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Photosensing properties of zinc nitride thin-film transistors fabricated on recyclable plastic substrates

The European Physical Journal Applied Physics
2024 | Journal article
Contributors: Miguel A. Dominguez; Jose Luis Pau; Andrés Redondo-Cubero
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Influence of <i>Baccharis salicifolia</i> Extract on Iron Oxide Nanoparticles in MCM-41@IONP and Its Application in Room-Temperature-Fabricated Metal–Insulator–Semiconductor Diodes

Applied Nano
2024-04 | Journal article | Author
Contributors: Gerardo Miguel Bravo de Luciano; Blanca Susana Soto-Cruz; Anabel Romero-Lopez; Y.P. Bernal; José Alberto Luna López; Miguel Dominguez
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Multidisciplinary Digital Publishing Institute
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Solution-Processable and Eco-Friendly Functionalization of Conductive Silver Nanoparticles Inks for Printable Electronics

Electronic Materials
2024-04-16 | Journal article
Contributors: Sonia Ceron; David Barba; Miguel A. Dominguez
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Study of the Influence of Ga and In Doping on Organic Residuals in Solution-Processed IGZO Thin Films Deposited at Low-Temperature

Transactions on Electrical and Electronic Materials
2022-10 | Journal article
Contributors: Sonia Ceron; Ovier Obregon; Abdu Orduña-Diaz; Miguel A. Dominguez
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Depletion-type organic thin-film transistors based on solution-processed iron phthalocyanines fabricated on plastic substrates

Bulletin of Materials Science
2022-03 | Journal article
Contributors: Anayantzi Luna; Ovier Obregon; Jose L Sosa-Sanchez; Miguel A Dominguez
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Biosensors based on zinc oxide thin-film transistors using recyclable plastic substrates as an alternative for real-time pathogen detection

Talanta
2022-01 | Journal article
Contributors: Rafael A. Salinas; Abdu Orduña-Díaz; Ovier Obregon-Hinostroza; Miguel A. Dominguez
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Polycrystalline Erbium Phthalocyanine Thin Films Deposited on Silicon and Porous Silicon by Ultrasonic Spray Pyrolysis: Optical, Morphological, and Electrical Characterizations

Journal of Electronic Materials
2021 | Journal article
EID:

2-s2.0-85117306918

Part of ISSN: 1543186X 03615235
Contributors: Cuate-Gomez, D.H.; Garzon-Roman, A.; Sosa-Sánchez, J.L.; Zuñiga-Islas, C.; Dominguez, M.A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Solution-processed manganese phthalocyanine thin-film transistors on plastic substrates

2021 IEEE International Conference on Engineering Veracruz, ICEV 2021
2021 | Conference paper
EID:

2-s2.0-85123786857

Contributors: Luna, A.; Obregon, O.; Sosa-Sanchez, J.L.; Dominguez, M.A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Transistores de película delgada basados en óxido de Zinc por spray pyrolysis ultrasónico de alta frecuencia a baja temperatura

Revista Mexicana de Fisica
2021 | Journal article
EID:

2-s2.0-85117238404

Part of ISSN: 0035001X
Contributors: Obregón, O.; Luna-López, J.A.; Rosales, P.; Domínguez, M.A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Transparent MIS capacitors on plastic substrates fabricated by high-frequency ultrasonic spray pyrolysis

Bulletin of Materials Science
2021-06 | Journal article
Contributors: Ovier Obregon; José A Luna-Lopez; Pedro Rosales; Mario Moreno; Abdu Orduña-Diaz; Miguel A Domínguez
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Effects of Electrical Stress in Solution-Processed Spin-On Glass Dielectric Films: Frequency Dependence

2021-05-14 | Conference paper
Contributors: Ovier Obregon; Salvador Alcantara; Susana Soto; Miguel A. Dominguez
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Influence of Inductive Effect in Organic Residuals Content in IZO Thin Films and the Performance on the Behavior of MIS Capacitors on Plastic

2021-04-14 | Conference paper
Contributors: Sonia Ceron; Abdu Orduña-Diaz; Miguel A. Dominguez
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Modeling of the Density of States in Field-Effect Zinc Oxide Semiconductor Devices Fabricated by Ultrasonic Spray Pyrolysis on Plastic Substrates

