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https://www.lboro.ac.uk/departments/meme/staff/luciano-ost/

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Scopus Author ID: 35831817200

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Loughborough University: Loughborough, GB

2018-03-12 to present (Wolfson School)
Employment
Source: Self-asserted source
Luciano Ost

Works (50 of 83)

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Page 1 of 2

Assessment of Radiation-Induced Soft Error on Unmanned Surface Vehicles

IEEE Transactions on Nuclear Science
2024-08 | Journal article
DOI: 10.1109/TNS.2024.3378807
Contributors: Marcos A. Fleck; Elisa G. Pereira; Jonas F. Gava; Henrique B. Silva; Fernando G. Moraes; Ney L.V. Calazans; Felipe Meneguzzi; Rodrigo P. Bastos; Ricardo A. L. Reis; Luciano Ost et al.
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Crossref

Soft Error Assessment of Attitude Estimation Algorithms Running on Resource-Constrained Devices Under Neutron Radiation

IEEE Transactions on Nuclear Science
2024-08 | Journal article
DOI: 10.1109/TNS.2024.3378689
Contributors: Jonas Gava; Tarso Sartori; Alex Hanneman; Rafael Garibotti; Fernando Moraes; Ney Calazans; Hassen Fourati; Rodrigo Possamai Bastos; Ricardo Reis; Luciano Ost
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Crossref

A Reconfigurable Coarse‐to‐Fine Approach for the Execution of CNN Inference Models in Low‐Power Edge Devices

IET Computers & Digital Techniques
2024-01 | Journal article
DOI: 10.1049/cdt2/6214436
Contributors: Auangkun Rangsikunpum; Sam Amiri; Luciano Ost; Sudarshan K. Srinivasan
Source: check_circle
Crossref

A Lightweight Mitigation Technique for Resource- Constrained Devices Executing DNN Inference Models Under Neutron Radiation

IEEE Transactions on Nuclear Science
2023-08 | Journal article
DOI: 10.1109/TNS.2023.3262448
Contributors: Jonas Gava; Alex Hanneman; Geancarlo Abich; Rafael Garibotti; Sergio Cuenca-Asensi; Rodrigo Possamai Bastos; Ricardo Reis; Luciano Ost
Source: check_circle
Crossref

Assessment of Radiation-Induced Soft Errors on Lightweight Cryptography Algorithms Running on a Resource-Constrained Device

IEEE Transactions on Nuclear Science
2023-08 | Journal article
DOI: 10.1109/TNS.2023.3253684
Contributors: Jonas Gava; Nicolas Moura; Joaquim Lucena; Vinìcius da Rocha; Rafael Garibotti; Ney Calazans; Sergio Cuenca-Asensi; Rodrigo Possamai Bastos; Ricardo Reis; Luciano Ost
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Crossref

Novel Low Memory Footprint DNN Models for Edge Classification of Surgeons’ Postures

IEEE Embedded Systems Letters
2023-03 | Journal article
DOI: 10.1109/LES.2022.3190707
Contributors: Alex Hanneman; Terry Fawden; Marco Branciforte; Maria Celvisia Virzì; Esther L. Moss; Luciano Ost; Massimiliano Zecca
Source: check_circle
Crossref

SOFIA: An automated framework for early soft error assessment, identification, and mitigation

Journal of Systems Architecture
2022-10 | Journal article
DOI: 10.1016/j.sysarc.2022.102710
Contributors: Jonas Gava; Vitor Bandeira; Felipe Rosa; Rafael Garibotti; Ricardo Reis; Luciano Ost
Source: check_circle
Crossref

Early Soft Error Reliability Analysis on RISC-V

IEEE Latin America Transactions
2022-09 | Journal article
DOI: 10.1109/TLA.2022.9878169
Contributors: Nicolas Lodéa; Willian Nunes; Vitor Zanini; Marcos Sartori; Luciano Ost; Ney Calazans; Rafael Garibotti; César Marcon
Source: check_circle
Crossref

