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Employment (1)

University of Maryland Baltimore County: Baltimore, MD, US

Assistant Prof. (Computer Science and Electrical Engineering)
Employment
Source: Self-asserted source
Naghmeh Karimi

Works (19)

Evaluation of Entity Trustworthiness Based on Public and Private Data

2024 | Book chapter
Contributors: Marc Sel; Hasin Ishraq Reefat; Naghmeh Karimi; Konstantinos Mersinas
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Crossref

On the Resiliency of Protected Masked S-Boxes Against Template Attack in the Presence of Temperature and Aging Misalignments

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2024 | Journal article
Contributors: Md Toufiq Hasan Anik; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi
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Multi-modal Pre-silicon Evaluation of Hardware Masking Styles

Journal of Electronic Testing
2024-12 | Journal article
Contributors: Md Toufiq Hasan Anik; Hasin Ishraq Reefat; Wei Cheng; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi
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PETIT: PUF-enabled trust evaluation framework for IoT networks

Computer Networks
2024-12 | Journal article
Contributors: Suhee Sanjana Mehjabin; Mohamed Younis; Ali Tekeoglu; Mohammad Ebrahimabadi; Tamim Sookoor; Naghmeh Karimi
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DELFINES: Detecting Laser Fault Injection Attacks via Digital Sensors

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2024-03 | Journal article
Contributors: Mohammad Ebrahimabadi; Suhee Sanjana Mehjabin; Raphael Viera; Sylvain Guilley; Jean-Luc Danger; Jean-Max Dutertre; Naghmeh Karimi
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Crossref

The 28th IEEE European Test Symposium

IEEE Design & Test
2024-02 | Journal article
Contributors: Naghmeh Karimi
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A Networked System Dependability Validation Framework Using Physical and Virtual Nodes

IEEE Access
2023 | Journal article
Contributors: Suhee Sanjana Mehjabin; Ali Tekeoglu; Mohamed Younis; Mohammad Ebrahimabadi; Rahul Chandran; Tamim Sookoor; Naghmeh Karimi
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The 41st IEEE VLSI Test Symposium

IEEE Design & Test
2023-10 | Journal article
Contributors: Naghmeh Karimi
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Aging-Induced Failure Prognosis via Digital Sensors

2023-06-05 | Conference paper
Contributors: Md Toufiq Hasan Anik; Hasin Ishraq Reefat; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi
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Crossref

Aging Effects on Template Attacks Launched on Dual-Rail Protected Chips

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2022-05 | Journal article
Contributors: Farzad Niknia; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi
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Crossref

A PUF-Based Modeling-Attack Resilient Authentication Protocol for IoT Devices

IEEE Internet of Things Journal
2022-03-01 | Journal article
Contributors: Mohammad Ebrahimabadi; Mohamed Younis; Naghmeh Karimi
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Assessment and Mitigation of Power Side-Channel-Based Cross-PUF Attacks on Arbiter-PUFs and Their Derivatives

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2022-02 | Journal article
Contributors: Trevor Kroeger; Wei Cheng; Sylvain Guilley; Jean-Luc Danger; Naghmeh Karimi
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Crossref

AVATAR: NN-Assisted Variation Aware Timing Analysis and Reporting for Hardware Trojan Detection

IEEE Access
2021 | Journal article
Contributors: Ashkan Vakil; Ali Mirzaeian; Houman Homayoun; Naghmeh Karimi; Avesta Sasan
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Crossref

Masked SABL: A Long Lasting Side-Channel Protection Design Methodology

IEEE Access
2021 | Journal article
Part of ISSN: 2169-3536
Contributors: Bijan Fadaeinia; Md Toufiq Hasan Anik; Naghmeh Karimi; Amir Moradi
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Naghmeh Karimi via Crossref Metadata Search
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Detecting Failures and Attacks via Digital Sensors

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2021-07 | Journal article
Contributors: Md Toufiq Hasan Anik; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi
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Crossref

Hardware Security in Emerging Technologies: Vulnerabilities, Attacks, and Solutions

IEEE Journal on Emerging and Selected Topics in Circuits and Systems
2021-06 | Journal article
Contributors: Naghmeh Karimi; Kanad Basu; Chip-Hong Chang; Jason M. Fung
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Crossref

Two Sides of the Same Coin: Boons and Banes of Machine Learning in Hardware Security

IEEE Journal on Emerging and Selected Topics in Circuits and Systems
2021-06 | Journal article
Contributors: Wenye Liu; Chip-Hong Chang; Xueyang Wang; Chen Liu; Jason M. Fung; Mohammad Ebrahimabadi; Naghmeh Karimi; Xingyu Meng; Kanad Basu
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Crossref

Real-Time Prediction for IC Aging Based on Machine Learning

IEEE Transactions on Instrumentation and Measurement
2019-12 | Journal article
Contributors: Ke Huang; Xinqiao Zhang; Naghmeh Karimi
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Crossref

Impact of Aging on the Reliability of Delay PUFs

Journal of Electronic Testing
2018-10 | Journal article
Contributors: Naghmeh Karimi; Jean-Luc Danger; Sylvain Guilley
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Peer review (1 review for 1 publication/grant)

Review activity for Integration. (1)