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Scopus Author ID: 56470049800
SciProfiles: 4286943

Keywords

Prognostics and Health Management of Electronic Systems, Condition Monitoring of Electronic Devices

Countries

China

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Employment (1)

Harbin Institute of Technology: Harbin, CN

2020-01-01 to present | Associated Professor (Electrical Engineering and Automation)
Employment
Source: Self-asserted source
Cen Chen

Education and qualifications (4)

Harbin Institute of Technology: Harbin, Heilongjiang, CN

2014-09-01 to present | Ph.D. (Electrical Engineering)
Education
Source: Self-asserted source
Cen Chen

University of Maryland, College Park: College Park, Maryland, US

2017-09-29 to 2018-09-30 | Visiting Student/Researcher (Center for Advanced Life Cycle Engineering)
Education
Source: Self-asserted source
Cen Chen

Harbin Institute of Technology: Harbin, Heilongjiang, CN

2010-09-01 to 2014-07-01 | Bachelor (Electrical Engineering)
Education
Source: Self-asserted source
Cen Chen

National University of Singapore: Singapore, SG

2012-01 to 2012-05 | Exchange Student (Electrical and Electronic Engineering)
Education
Source: Self-asserted source
Cen Chen

Works (40)

A Path Dependence Identification Method for Power MOSFETs Degradation Due to Bias Temperature Instability

IEEE Transactions on Power Electronics
2024 | Journal article
DOI: 10.1109/TPEL.2024.3414838
EID:

2-s2.0-85196093284

Part of ISSN: 19410107 08858993
Contributors: Ye, X.; Sun, Q.; Zhang, R.; Hu, Y.; Chen, C.; Xie, M.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

A reliability prediction method considering degradation self-acceleration effect in DC-link electrolytic capacitor

Quality Engineering
2024 | Journal article
DOI: 10.1080/08982112.2023.2268703
EID:

2-s2.0-85174285711

Part of ISSN: 15324222 08982112
Contributors: Ye, X.; Sun, Q.; Lin, R.; Chen, C.; Xie, M.; Zhai, G.; Kang, R.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Data-Based Soft Fault Diagnosis of a Three-Phase DC/AC Converter

Proceedings of 2024 IEEE 7th International Electrical and Energy Conference, CIEEC 2024
2024 | Conference paper
DOI: 10.1109/CIEEC60922.2024.10583580
EID:

2-s2.0-85200269764

Part of ISBN: 9798350359558
Contributors: Chen, C.; Du, H.; Cai, X.; Wang, H.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Establishment of Degradation Model and Transfer Model for P-channel Power MOSFETs Under Negative Bias Temperature Stress

2024 IEEE 10th International Power Electronics and Motion Control Conference, IPEMC 2024 ECCE Asia
2024 | Conference paper
DOI: 10.1109/IPEMC-ECCEAsia60879.2024.10567064
EID:

2-s2.0-85199047346

Part of ISBN: 9798350351330
Contributors: Chen, C.; Wang, H.; Yin, H.; Zheng, W.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Preconditioning for Accurate Threshold Voltage Extraction of SiC MOSFETs after AC Bias Temperature Instability in Reliability Tests

2024 IEEE 10th International Power Electronics and Motion Control Conference, IPEMC 2024 ECCE Asia
2024 | Conference paper
DOI: 10.1109/IPEMC-ECCEAsia60879.2024.10567792
EID:

2-s2.0-85199072678

Part of ISBN: 9798350351330
Contributors: Chen, C.; Wang, Z.; Zhang, R.; Ye, X.; Zhang, X.; Pan, Y.; Lai, Y.; Du, J.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

A modelling method of the on-state resistance of p-channel power MOSFETs under NBTI stress

Microelectronics Reliability
2023 | Journal article
DOI: 10.1016/j.microrel.2023.115157
EID:

2-s2.0-85174578452

Part of ISSN: 00262714
Contributors: Wang, Z.C.; Chen, C.; Wang, H.D.; Wang, C.Y.; Wang, Z.F.; Ye, X.R.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Consistency Evaluation of IoT Smart Meter's Metering Accuracy considering Ambient Temperature and Load Current