Assessment of Tiny Machine-Learning Computing Systems Under Neutron-Induced Radiation Effects

IEEE Transactions on Nuclear Science
2022-07 | Journal article
DOI: 10.1109/TNS.2022.3176485
Contributors: Rodrigo Possamai Bastos; Matheus Garay Trindade; Rafael Garibotti; Jonas Gava; Ricardo Reis; Luciano Ost
Source: check_circle
Crossref

The Impact of Soft Errors in Memory Units of Edge Devices Executing Convolutional Neural Networks

IEEE Transactions on Circuits and Systems II: Express Briefs
2022-03 | Journal article
DOI: 10.1109/TCSII.2022.3141243
Contributors: Geancarlo Abich; Rafael Garibotti; Ricardo Reis; Luciano Ost
Source: check_circle
Crossref

Applying Lightweight Soft Error Mitigation Techniques to Embedded Mixed Precision Deep Neural Networks

IEEE Transactions on Circuits and Systems I: Regular Papers
2021 | Journal article
DOI: 10.1109/TCSI.2021.3097981
EID:

2-s2.0-85112653526

Part of ISSN: 15580806 15498328
Contributors: Abich, G.; Gava, J.; Garibotti, R.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier
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Impact of radiation-induced soft error on embedded cryptography algorithms

Microelectronics Reliability
2021 | Journal article
DOI: 10.1016/j.microrel.2021.114349
EID:

2-s2.0-85114260463

Part of ISSN: 00262714
Contributors: Bandeira, V.; Sampford, J.; Garibotti, R.; Trindade, M.G.; Bastos, R.P.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

RAT: A Lightweight Architecture Independent System-Level Soft Error Mitigation Technique

IFIP Advances in Information and Communication Technology
2021 | Book
DOI: 10.1007/978-3-030-81641-4_11
EID:

2-s2.0-85112690390

Part of ISSN: 1868422X 18684238
Contributors: Gava, J.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Evaluation of the soft error assessment consistency of a JIT‐based virtual platform simulator

IET Computers & Digital Techniques
2021-03 | Journal article
DOI: 10.1049/cdt2.12017
Contributors: Geancarlo Abich; Rafael Garibotti; Vitor Bandeira; Felipe da Rosa; Jonas Gava; Felipe Bortolon; Guilherme Medeiros; Fernando G. Moraes; Ricardo Reis; Luciano Ost
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Crossref

An Extensive Soft Error Reliability Analysis of a Real Autonomous Vehicle Software Stack

IEEE Transactions on Circuits and Systems II: Express Briefs
2021-01 | Journal article
DOI: 10.1109/TCSII.2020.3011367
Contributors: Vitor Bandeira; Isadora Oliveira; Felipe Rosa; Ricardo Reis; Luciano Ost
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Assessment of machine learning algorithms for near-sensor computing under radiation soft errors

ICECS 2020 - 27th IEEE International Conference on Electronics, Circuits and Systems, Proceedings
2020 | Conference paper
DOI: 10.1109/ICECS49266.2020.9294938
EID:

2-s2.0-85099483930
Contributors: Trindade, M.G.; Bastos, R.P.; Garibotti, R.; Ost, L.; Letiche, M.; Beaucour, J.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Efficient soft error vulnerability analysis using non-intrusive fault injection techniques

IFIP Advances in Information and Communication Technology
2020 | Book
DOI: 10.1007/978-3-030-53273-4_6
EID:

2-s2.0-85089236101

Part of ISSN: 1868422X 18684238
Contributors: Bandeira, V.; Rosa, F.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

RAT: A Lightweight System-level Soft Error Mitigation Technique

IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
2020 | Conference paper
DOI: 10.1109/VLSI-SOC46417.2020.9344080
EID:

2-s2.0-85101143766

Part of ISSN: 23248440 23248432
Contributors: Gava, J.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Soft error reliability assessment of neural networks on resource-constrained IoT devices

