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Employment (2)

Argotec: Turin, Turin, IT

2023-11-02 to present | Avionics System Engineer (Electronics)
Employment
Source: Self-asserted source
Daniele Rizzieri

Politecnico di Torino: Torino, Piemonte, IT

2021-09-01 to 2023-11-01 | Research Fellow (Dipartimento di Automatica e Informatica (DAUIN))
Employment
Source: Self-asserted source
Daniele Rizzieri

Works (12)

A New Reliability Analysis of RISC-V Soft Processor for Safety-Critical Systems

2024-01-01 | Conference paper
DOI: 10.1109/DDECS60919.2024.10508921
HANDLE: 11583/2987728
EID:

2-s2.0-85192823320

WOSUID:

WOS:001227439800019
Source: check_circle
Politecnico di Torino - IRIS

EUFRATE: A High-Perfomance Reconfigurable Architecture for Radiation-hardened Telecom Payloads

2023-01-01 | Conference paper
DOI: 10.23919/EDHPC59100.2023.10396517
HANDLE: 11583/2986186
EID:

2-s2.0-85184852086
Source: check_circle
Politecnico di Torino - IRIS

EuFRATE: European FPGA Radiation-hardened Architecture for Telecommunications

2023-01-01 | Conference paper
DOI: 10.23919/DATE56975.2023.10137035
HANDLE: 11583/2974542
EID:

2-s2.0-85162617509

WOSUID:

WOS:001027444200106
Source: check_circle
Politecnico di Torino - IRIS

Programmable SEL Test Monitoring System for Radiation Hardness Assurance

2023-01-01 | Conference paper
DOI: 10.1109/DSN-S58398.2023.00061
HANDLE: 11583/2979319
EID:

2-s2.0-85169292294

WOSUID:

WOS:001248434000045
Source: check_circle
Politecnico di Torino - IRIS

Radiation Effects in Real-Time Soft Processors: Relating Software Errors to Hardware Faults

2023-01-01 | Conference paper
DOI: 10.1109/RADECS59069.2023.10766965
HANDLE: 11583/2979315
Source: check_circle
Politecnico di Torino - IRIS

Radiation-Induced Errors in the Software Level of Real-Time Soft Processing System

2023-01-01 | Conference paper
DOI: 10.1109/IOLTS59296.2023.10224884
HANDLE: 11583/2979318
EID:

2-s2.0-85171617170

WOSUID:

WOS:001062141900020
Source: check_circle
Politecnico di Torino - IRIS

Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems

Electronics
2022-12-30 | Journal article
DOI: 10.3390/electronics12010169
Contributors: Sarah Azimi; Corrado De Sio; Andrea Portaluri; Daniele Rizzieri; Eleonora Vacca; Luca Sterpone; David Merodio Codinachs
Source: check_circle
Crossref
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A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS

2022-01-01 | Journal article
DOI: 10.1016/j.microrel.2022.114733
HANDLE: 11583/2971155
EID:

2-s2.0-85142434767

WOSUID:

WOS:000920730100001
Source: check_circle
Politecnico di Torino - IRIS

On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications

2022-01-01 | Conference paper
DOI: 10.1007/978-3-031-21867-5_12
HANDLE: 11583/2971153
EID:

2-s2.0-85144827393

WOSUID:

WOS:000916495700012
Source: check_circle
Politecnico di Torino - IRIS

Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor

2022-01-01 | Conference paper
DOI: 10.1109/RADECS55911.2022.10412414
HANDLE: 11583/2970911
EID:

2-s2.0-85185563903
Source: check_circle
Politecnico di Torino - IRIS

Soft Error Reliability Prediction of SRAM-based FPGA Designs

2022-01-01 | Conference paper
DOI: 10.1109/RADECS55911.2022.10412546
HANDLE: 11583/2971147
EID:

2-s2.0-85185550637

WOSUID:

WOS:001164255500051
Source: check_circle
Politecnico di Torino - IRIS

Analysis of Single Event Effects on Embedded Processor

Electronics
2021-12-18 | Journal article
DOI: 10.3390/electronics10243160
Contributors: Sarah Azimi; Corrado De Sio; Daniele Rizzieri; Luca Sterpone
Source: check_circle
Crossref
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