2023 5th International Conference on System Reliability and Safety Engineering, SRSE 2023
2023 | Conference paper
DOI: 10.1109/SRSE59585.2023.10336053
EID:

2-s2.0-85181774512

Part of ISBN: 9798350305944
Contributors: Liu, W.; Chen, C.; Wang, Z.; Zhang, X.; Zhai, G.; Zheng, W.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Model-based quality consistency analysis of permanent magnet synchronous motor cogging torque in wide temperature range

Quality and Reliability Engineering International
2023 | Journal article
DOI: 10.1002/qre.3227
EID:

2-s2.0-85141577148

Part of ISSN: 10991638 07488017
Contributors: Chen, C.; Sun, C.; Wu, L.; Ye, X.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Reliability Analysis Based on a Bivariate Degradation Model Considering Random Initial State and Its Correlation with Degradation Rate

IEEE Transactions on Reliability
2023 | Journal article
DOI: 10.1109/TR.2022.3172416
EID:

2-s2.0-85132519125

Part of ISSN: 15581721 00189529
Contributors: Zheng, B.; Chen, C.; Lin, Y.; Ye, X.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Testability design of power distribution system considering noise immunity characteristics

Microelectronics Reliability
2023 | Journal article
DOI: 10.1016/j.microrel.2023.115178
EID:

2-s2.0-85174621597

Part of ISSN: 00262714
Contributors: Liu, W.M.; Chen, C.; Lin, Y.G.; Ye, X.R.; Zhai, G.F.; Lin, R.S.; Zheng, W.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Thermal Simulation and Analysis of the SiC MOSFETs Based SSPC

2023 5th International Conference on System Reliability and Safety Engineering, SRSE 2023
2023 | Conference paper
DOI: 10.1109/SRSE59585.2023.10336120
EID:

2-s2.0-85181770756

Part of ISBN: 9798350305944
Contributors: Wang, Z.; Lai, Y.; Chen, C.; Ye, X.; Kang, R.; Hu, Y.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling

Reliability Engineering and System Safety
2022 | Journal article
DOI: 10.1016/j.ress.2022.108815
EID:

2-s2.0-85139261889

Part of ISSN: 09518320
Contributors: Ye, X.; Hu, Y.; Zheng, B.; Chen, C.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Accelerated Degradation Modeling of Power MOSFET Under Multiple Stresses

IET Conference Proceedings
2022 | Conference paper
DOI: 10.1049/icp.2022.2929
EID:

2-s2.0-85164292160

Part of ISBN: 9781839538360
Part of ISSN: 27324494
Contributors: Ye, X.; Hu, Y.; Feng, R.; Chen, C.; Zhai, G.; Tang, L.C.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Dictionary Based Three-phase Driver MOSFET Cascading Fault Diagnosis

13th International Conference on Reliability, Maintainability, and Safety: Reliability and Safety of Intelligent Systems, ICRMS 2022
2022 | Conference paper
DOI: 10.1109/ICRMS55680.2022.9944572
EID:

2-s2.0-85143060652

Part of ISBN: 9781665486903
Contributors: Sun, C.; Chen, C.; Ye, X.; Zhai, G.; Zhang, D.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Digital Twin Model Design of Three-phase Inverter for Reliability Prediction

ICREPEC 2022 - Proceedings of the 8th International Conference on Reliability of Electrical Products and Electrical Contacts
2022 | Conference paper
EID:

2-s2.0-85153533746

Part of ISBN: 9789881532374
Contributors: Chen, C.; Sun, C.; Zheng, W.; Zhang, Y.; Xu, Y.; Ye, X.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process

Reliability Engineering and System Safety
2022 | Journal article
DOI: 10.1016/j.ress.2021.108087
EID:

2-s2.0-85116918486

Part of ISSN: 09518320
Contributors: Zheng, B.; Chen, C.; Lin, Y.; Hu, Y.; Ye, X.; Zhai, G.; Zio, E.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Reliability estimation of complex systems based on a Wiener process with random effects and D-vine copulas