2021-04-14 | Conference paper
Contributors: Ovier Obregon; David Barba; Miguel A. Dominguez
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Antibody Immobilization in ZnO-Thin Film Transistors for Low-Cost Biosensors Applications

2021-03-06 | Conference paper
Contributors: Rafael Antonio Salinas Domínguez; Ovier Obregón Hinostroza; Abdú Orduña Díaz; Miguel Ángel Domínguez Jiménez
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Analysis and Study of Characteristic FTIR Absorption Peaks in Hafnium Oxide Thin Films Deposited at Low-Temperature

Transactions on Electrical and Electronic Materials
2020 | Journal article
EID:

2-s2.0-85074871558

Part of ISBN:

20927592 12297607

Contributors: Salinas Domínguez, R.A.; Orduña-Díaz, A.; Cerón, S.; Dominguez, M.A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Antibody immobilization in zinc oxide thin films as an easy-handle strategy for Escherichia coli detection

ACS Omega
2020 | Journal article
EID:

2-s2.0-85090957613

Part of ISBN:

24701343

Contributors: Salinas Domínguez, R.A.; Domínguez Jiménez, M.A.; Orduña Díaz, A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Copper phthalocyanine buffer interlayer film incorporated in paper substrates for printed circuit boards and dielectric applications in flexible electronics

Solid-State Electronics
2020 | Journal article
EID:

2-s2.0-85091650617

Part of ISBN:

00381101

Contributors: Domínguez, M.A.; Sosa-Sánchez, J.L.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Stability of zinc nitride thin-film transistors under positive and negative bias stress

Solid-State Electronics
2020 | Journal article
EID:

2-s2.0-85085480630

Part of ISBN:

00381101

Contributors: Dominguez, M.A.; Pau, J.L.; Redondo-Cubero, A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Study of nanocrystalline silicon-germanium for the development of thin film transistors

EPJ Applied Physics
2020 | Journal article
EID:

2-s2.0-85082884046

Part of ISBN:

12860050 12860042

Contributors: Kleider, J.-P.; Johnson, E.; Brüggemann, R.; Torres, A.; Moreno, M.; Rosales, P.; Dominguez, M.; Torres, A.; Morales, A.; Itzmoyotl, A. et al.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Comparison of source/drain electrodes in thin-film transistors based on room temperature deposited zinc nitride films

Solid-State Electronics
2019 | Journal article
EID:

2-s2.0-85062911504

Part of ISBN:

00381101

Contributors: Dominguez, M.A.; Pau, J.L.; Orduña-Diaz, A.; Redondo-Cubero, A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Unusual ambipolar behavior in Zinc Nitride thin-film transistors on plastic substrates

Semiconductor Science and Technology
2019-02-22 | Journal article
Contributors: Miguel Angel Dominguez; Jose Luis Pau; Andrés Redondo-Cubero
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Characterization of high mobility inverted coplanar Zinc Nitride thin-film transistors

Revista Mexicana de Fisica
2018 | Journal article
EID:

2-s2.0-85070113419

Part of ISBN:

0035001X

Contributors: Dominguez, M.A.; Paub, J.L.; Obregon, O.; Luna, A.; Redondo-Cubero, A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Low-temperature ultrasonic spray deposited aluminum doped zinc oxide film and its application in flexible Metal-Insulator-Semiconductor diodes

Thin Solid Films
2018 | Journal article
EID:

2-s2.0-85032959381

Contributors: Dominguez, M.A.; Luna-Lopez, J.A.; Ceron, S.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Optical, morphological and electrical analysis of heterostructures PSi/c-Si and SiO<inf>2</inf>/MWCNTs/PSi/c-Si

Sensors and Actuators, A: Physical
2018 | Journal article
EID:

2-s2.0-85053314169

Part of ISBN:

09244247

Contributors: Victoriano Huerta, N.; Luna López, J.A.; Hernández de la Luz, J.A.D.; Gómez Barojas, E.; Benitez Lara, A.; Monfil Leyva, K.; Domínguez Jimenez, M.A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Study of the effect of the deposition RF power on the characteristics of microcrystalline Silicon-Germanium thin films produced by PECVD

MRS Advances
2018 | Conference paper
EID:

2-s2.0-85062339178

Part of ISBN:

20598521

Contributors: Torres, A.; Moreno, M.; Rosales, P.; Domínguez, M.; Torres, A.; Itzmoyotl, A.; Ambrosio, R.; De La Hidalga, J.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Incorporation of ZnO Nanoparticles on Solution Processed Zinc Oxide Thin-Film Transistors