ICECS 2020 - 27th IEEE International Conference on Electronics, Circuits and Systems, Proceedings
2020 | Conference paper
DOI: 10.1109/ICECS49266.2020.9294951
EID:

2-s2.0-85099478822
Contributors: Abich, G.; Gava, J.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Evaluation of Compilers Effects on OpenMP Soft Error Resiliency

Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI
2019 | Conference paper
DOI: 10.1109/ISVLSI.2019.00055
EID:

2-s2.0-85072986974

Part of ISSN: 21593477 21593469
Contributors: Gava, J.; Bandiera, V.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Exploiting memory allocations in clusterised many-core architectures

IET Computers and Digital Techniques
2019 | Journal article
DOI: 10.1049/iet-cdt.2018.5136
EID:

2-s2.0-85068226186

Part of ISSN: 17518601
Contributors: Garibotti, R.; Ost, L.; Butko, A.; Reis, R.; Gamatié, A.; Sassatelli, G.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Exploration of Techniques to Assess Soft Errors in Multicore Architectures

IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
2019 | Conference paper
DOI: 10.1109/VLSI-SoC.2019.8920357
EID:

2-s2.0-85076811235

Part of ISSN: 23248440 23248432
Contributors: Oliveira, I.; Bandeira, V.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Non-intrusive Fault Injection Techniques for Efficient Soft Error Vulnerability Analysis

IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
2019 | Conference paper
DOI: 10.1109/VLSI-SoC.2019.8920378
EID:

2-s2.0-85076802688

Part of ISSN: 23248440 23248432
Contributors: Bandeira, V.; Rosa, F.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Soft Error Reliability Analysis of Autonomous Vehicles Software Stack

IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
2019 | Conference paper
DOI: 10.1109/VLSI-SoC.2019.8920372
EID:

2-s2.0-85076809772

Part of ISSN: 23248440 23248432
Contributors: Bandeira, V.; Oliveira, I.; DaRosa, F.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Using Machine Learning Techniques to Evaluate Multicore Soft Error Reliability

IEEE Transactions on Circuits and Systems I: Regular Papers
2019-06 | Journal article
DOI: 10.1109/TCSI.2019.2906155
Contributors: Felipe Rocha da Rosa; Rafael Garibotti; Luciano Ost; Ricardo Reis
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A Design Patterns-Based Middleware for Multiprocessor Systems-on-Chip

31st Symposium on Integrated Circuits and Systems Design, SBCCI 2018
2018 | Conference paper
DOI: 10.1109/SBCCI.2018.8533250
EID:

2-s2.0-85059016404
Contributors: Hamerski, J.C.; Abich, G.; Reis, R.; Ost, L.; Amory, A.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Early evaluation of multicore systems soft error reliability using virtual platforms

2018 2nd Conference on PhD Research in Microelectronics and Electronics Latin America, PRIME-LA 2018
2018 | Conference paper
DOI: 10.1109/PRIME-LA.2018.8370388
EID:

2-s2.0-85048858565
Contributors: Rocha Da Rosa, F.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Evaluation of Compiler Optimization Flags Effects on Soft Error Resiliency

31st Symposium on Integrated Circuits and Systems Design, SBCCI 2018
2018 | Conference paper
DOI: 10.1109/SBCCI.2018.8533246
EID:

2-s2.0-85059030421
Contributors: Medeiros, G.E.; Bortolon, F.T.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Exploring the Impact of Soft Errors on NoC-based Multiprocessor Systems

Proceedings - IEEE International Symposium on Circuits and Systems
2018 | Conference paper
DOI: 10.1109/ISCAS.2018.8351391
EID:

2-s2.0-85057099539

Part of ISSN: 02714310
Contributors: Bortolon, F.T.; Abich, G.; Bampi, S.; Reis, R.; Moraes, F.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Extensive evaluation of programming models and ISAs impact on multicore Soft Error Reliability