Microelectronics Reliability
2022 | Journal article
DOI: 10.1016/j.microrel.2022.114640
EID:

2-s2.0-85145350751

Part of ISSN: 00262714
Contributors: Zheng, B.; Chen, C.; Zhang, W.; Fu, R.; Hu, Y.; Lin, Y.; Wang, C.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

An Adaptive Optimized TVF-EMD Based on a Sparsity-Impact Measure Index for Bearing Incipient Fault Diagnosis

IEEE Transactions on Instrumentation and Measurement
2021 | Journal article
DOI: 10.1109/tim.2020.3044517
EID:

2-s2.0-85098758746

Part of ISSN: 15579662 00189456
Contributors: Ye, X.; Hu, Y.; Shen, J.; Chen, C.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

An Excitation Method for Fault Diagnosis of DC-AC Converter Based on Simulation

Conference Record - IEEE Instrumentation and Measurement Technology Conference
2021 | Conference paper
DOI: 10.1109/I2MTC50364.2021.9459890
EID:

2-s2.0-85113715347

Part of ISBN: 9781728195391
Part of ISSN: 10915281
Contributors: Yang, Y.; Chen, C.; Ye, X.; Sun, C.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Life-Cycle Dynamic Robust Design Optimization for Batch Production of Permanent Magnet Actuator

IEEE Transactions on Industrial Electronics
2021 | Journal article
DOI: 10.1109/TIE.2020.3026294
EID:

2-s2.0-85112516661

Part of ISSN: 15579948 02780046
Contributors: Ye, X.; Chen, H.; Chen, C.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Model-Based Quality Consistency Analysis of Permanent Magnet Synchronous Motor Cogging Torque in Wide Temperature Range

Proceedings - 2021 3rd International Conference on System Reliability and Safety Engineering, SRSE 2021
2021 | Conference paper
DOI: 10.1109/SRSE54209.2021.00030
EID:

2-s2.0-85126238054

Part of ISBN: 9781665401609
Contributors: Chen, C.; Sun, C.; Wu, L.; Ye, X.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Reliability assessment of film capacitors oriented by dependent and nonlinear degradation considering three-source uncertainties

Microelectronics Reliability
2021 | Journal article
DOI: 10.1016/j.microrel.2021.114277
EID:

2-s2.0-85120855163

Part of ISSN: 00262714
Contributors: Ye, X.; Hu, Y.; Zheng, B.; Chen, C.; Feng, R.; Liu, S.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Soft Fault Diagnosis Using URV-LDA Transformed Feature Dictionary

IEEE Access
2021 | Journal article
DOI: 10.1109/ACCESS.2021.3051409
EID:

2-s2.0-85099580193

Part of ISSN: 21693536
Contributors: Chen, C.; Yang, Y.; Ye, X.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Condition-Based Maintenance Optimization for Motorized Spindles Integrating Proportional Hazard Model with SPC Charts

Mathematical Problems in Engineering
2020 | Journal article
DOI: 10.1155/2020/7618376
EID:

2-s2.0-85089303895

Part of ISSN: 15635147 1024123X
Contributors: Du, X.; Gai, J.; Chen, C.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Life-cycle reliability design optimization of high-power DC electromagnetic devices based on time-dependent non-probabilistic convex model process

Microelectronics Reliability
2020 | Journal article
DOI: 10.1016/j.microrel.2020.113795
EID:

2-s2.0-85096363728

Part of ISSN: 00262714
Contributors: Ye, X.; Chen, H.; Sun, Q.; Chen, C.; Niu, H.; Zhai, G.; Li, W.; Yuan, R.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Quality and robustness optimization design method for electromagnetic devices consider manufacturing uncertainties and working point migration of permanent magnets

SN Applied Sciences
2020 | Journal article
DOI: 10.1007/s42452-020-2453-5
EID:

2-s2.0-85100748957

Part of ISSN: 25233971
Contributors: Ye, X.; Chen, H.; Chen, C.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Failure Analysis and Optimization of Secondary Power Supply in Servo System Ba sed on Simulation

