Personal information
Verified email addresses
colin691735539@live.com
Activities
Education and qualifications (2)
2018-09-01
to
2023-06
|
Doctor
(State Key Laboratory of Advanced Electromagnetic Engineering and Technology)
Education
Source:
Keyan Sheng
2014-09
to
2018-06
|
Bachelor
(School of Physical Science and Technology)
Education
Source:
Keyan Sheng
Works (21)
Industrial Chemistry & Materials
2024
|
Journal article
Contributors:
Haozhe Li;
Keyan Sheng;
Zhiyan Chen;
Shuai Hao;
Zijian Zhou;
Zhenyi Zhang;
Xinwen Liu;
Mianzhi Xiong;
Yanlong Gu;
Jiang Huang
Source:
check_circle
Crossref
Radiation Physics and Chemistry
2024
|
Journal article
EID:
2-s2.0-85190258204
Contributors:
Chen, T.;
Yuan, J.;
Sheng, K.;
Chen, X.;
Chen, Z.;
Hao, S.;
Huang, J.
Source:
Keyan Sheng
via
Scopus - Elsevier
IEEE Transactions on Dielectrics and Electrical Insulation
2024
|
Journal article
EID:
2-s2.0-85187368923
Contributors:
Ning, K.;
Sheng, K.;
Fu, Z.;
Jiang, L.;
Huang, J.;
Tang, Z.
Source:
Keyan Sheng
via
Scopus - Elsevier
Radiation Physics and Chemistry
2024
|
Journal article
EID:
2-s2.0-85171615266
Contributors:
Dong, X.;
Chen, Z.;
Sheng, K.;
Zhu, L.;
Huang, J.;
Gu, Y.
Source:
Keyan Sheng
via
Scopus - Elsevier
IEEE Transactions on Plasma Science
2024
|
Journal article
EID:
2-s2.0-85204362948
Contributors:
Zhang, Z.;
Zhou, Z.;
Sheng, K.;
Li, H.;
Xiong, M.;
Xing, J.;
Lin, C.;
Huang, J.
Source:
Keyan Sheng
via
Scopus - Elsevier
ChemSusChem
2023
|
Journal article
EID:
2-s2.0-85142259601
Contributors:
Dong, X.;
Sheng, K.;
Chen, Z.;
Guo, C.;
Huang, J.;
Gu, Y.
Source:
Keyan Sheng
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Applied Surface Science
2023
|
Journal article
EID:
2-s2.0-85149275303
Contributors:
Sheng, K.;
Dong, X.;
Li, H.;
Zhou, Z.;
Zhou, W.;
Zeng, T.;
Liu, X.;
Chen, Z.;
Xiong, M.;
Zhang, Z.
et al.
Source:
Keyan Sheng
via
Scopus - Elsevier
SSRN
2023
|
Other
EID:
2-s2.0-85168729380
Contributors:
Gu, Y.;
Dong, X.;
Chen, Z.;
Sheng, K.;
Zhu, L.;
Huang, J.
Source:
Keyan Sheng
via
Scopus - Elsevier
Review of Scientific Instruments
2023
|
Journal article
EID:
2-s2.0-85147539779
Contributors:
Zhou, Z.;
Sheng, K.;
Zou, J.;
Chen, T.;
Huang, J.
Source:
Keyan Sheng
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Physical Review Accelerators and Beams
2023
|
Journal article
EID:
2-s2.0-85174067968
Contributors:
Zhou, Z.;
Sheng, K.;
Zhang, Z.;
Xiong, M.;
Li, H.;
Huang, J.
Source:
Keyan Sheng
via
Scopus - Elsevier
grade
Preferred source
(of
2)
ACS Catalysis
2022
|
Journal article
EID:
2-s2.0-85143862055
Contributors:
Chen, Z.;
Li, H.;
Sheng, K.;
Dong, X.;
Yuan, J.;
Hao, S.;
Li, M.;
Bai, R.;
Queneau, Y.;
Sidorenko, A.
et al.
Source:
Keyan Sheng
via
Scopus - Elsevier
AIP Advances
2022
|
Journal article
EID:
2-s2.0-85138461901
Contributors:
Zhou, Z.;
Chen, T.;
Sheng, K.;
Huang, J.
Source:
Keyan Sheng
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Green Chemistry
2022
|
Journal article
Source:
Keyan Sheng
grade
Preferred source
(of
3)
Radiation Physics and Chemistry
2022-12
|
Journal article
Contributors:
Keyan Sheng;
Zhengying Wang;
Keyan Sheng;
Zijian Zhou;
Haozhe Li;
Zhenyi Zhang;
Mianzhi Xiong;
jiang Huang
Source:
Keyan Sheng
grade
Preferred source
(of
2)
2022 IEEE 3rd China International Youth Conference on Electrical Engineering (CIYCEE)
2022-11-03
|
Conference paper
Contributors:
Keyan Sheng;
Keyan Sheng;
Zijian Zhou;
Xiaohan Dong;
Haozhe Li;
Zhenyi Zhang;
Kai Ning;
Jiang Huang
Source:
Keyan Sheng
grade
Preferred source
(of
2)
ACS Applied Energy Materials
2022-04-25
|
Journal article
Source:
Keyan Sheng
grade
Preferred source
(of
2)
Applied Surface Science
2022-03
|
Journal article
Source:
Keyan Sheng
grade
Preferred source
(of
2)
Guocheng Gongcheng Xuebao/The Chinese Journal of Process Engineering
2021
|
Journal article
EID:
2-s2.0-85121857776
Contributors:
Dong, X.;
Sheng, K.;
Chen, Z.;
Gu, Y.;
Huang, J.
Source:
Keyan Sheng
via
Scopus - Elsevier
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
2021
|
Journal article
EID:
2-s2.0-85105533307
Contributors:
Ning, K.;
Lu, J.;
Xie, P.;
Hu, J.;
Huang, J.;
Sheng, K.
Source:
Keyan Sheng
via
Scopus - Elsevier
Chemical Engineering Journal
2021-12-24
|
Magazine article
Source:
Keyan Sheng
grade
Preferred source
(of
2)
Applied Physics Letters
2020
|
Journal article
EID:
2-s2.0-85088125252
Contributors:
Sheng, K.;
Li, Y.;
Li, H.;
Ding, Z.;
Chen, T.;
Yuan, J.;
Zuo, C.;
Zhang, L.;
Liu, P.;
Huang, J.
Source:
Keyan Sheng
via
Scopus - Elsevier