Personal information

Activities

Employment (1)

Koszalin University of Technology: Koszalin, PL

1994-09-01 to present | professor (Electronics and Computer Sciences)
Employment
Source: Self-asserted source
Aleksy Patryn

Education and qualifications (1)

Koszalin University of Technology: Koszalin, PL

professor, doctor habilitated (Faculty of Electronics and Computer Sciences)
Education
Source: Self-asserted source
Aleksy Patryn

Works (49)

Investigations of free electrons in doped silicon crystals derived from Fourier transformed infrared measurements and ab initio calculations

Opto-Electronics Review
2025-01-27 | Journal article
Contributors: Bohdan Andriyevsky; Leszek Bychto; Aleksy Patryn; Ulrich Schade; Ljiljana Puskar; Alexander Veber; Nikolay Abrosimov; Andrii I. Kashuba
Source: check_circle
Crossref

Analysis of Perovskite Solar Cell Degradation over Time Using NIR Spectroscopy—A Novel Approach

Energies
2022-07 | Journal article | Author
Contributors: Marek Gąsiorowski; Shyantan Dasgupta; Leszek Bychto; Taimoor Ahmad; Piotr Szymak; Konrad Wojciechowski; Aleksy Patryn
Source: check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source (of 2)‎

Monitoring Time-Non-Stable Surfaces Using Mobile NIR DLP Spectroscopy

Electronics
2022-06 | Journal article | Author
Contributors: Marek Gąsiorowski; Piotr Szymak; Aleksy Patryn; Krzysztof Naus
Source: check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source (of 2)‎

Diagnostics on the Basis of the Frequency-Temperature Dependences of the Loss Angle Tangent of Heavily Moistured Oil-Impregnated Pressboard

Energies
2022-04 | Journal article | Author
Contributors: Tomasz Norbert Koltunowicz; Konrad Kierczyński; Pawel Okal; Aleksy Patryn; Miroslav Gutten
Source: check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source (of 2)‎

Application of Artificial Neural Networks in Analysis of Time-Variable Optical Reflectance Spectra in Digital Light Projection Spectroscopy

Coatings
2021-12 | Journal article | Author
Contributors: Marek Gąsiorowski; Piotr Szymak; Leszek Bychto; Aleksy Patryn
Source: check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source (of 2)‎

Optical and Recombination Parameters of CdS1−xTex Thin Films Obtained by the CMBD Method

Coatings
2021-12-22 | Journal article
Part of ISSN: 2079-6412
Contributors: Aleksy Patryn
Source: Self-asserted source
Aleksy Patryn
grade
Preferred source (of 2)‎

Determination of the optical absorption spectra of thin layers from their photoacoustic spectra

Optical Materials
2018 | Journal article
EID:

2-s2.0-85044579937

Contributors: Bychto, L.; Maliński, M.; Patryn, A.; Tivanov, M.; Gremenok, V.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Ab initio molecular dynamics calculations of heat conductivity for silicon related materials,Obliczenia z pierwszych zasad przewodności cieplnej materiałów na bazie krzemu metodą dynamiki molekularnej

Przeglad Elektrotechniczny
2017 | Journal article
EID:

2-s2.0-85026860961

Contributors: Andriyevsky, B.; Janke, W.; Patryn, A.; Maliński, M.; Stadnyk, V.; Romanyuk, M.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Effect of annealing on the structure of thermal evaporated In<inf>2</inf>S<inf>3</inf>thin films,Wpływ obróbki temperaturowej na termicznie naparowane cienkie warstwy In<inf>2</inf>S<inf>3</inf>

Przeglad Elektrotechniczny
2017 | Journal article
EID:

2-s2.0-85026872568

Contributors: Gremenok, V.F.; Reddy, K.T.R.; Tivanov, M.S.; Patryn, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Optical properties of thermally evaporated In<inf>2</inf>S<inf>3</inf> thin films measured using photoacoustic spectroscopy

Materials Science in Semiconductor Processing
2017 | Journal article
EID:

2-s2.0-85029531119

Contributors: Rasool, S.; Saritha, K.; Reddy, K.T.R.; Reddy, K.R.; Bychto, L.; Patryn, A.; Maliński, M.; Tivanov, M.S.; Gremenok, V.F.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Determination of CdS<inf>x</inf>Se<inf>1-x</inf> thick films optical properties from reflection spectra,Wyznaczanie parametrów optycznych grubych warstw CdS<inf>x</inf>Se<inf>1-x</inf> z analizy widma odbicia

Przeglad Elektrotechniczny
2016 | Journal article
EID:

2-s2.0-84985894817

Contributors: Tivanov, M.; Kaputskaya, I.; Patryn, A.; Saad, A.; Survilo, L.; Ostretsov, E.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Determination of cu(In,ga)(s,se)2–solar cell parameters from quantum efficiency spectra,Wyznaczanie parametrów Cu(In,Ga)(S,Se)2 ogniw słonecznych z widma wydajności kwantowej

Przeglad Elektrotechniczny
2015 | Journal article
EID:

2-s2.0-84940193914

Contributors: Tivanov, M.; Moskalev, A.; Patryn, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Electronic band structure and optical properties of ferroelectric TGS, TGSe and TGFB crystals

Materials Chemistry and Physics
2015 | Journal article
EID:

2-s2.0-84938751832

Contributors: Andriyevsky, B.; Kurlyak, V.Yu.; Stadnyk, V.Yo.; Romanyuk, M.O.; Patryn, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Modulated free-carrier absorption in silicon - a spectroscopy approach

Physica Status Solidi (B) Basic Research
2015 | Journal article
EID:

2-s2.0-84930383277

Contributors: Bychto, L.; Patryn, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Spectroscopic ellipsometry as a technique for surface quality monitoring of Sr<inf>x</inf>Ba<inf>1-x</inf>Nb<inf>2</inf>O<inf>6</inf> materials,Technika elipsometrii spektroskopowej jako metoda monitorowania jakości powierzchni materiałów grupy Sr<inf>x</inf>Ba<inf>1-x</inf>Nb<inf>2</inf>O<inf>6</inf>

Przeglad Elektrotechniczny
2014 | Journal article
EID:

2-s2.0-84920157523

Contributors: Dorywalski, K.; Patryn, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Synchrotron-based VUV spectroscopic ellipsometry system in application to optical properties studies of wide-bandgap materials for optoelectronics,System spektroskopii elipsometrycznej z promieniowaniem synchrotronowym w zastosowaniu do badań własności optycznych szerokopasmowych materiałów dla optoelektroniki

Przeglad Elektrotechniczny
2014 | Journal article
EID:

2-s2.0-84897586835

Contributors: Dorywalski, K.; Patryn, A.; Andriyevsky, B.; Cobet, C.; Esser, N.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Ellipsometric study of near band gap optical properties of Sr<inf>x</inf>Ba<inf>1-x</inf>Nb<inf>2</inf>O<inf>6</inf>crystals

Optical Materials
2013 | Journal article
EID:

2-s2.0-84875224649

Contributors: Dorywalski, K.; Andriyevsky, B.; Cobet, C.; Piasecki, M.; Kityk, I.V.; Esser, N.; Łukasiewicz, T.; Patryn, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Influence of matrix type on negative capacitance effect in nanogranular composite films FeCoZr-insulator

Elektronika ir Elektrotechnika
2013 | Journal article
EID:

2-s2.0-84876405485

Contributors: Kołtunowicz, T.N.; Zhukowski, P.; Fedotov, A.K.; Larkin, A.V.; Patryn, A.; Andryevskyy, B.; Saad, A.; Fedotova, J.A.; Fedotova, V.V.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Spectral ellipsometry study in the range of electronic excitations and band structure of [(CH<inf>3</inf>)<inf>2</inf>CHNH<inf>3</inf>]<inf>4</inf>Cd<inf>3</inf>Cl<inf>10</inf>crystals

Materials Chemistry and Physics
2013 | Journal article
EID:

2-s2.0-84875951128

Contributors: Andriyevsky, B.; Dorywalski, K.; Jaskólski, M.; Czapla, Z.; Patryn, A.; Esser, N.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Structural phase transitions in ferroelectric crystals and thin films studied by VUV spectroscopic ellipsometry with synchrotron radiation

Phase Transitions
2013 | Journal article
EID:

2-s2.0-84884671201

Contributors: Dorywalski, K.; Andriyevsky, B.; Piasecki, M.; Kityk, I.; Cobet, C.; Esser, N.; Patryn, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Ultraviolet vacuum ultraviolet optical functions for SrTiO<inf>3</inf> and NdGaO<inf>3</inf> crystals determined by spectroscopic ellipsometry

Journal of Applied Physics
2013 | Journal article
EID:

2-s2.0-84882293405

Contributors: Dorywalski, K.; Andriyevsky, B.; Piasecki, M.; Lemee, N.; Patryn, A.; Cobet, C.; Esser, N.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Electronic and optical properties of strontium barium niobate single crystals

Ferroelectrics
2012 | Journal article
EID:

2-s2.0-84861355233

Contributors: Andriyevsky, B.; Patryn, A.; Dorywalski, K.; Cobet, C.; Piasecki, M.; Kityk, I.; Esser, N.; Ukasiewicz, T.; Dec, J.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Electronic properties of KDP and DKDP crystals: Ab-initio calculations and spectral ellipsometry experiment

Ferroelectrics
2011 | Journal article
EID:

2-s2.0-84855256292

Contributors: Andriyevsky, B.; Patryn, A.; Cobet, C.; Przesławski, J.; Kosturek, B.; Esser, N.; Dorywalski, K.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Influence of plasmawaves on the photoacoustic signal of silicon samples

International Journal of Thermophysics
2011 | Journal article
EID:

2-s2.0-84855462589

Contributors: Chrobak, L.; Malinski, M.; Patryn, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Spectral ellipsometry study of SBN single crystals in visible and ultraviolet region

Ferroelectrics
2011 | Journal article
EID:

2-s2.0-84855769124

Contributors: Andriyevsky, B.; Dorywalski, K.; Kityk, I.; Piasecki, M.; Łukasiewicz, T.; Świrkowicz, M.; Patryn, A.; Dec, J.; Esser, N.; Cobet, C.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Imaginary part of admittance in (Fe<inf>0.45</inf>Co<inf>0.45</inf>Zr<inf>0.10</inf>)<inf>x</inf>(Ai<inf>2</inf>0<inf>3</inf>)<inf>(1-x)</inf>nanocomposites

Przeglad Elektrotechniczny
2010 | Journal article
EID:

2-s2.0-77954321992

Contributors: Larkin, A.V.; Saad, A.; Fedotov, A.K.; Fedotova, J.A.; Patryn, A.; Andriyevskyy, B.; Czapla., Z.; Dacko, S.; Koltunowicz, T.N.; Gierek, P.W.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Dielectric properties of (NH<inf>4</inf>)<inf>2</inf>SO<inf>4</inf> crystals in the range of electronic excitations

Journal of Synchrotron Radiation
2009 | Journal article
EID:

2-s2.0-61449212133

Contributors: Andriyevsky, B.; Cobet, C.; Patryn, A.; Esser, N.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Ellipsometric study of electronic basic solid state physics excitations in triglycine sulphate and triglycine selenate crystals

Physica Status Solidi (B) Basic Research
2009 | Journal article
EID:

2-s2.0-76849108600

Contributors: Andriyevsky, B.; Patryn, A.; Cobet, C.; Mytsyk, B.; Esser, N.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Manifestation of phase transformations in optical spectra of Na <inf>0.5</inf>Bi<inf>0.5</inf>TiO<inf>3</inf> crystals between 25C and 350C

Phase Transitions
2009 | Journal article
EID:

2-s2.0-70449090226

Contributors: Andriyevsky, B.; Suchanicz, J.; Cobet, C.; Patryn, A.; Esser, N.; Kosturek, B.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Theoretical and experimental studies of a plasma wave contribution to the photoacoustic signal for si samples

Acta Acustica united with Acustica
2009 | Journal article
EID:

2-s2.0-62949160520

Contributors: Maliński, M.; Chrobak, Ł.; Patryn, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

DC conductivity of amorphous composites x(Fe<inf>0.45</inf>Co<inf>0.45</inf>Zr<inf>0.10</inf>)+(1-x)(Al<inf>2</inf>O<inf>3</inf>) in the range of 20-300 K

Przeglad Elektrotechniczny
2008 | Journal article
EID:

2-s2.0-41349115308

Contributors: Andriyevsky, B.; Patryn, A.; Kuzhel, B.; Kapustianyk, V.; Czapla, Z.; Dacko, S.; Svito, I.A.; Pivovarchik, T.V.; Fedotov, A.K.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Formation of insulating oxygen-containing layer on the silicon wafer surface using low-temperature hydrogenation

Journal of Materials Science: Materials in Electronics
2008 | Journal article
EID:

2-s2.0-53649084974

Contributors: Zinchuk, O.; Saad, A.; Drozdov, N.; Fedotov, A.; Kobeleva, S.; Mazanik, A.; Patryn, A.; Pilipenko, V.; Pushkarchuk, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Impedance spectroscopy study of amorphous composites x(Fe <inf>0.45</inf>Co<inf>0.45</inf>Zr<inf>0.10</inf>)+(1-x)(Al<inf>2</inf>O <inf>3</inf>)

Przeglad Elektrotechniczny
2008 | Journal article
EID:

2-s2.0-41349091462

Contributors: Andriyevsky, B.; Patryn, A.; Czapla, Z.; Dacko, S.; Fedotova, J.A.; Larkin, A.V.; Fedotova, V.V.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Investigation of defects in Cu(In,Ga)(S,Se)<inf>2</inf>films using the photocurrent decay technique

Journal of Materials Science: Materials in Electronics
2008 | Journal article
EID:

2-s2.0-53649109141

Contributors: Saad, A.; Odrinski, A.; Tivanov, M.; Drozdov, N.; Fedotov, A.; Gremenok, V.; Mazanik, A.; Patryn, A.; Zalesski, V.; Zaretskaya, E.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Optical spectra of triglycine sulfate crystals in the range of 7-33 eV and its changes at phase transition

Phase Transitions
2008 | Journal article
EID:

2-s2.0-54249105068

Contributors: Andriyevsky, B.; Ciepluch-Trojanek, W.; Cobet, C.; Patryn, A.; Esser, N.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Study of nanopipes formed in silicon wafers using helium implantation by SEM, RBS and SIMS methods

Journal of Materials Science: Materials in Electronics
2008 | Journal article
EID:

2-s2.0-53649105896

Contributors: Frantskevich, A.V.; Saad, A.M.; Mazanik, A.V.; Frantskevich, N.V.; Fedotov, A.K.; Kulinkauskas, V.S.; Patryn, A.A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Band structure and optical spectra of ferroelectric triglycine sulphate

Phase Transitions
2007 | Journal article
EID:

2-s2.0-34249104143

Contributors: Andriyevsky, B.; Ciepluch-Trojanek, W.; Patryn, A.; Esser, N.; Cobet, C.; Romanyuk, M.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Effect of hydrostatic pressure on structural and electronic properties of TGS crystals (first-principle calculations)

Condensed Matter Physics
2007 | Journal article
EID:

2-s2.0-34147145964

Contributors: Andriyevsky, B.; Ciepluch-Trojanek, W.; Patryn, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

AC conductance of (Co<inf>0.45</inf>Fe<inf>0.45</inf>Zr<inf>0.10</inf>)<inf>X</inf>(Al<inf>2</inf>O<inf>3</inf>)<inf>1 - X</inf>nanocomposites

Progress in Solid State Chemistry
2006 | Journal article
EID:

2-s2.0-33746872227

Contributors: Saad, A.; Fedotov, A.K.; Svito, I.A.; Mazanik, A.V.; Andrievsky, B.V.; Patryn, A.A.; Kalinin, Yu.E.; Sitnikov, A.V.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Band structure and UV optical spectra of TGS crystals in the range of 4-10 eV

Physica B: Condensed Matter
2006 | Journal article
EID:

2-s2.0-32844468143

Contributors: Andriyevsky, B.; Esser, N.; Patryn, A.; Cobet, C.; Ciepluch-Trojanek, W.; Romanyuk, M.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Characterization of (Co<inf>0.45</inf>Fe<inf>0.45</inf>Zr<inf>0.10</inf>)x(Al<inf>2</inf>O<inf>3</inf>)1-x nanocomposite films applicable as spintronic materials

Physica Status Solidi C: Conferences
2006 | Conference paper
EID:

2-s2.0-33745017161

Contributors: Saad, A.M.; Fedotov, A.K.; Fedotova, J.A.; Svito, L.A.; Andrievsky, B.V.; Kalinin, Yu.E.; Fedotova, V.V.; Malyutina-Bronskaya, V.; Patryn, A.A.; Mazanik, A.V. et al.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Impedance and magnetization of CoFeZr nanoclusters embedded into alumina matrix

Journal of Alloys and Compounds
2006 | Journal article
EID:

2-s2.0-33748880648

Contributors: Saad, A.M.; Fedotov, A.K.; Svito, I.A.; Fedotova, J.A.; Andrievsky, B.V.; Kalinin, Yu.E.; Patryn, A.A.; Fedotova, V.V.; Malyutina-Bronskaya, V.; Mazanik, A.V. et al.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Band structure and optical properties of diglycine nitrate crystal

Physica B: Condensed Matter
2005 | Journal article
EID:

2-s2.0-20344374962

Contributors: Andriyevsky, B.; Ciepluch-Trojanek, W.; Romanyuk, M.; Patryn, A.; Jaskólski, M.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Determination of solar cell parameters from its current-voltage and spectral characteristics

Solar Energy Materials and Solar Cells
2005 | Journal article
EID:

2-s2.0-17644427697

Contributors: Tivanov, M.; Patryn, A.; Drozdov, N.; Fedotov, A.; Mazanik, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Didactic software for solar cells and materials parameters analysis

Solar Energy Materials and Solar Cells
2005 | Journal article
EID:

2-s2.0-17644400136

Contributors: Patryn, A.; Pietruszko, S.M.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Investigations of the optical and thermal parameters of porous silicon layers with the two wavelength photoacoustic method

Journal De Physique. IV : JP
2005 | Conference paper
EID:

2-s2.0-33645054833

Contributors: Maliński, M.; Bychto, L.; Patryn, A.; Gibkes, J.; Bein, B.K.; Pelzl, J.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

Modification of radiation hardness of silicon p-n junction photodiodes by hydrogen plasma treatment

Journal of Materials Science
2005 | Journal article
EID:

2-s2.0-27544433608

Contributors: Saad, A.M.; Mazanik, A.V.; Fedotov, A.K.; Patryn, A.A.; Chigir, S.V.; Drozdov, N.A.; Stognij, A.I.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

The model of a thin semiconductor layer on a thermally thick semiconductor backing for the photoacoustic use

Journal De Physique. IV : JP
2004 | Conference paper
EID:

2-s2.0-7044223031

Contributors: Maliński, M.; Bychto, L.; Fotsing, J.L.N.; Junge, K.; Patryn, A.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier

TSDC and dielectric properties of Nd-doped KGd(WO<inf>4</inf>)<inf>2</inf> crystals

Materials Science and Engineering B: Solid-State Materials for Advanced Technology
2004 | Journal article
EID:

2-s2.0-1142281039

Contributors: Andriyevsky, B.; Patryn, A.; Czapla, Z.; Dacko, S.
Source: Self-asserted source
Aleksy Patryn via Scopus - Elsevier