Proceedings - Design Automation Conference
2018 | Conference paper
DOI: 10.1145/3195970.3196050
EID:

2-s2.0-85053704410

Part of ISSN: 0738100X
Contributors: Da Rosa, F.; Bandeira, V.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Gem5-FIM: A flexible and scalable multicore soft error assessment framework to early reliability design space explorations

9th IEEE Latin American Symposium on Circuits and Systems, LASCAS 2018 - Proceedings
2018 | Conference paper
DOI: 10.1109/LASCAS.2018.8717606
EID:

2-s2.0-85066148146
Contributors: Da Rosa, F.R.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Investigating parallel TMR approaches and thread disposability in Linux

ICECS 2017 - 24th IEEE International Conference on Electronics, Circuits and Systems
2018 | Conference paper
DOI: 10.1109/ICECS.2017.8292013
EID:

2-s2.0-85047263484
Contributors: Rodrigues, G.S.; Rosa, F.; Kastensmidt, F.L.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Analyzing the Impact of Fault-Tolerance Methods in ARM Processors under Soft Errors Running Linux and Parallelization APIs

IEEE Transactions on Nuclear Science
2017 | Journal article
DOI: 10.1109/TNS.2017.2706519
EID:

2-s2.0-85029545364

Part of ISSN: 00189499
Contributors: Rodrigues, G.S.; Rosa, F.; De Oliveira, Á.B.; Kastensmidt, F.L.; Ost, L.; Reis, R.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Analyzing the impact of using pthreads versus OpenMP under fault injection in ARM Cortex-A9 dual-core

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
2017 | Conference paper
DOI: 10.1109/RADECS.2016.8093180
EID:

2-s2.0-85029481043
Contributors: Rodrigues, G.S.; Kastensmidt, F.L.; Reis, R.; Rosa, F.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Evaluation of multicore systems soft error reliability using virtual platforms

Proceedings - 2017 IEEE 15th International New Circuits and Systems Conference, NEWCAS 2017
2017 | Conference paper
DOI: 10.1109/NEWCAS.2017.8010111
EID:

2-s2.0-85034419345
Contributors: Rosa, F.; Ost, L.; Reis, R.; Davidmann, S.; Lapides, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Extending FreeRTOS to support dynamic and distributed mapping in multiprocessor systems

2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016
2017 | Conference paper
DOI: 10.1109/ICECS.2016.7841301
EID:

2-s2.0-85015268762
Contributors: Abich, G.; Mandelli, M.G.; Rosa, F.R.; Moraes, F.; Ost, L.; Reis, R.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Publish-subscribe programming for a NoC-based multiprocessor system-on-chip

Proceedings - IEEE International Symposium on Circuits and Systems
2017 | Conference paper
DOI: 10.1109/ISCAS.2017.8050967
EID:

2-s2.0-85032663243

Part of ISSN: 02714310
Contributors: Hamerski, J.C.; Abich, G.; Reis, R.; Ost, L.; Amory, A.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

A lightweight software-based runtime temperature monitoring model for multiprocessor embedded systems

Proceedings - SBCCI 2016: 29th Symposium on Integrated Circuits and Systems Design: Chip on the Mountains
2016 | Conference paper
DOI: 10.1109/SBCCI.2016.7724040
EID:

2-s2.0-85000365291
Contributors: Castilhos, G.; Moraes, F.G.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

A platform-based design framework to boost many-core software development

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
2016 | Conference paper
DOI: 10.1109/ICECS.2015.7440313
EID:

2-s2.0-84964840553
Contributors: Madalozzo, G.; Mandelli, M.; Ost, L.; Moraes, F.G.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Design space exploration for complex automotive applications: An engine control system case study

ACM International Conference Proceeding Series
2016 | Conference paper
DOI: 10.1145/2852339.2852341
EID:

2-s2.0-84961159837
Contributors: Latif, K.; Selva, M.; Effiong, C.; Ursu, R.; Gamatie, A.; Sassatelli, G.; Zordan, L.; Ost, L.; Dziurzanski, P.; Indrusiak, L.S.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Efficient Embedded Software Migration towards Clusterized Distributed-Memory Architectures

IEEE Transactions on Computers
2016 | Journal article
DOI: 10.1109/TC.2015.2485202
EID:

2-s2.0-84978768053

Part of ISSN: 00189340
Contributors: Garibotti, R.; Butko, A.; Ost, L.; Gamatie, A.; Sassatelli, G.; Adeniyi-Jones, C.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Hierarchical energy monitoring for task mapping in many-core systems

Journal of Systems Architecture
2016 | Journal article
DOI: 10.1016/j.sysarc.2016.01.005
EID:

2-s2.0-84961206656

Part of ISSN: 13837621
Contributors: Castilhos, G.; Mandelli, M.; Ost, L.; Moraes, F.G.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
2016 | Conference paper
DOI: 10.1109/ICECS.2015.7440268
EID:

2-s2.0-84964816150
Contributors: Rosa, F.R.; Brum, R.M.; Wirth, G.; Ost, L.; Reis, R.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques

IEEE Transactions on Nuclear Science
2016 | Journal article
DOI: 10.1109/TNS.2016.2525735
EID:

2-s2.0-84978286105

Part of ISSN: 00189499
Contributors: Chielle, E.; Rosa, F.; Rodrigues, G.S.; Tambara, L.A.; Tonfat, J.; Macchione, E.; Aguirre, F.; Added, N.; Medina, N.; Aguiar, V. et al.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

A distributed energy-Aware task mapping to achieve thermal balancing and improve reliability of many-core systems

Proceedings, SBCCI 2015 - 28th Symposium on Integrated Circuits and Systems Design: Chip in Bahia
2015 | Conference paper
DOI: 10.1145/2800986.2800992
EID:

2-s2.0-84957630323
Contributors: Mandelli, M.; Castilhos, G.; Sassatelli, G.; Ost, L.; Moraes, F.G.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

A fast and scalable fault injection framework to evaluate multi/many-core soft error reliability

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015
2015 | Conference paper
DOI: 10.1109/DFT.2015.7315164
EID:

2-s2.0-84962856350
Contributors: Rosa, F.; Kastensmidt, F.; Reis, R.; Ost, L.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

A trace-driven approach for fast and accurate simulation of manycore architectures

20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015
2015 | Conference paper
DOI: 10.1109/ASPDAC.2015.7059093
EID:

2-s2.0-84926429805
Contributors: Butko, A.; Garibotti, R.; Ost, L.; Lapotre, V.; Gamatie, A.; Sassatelli, G.; Adeniyi-Jones, C.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Impact of dynamic voltage scaling and thermal factors on SRAM reliability

Microelectronics Reliability
2015 | Journal article
DOI: 10.1016/j.microrel.2015.07.013
EID:

2-s2.0-84943451077

Part of ISSN: 00262714
Contributors: Rosa, F.R.; Brum, R.M.; Wirth, G.; Kastensmidt, F.; Ost, L.; Reis, R.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Trading-off system load and communication in mapping heuristics for improving NoC-based MPSoCs reliability

Proceedings - International Symposium on Quality Electronic Design, ISQED
2015 | Conference paper
DOI: 10.1109/ISQED.2015.7085457
EID:

2-s2.0-84944315168

Part of ISSN: 19483295 19483287
Contributors: Mandelli, M.; Ost, L.; Sassatelli, G.; Moraes, F.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier

Fast energy evaluation of embedded applications for many-core systems

2014 24th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2014
2014 | Conference paper
DOI: 10.1109/PATMOS.2014.6951893
EID:

2-s2.0-84916887440
Contributors: Rosa, F.; Ost, L.; Raupp, T.; Moraes, F.; Reis, R.
Source: Self-asserted source
Luciano Ost via Scopus - Elsevier
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