Transactions on Electrical and Electronic Materials
2018-12-10 | Journal article
Contributors: Miguel A. Dominguez; Javier Martinez; Karim Monfil-Leyva; Susana Soto; Netzahualcoyotl Carlos; Mario Moreno
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Flexible Zinc Nitride Thin-Film Transistors Using Spin-On Glass as Gate Insulator

IEEE Transactions on Electron Devices
2018-03 | Journal article
Contributors: Miguel A. Dominguez; Jose Luis Pau; Andres Redondo-Cubero
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Fully solution-processed zinc oxide MIS capacitors by ultrasonic spray pyrolysis in air ambient

Journal of Applied Research and Technology
2017 | Journal article
EID:

2-s2.0-85020079911

Contributors: Dominguez, M.A.; Orduña-Diaz, A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Optical and Compositional Properties of SiOx Films Deposited by HFCVD: Effect of the Hydrogen Flow

Journal of Electronic Materials
2017 | Journal article
EID:

2-s2.0-85010801649

Contributors: Luna López, J.A.; Vázquez Valerdi, D.E.; Benítez Lara, A.; García Salgado, G.; Hernández-de la Luz, A.D.; Morales Sánchez, A.; Flores Gracia, F.J.; Dominguez, M.A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Zinc nitride thin films: Basic properties and applications

Proceedings of SPIE - The International Society for Optical Engineering
2017 | Conference paper
EID:

2-s2.0-85019623339

Contributors: Redondo-Cubero, A.; Gómez-Castaño, M.; García Núñez, C.; Domínguez, M.; Vázquez, L.; Pau, J.L.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Effects of low-temperature annealing on electrical properties of Thin-film Transistors based on Zinc Oxide films deposited by ultrasonic spray pyrolysis: Impact of annealing time

Thin Solid Films
2016 | Journal article
EID:

2-s2.0-84978832043

Contributors: Dominguez, M.A.; Flores, F.; Martinez, J.; Orduña-Diaz, A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

High mobility thin film transistors based on zinc nitride deposited at room temperature

Thin Solid Films
2016 | Journal article
EID:

2-s2.0-84998631569

Contributors: Dominguez, M.A.; Pau, J.L.; Gómez-Castaño, M.; Luna-Lopez, J.A.; Rosales, P.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Impact of planarized gate electrode in bottom-gate thin-film transistors

Revista Mexicana de Fisica
2016 | Journal article
EID:

2-s2.0-84962730619

Contributors: Domínguez, M.A.; Rosales, P.; Torres, A.; Flores, F.; Luna, J.A.; Alcantara, S.; Moreno, M.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Micromachined and characterization of cooled a-Si:B:H microbolometer array in the terahertz region

Characterization of Metals and Alloys
2016 | Book
EID:

2-s2.0-85018894839

Contributors: Orduña, A.; Treviño, C.G.; Torres, A.; Delgado, R.; Dominguez, M.A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Physically-based simulation of zinc oxide thin-film transistors: Contact resistance contribution on density of states

Solid-State Electronics
2016 | Journal article
EID:

2-s2.0-84962326925

Contributors: Dominguez, M.A.; Alcantara, S.; Soto, S.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Study of stability of solution-processed dielectric film under electrical stress

Journal of Alloys and Compounds
2016 | Journal article
EID:

2-s2.0-84978646312

Contributors: Dominguez, M.A.; Obregon, O.; Luna-Lopez, J.A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

UV-Vis Photocurrent in SiOx Films with Silicon Nanocrystals Obtained by HFCVD

Procedia Engineering
2016 | Conference paper
EID:

2-s2.0-85009961421

Contributors: López, J.A.L.; Valerdi, D.E.V.; Salgado, G.G.; De La Luz, A.D.H.; Conde, G.M.; Simon, Z.H.; Gracia, F.J.F.; Sanchez, A.M.; Dominguez, M.A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Annealing effects on metal-ZnO interface for improvement performance of thin-film transistors

Materials Research Society Symposium Proceedings
2015 | Conference paper
EID:

2-s2.0-84939126633

Contributors: Dominguez, M.A.; Flores, F.; Luna, A.; Alcantara, S.; Martinez, J.; Luna-Lopez, J.A.; Rosales, P.; Reyes, C.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Impact of active layer thickness in thin-film transistors based on Zinc Oxide by ultrasonic spray pyrolysis

