s2.0-84871722816
Contributors:
Sładek, J.;
Ostrowska, K.;
Kohut, P.;
Holak, K.;
Ga̧ska, A.;
Uhl, T.
Source:
Adam Gąska
via
Scopus - Elsevier
2013
|
Conference paper
EID:
2-s2.0-84907368483
Contributors:
Krawczyk, M.;
GAşKA, A.;
Sładek, J.
Source:
Adam Gąska
via
Scopus - Elsevier
2013
|
Journal article
EID:
2-s2.0-84870237002
Contributors:
Sładek, J.;
Ostrowska, K.;
Gaȩska, A.
Source:
Adam Gąska
via
Scopus - Elsevier
2013
|
Journal article
EID:
2-s2.0-84875207776
Contributors:
Sładek, J.;
Gaska, A.;
Olszewska, M.;
Kupiec, R.;
Krawczyk, M.
Source:
Adam Gąska
via
Scopus - Elsevier
2012
|
Journal article
EID:
2-s2.0-84860481878
Contributors:
Sładek, J.;
Ga̧ska, A.
Source:
Adam Gąska
via
Scopus - Elsevier
2012
|
Conference paper
EID:
2-s2.0-84880400451
Contributors:
Sładek, J.;
Gaska, A.;
Krawczyk, M.
Source:
Adam Gąska
via
Scopus - Elsevier
10th International Symposium on Measurement and Quality Control 2010, ISMQC 2010
2010
|
Journal article
Contributors:
Sładek, J.
Source:
Adam Gąska
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Advances in Coordinate Metrology
2010
|
Journal article
Contributors:
Sladek, J.
Source:
Adam Gąska
via
Scopus - Elsevier
grade
Preferred source
(of
2)