Proceedings of 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, QR2MSE 2019
2019 | Conference paper
DOI: 10.1109/QR2MSE46217.2019.9021166
EID:

2-s2.0-85082382579

Part of ISBN: 9781728114279
Contributors: Wang, L.; Ye, X.-R.; Zhai, G.-F.; Chen, C.; Wang, H.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

A HALT-Simulation Combined Fault Diagnosis and Optimization Method for Electronic Module

Proceedings - Annual Reliability and Maintainability Symposium
2018 | Conference paper
DOI: 10.1109/RAM.2018.8463096
EID:

2-s2.0-85054127577

Part of ISBN: 9781538628706
Part of ISSN: 0149144X
Contributors: Ye, X.; Lyu, M.; Chen, C.; Yu, S.; Dang, Z.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests

IEEE Access
2018 | Journal article
DOI: 10.1109/ACCESS.2018.2859750
Source: Self-asserted source
Cen Chen
grade
Preferred source (of 2)‎

Fault localization of a switched mode power supply based on extended integer-coded dictionary method

Microelectronics Reliability
2018 | Journal article
DOI: 10.1016/j.microrel.2018.06.107
EID:

2-s2.0-85049348462

Part of ISSN: 00262714
Contributors: Ye, X.; Chen, C.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

The threshold voltage degradation model of N Channel VDMOSFETs under PBT stress

Microelectronics Reliability
2018 | Journal article
DOI: https://doi.org/10.1016/j.microrel.2018.08.003
Source: Self-asserted source
Cen Chen
grade
Preferred source (of 2)‎

VDMOSFET HEF degradation modelling considering turn-around phenomenon

Microelectronics Reliability
2018 | Journal article
DOI: https://doi.org/10.1016/j.microrel.2017.11.015
Source: Self-asserted source
Cen Chen
grade
Preferred source (of 2)‎

In-situ prognostic method of power MOSFET based on miller effect

2017 Prognostics and System Health Management Conference (PHM-Harbin)
2017 | Conference paper
DOI: 10.1109/PHM.2017.8079139
Source: Self-asserted source
Cen Chen
grade
Preferred source (of 2)‎

Online Condition Monitoring of Power MOSFET Gate Oxide Degradation Based on Miller Platform Voltage

IEEE Transactions on Power Electronics
2017 | Journal article
DOI: 10.1109/TPEL.2016.2602323
Source: Self-asserted source
Cen Chen
grade
Preferred source (of 2)‎

Health-assessment methodology research for SMPS based on simulation

Reliability and Maintainability Symposium
2015 | Conference paper
DOI: 10.1109/RAMS.2015.7105130
Source: Self-asserted source
Cen Chen
grade
Preferred source (of 2)‎

Methodology research for health condition assessment of power supply based on simulation

Xitong Fangzhen Xuebao / Journal of System Simulation
2015 | Journal article
EID:

2-s2.0-84922256565

Part of ISSN: 1004731X
Contributors: Ye, X.; Chen, C.; Wang, Y.; Zhai, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Methodology research for health condition assessment of power supply based on simulation

2015 | Journal article
Source: Self-asserted source
Cen Chen

PHM application of power converters using health precursor of power MOSFETs

Prognostics and System Health Management Conference
2015 | Conference paper
DOI: 10.1109/PHM.2015.7380078
Source: Self-asserted source
Cen Chen
grade
Preferred source (of 2)‎

A framework for model-based diagnostics and prognostics of switched-mode power supplies

2014 | Journal article
Source: Self-asserted source
Cen Chen

A framework for model-based diagnostics and prognostics of switched-mode power supplies

PHM 2014 - Proceedings of the Annual Conference of the Prognostics and Health Management Society 2014
2014 | Conference paper
EID:

2-s2.0-84920522779

Part of ISBN: 9781936263172
Contributors: Li, H.; Ye, X.; Chen, C.; Vachtsevanos, G.
Source: Self-asserted source
Cen Chen via Scopus - Elsevier

Peer review (4 reviews for 2 publications/grants)

Review activity for Journal of power electronics (1)
Review activity for Reliability engineering & systems safety. (3)
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