Solid-State Electronics
2015 | Journal article
EID:

2-s2.0-84925747868

Contributors: Dominguez, M.A.; Flores, F.; Luna, A.; Martinez, J.; Luna-Lopez, J.A.; Alcantara, S.; Rosales, P.; Reyes, C.; Orduña, A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Influence of trapping and de-trapping charge in MOS-like structures with single and twofold SiO<inf>x</inf> films as active layers

Sensors and Actuators, A: Physical
2015 | Journal article
EID:

2-s2.0-84936777541

Contributors: López, J.A.L.; Valerdi, D.E.V.; Salgado, G.G.; De La Luz, A.D.H.; López, J.C.; Caballero, F.G.N.; Domínguez, M.A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Thin-film transistors based on zinc oxide films by ultrasonic spray pyrolysis

Revista Mexicana de Fisica
2015 | Journal article
EID:

2-s2.0-84923083347

Contributors: Dominguez-Jimenez, M.A.; Flores-Gracia, F.; Luna-Flores, A.; Martinez-Juarez, J.; Luna-Lopez, J.A.; Alcantara-Iniesta, S.; Rosales-Quintero, P.; Reyes-Betanzo, C.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Effects of germane flow rate in electrical properties of a-SiGe:H films for ambipolar thin-film transistors

Thin Solid Films
2014 | Journal article
EID:

2-s2.0-84901797957

Contributors: Dominguez, M.; Rosales, P.; Torres, A.; Flores, F.; Molina, J.; Moreno, M.; Luna, J.; Orduña, A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Planarized ambipolar a-SiGe:H thin-film transistors: Influence of the sequence of fabrication process

Solid-State Electronics
2014 | Journal article
EID:

2-s2.0-84903597700

Contributors: Dominguez, M.; Rosales, P.; Torres, A.; Flores, F.; Molina, J.; Moreno, M.; Luna, J.; Orduña, A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Electrical characterization of planarized a-SiGe: H Thin-film transistors

Revista Mexicana de Fisica
2013 | Journal article
EID:

2-s2.0-84872520428

Contributors: Dominguez, M.; Rosales, P.; Torres, A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Ambipolar a-SiGe:H thin-film transistors fabricated at 200 °c

Journal of Non-Crystalline Solids
2012 | Journal article
EID:

2-s2.0-84865720607

Contributors: Dominguez, M.; Rosales, P.; Torres, A.; Moreno, M.; Molina, J.; De La Hidalga, F.; Zuniga, C.; Calleja, W.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Deposition and characterization of polymorphous germanium films prepared by low frequency PECVD

Journal of Non-Crystalline Solids
2012 | Journal article
EID:

2-s2.0-84865748995

Contributors: Moreno, M.; Torres, A.; Ambrosio, R.; Rosales, P.; Heredia, A.; Kosarev, A.; Torres, E.; Zuñiga, C.; Reyes-Betanzo, C.; Domínguez, M.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Development of low-temperature ambipolar a-SiGe:H thin-film transistors technology

Materials Research Society Symposium Proceedings
2012 | Conference paper
EID:

2-s2.0-84869796152

Contributors: Dominguez, M.A.; Rosales, P.; Torres, A.; Moreno, M.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Effects of curing time on properties of spin-on glass as low-temperature insulator

Materials Research Society Symposium Proceedings
2012 | Conference paper
EID:

2-s2.0-84938295792

Contributors: Dominguez, M.A.; Rosales, P.; Torres, A.; Moreno, M.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

High quality SiO<sub>2</sub> obtained from diluted SOG for low temperature TFT fabrication process

ECS Transactions
2012 | Conference paper
EID:

2-s2.0-84875863506

Contributors: Dominguez, M.A.J.; Jacome, A.T.; Quintero, P.R.; Betanzo, C.R.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier

Performance improvement of low-temperature a-SiGe:H thin-film transistors

Solid-State Electronics
2012 | Journal article
EID:

2-s2.0-84863089477

Contributors: Dominguez, M.; Rosales, P.; Torres, A.
Source: Self-asserted source
Miguel Dominguez via Scopus - Elsevier
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Peer review (2 reviews for 2 publications/grants)

Review activity for Advanced electronic materials (1)
Review activity for Journal of computational electronics. (1)