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Methods of dislocation structure characterization in AIIIBV semiconductor single crystals

Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering
2023-01-11 | Journal article
Contributors: S. N. Knyazev; A. V. Kudrya; N. Yu. Komarovskiy; Yu. N. Parkhomenko; E. V. Molodtsova; V. V. Yushchuk
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Methods of dislocation structure characterization in A IIIB V semiconductor single crystals

Modern Electronic Materials
2022-12-19 | Journal article
Contributors: Stanislav N. Knyazev; Aleksandr V. Kudrya; Nikita Yu. Komarovskiy; Yuri N. Parkhomenko; Elena V. Molodtsova; Vyacheslav V. Yushchuk
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