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Scopus Author ID: 57194219326

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Employment (2)

Boston University: Boston, MA, US

2022-04-11 to present | Postdoctoral Researcher (Electrical and Computer Engineering)
Employment
Source: Self-asserted source
Akshay Agarwal

Massachusetts Institute of Technology: Cambridge, MA, US

2020-10-15 to 2021-05-31 | Postdoctoral Associate (Electrical Engineering and Computer Science)
Employment
Source: Self-asserted source
Akshay Agarwal

Education and qualifications (2)

Massachusetts Institute of Technology: Cambridge, MA, US

2014-09-01 to 2020-08-31 | PhD (Electrical Engineering and Computer Science)
Education
Source: Self-asserted source
Akshay Agarwal

Indian Institute of Technology Bombay: Mumbai, Maharashtra, IN

2009-07 to 2014-05 | Dual Degree (B. Tech. + M. Tech.) (Electrical Engineering)
Education
Source: Self-asserted source
Akshay Agarwal

Works (20)

Shot noise-mitigated secondary electron imaging with ion count-aided microscopy

Proceedings of the National Academy of Sciences
2024-07-30 | Journal article
DOI: 10.1073/pnas.2401246121
Contributors: Akshay Agarwal; Leila Kasaei; Xinglin He; Ruangrawee Kitichotkul; Oğuz Kağan Hitit; Minxu Peng; J. Albert Schultz; Leonard C. Feldman; Vivek K Goyal
Source: check_circle
Crossref

Continuous-Time Modeling and Analysis of Particle Beam Metrology

IEEE Journal on Selected Areas in Information Theory
2023 | Journal article
DOI: 10.1109/JSAIT.2023.3283911
Contributors: Akshay Agarwal; Minxu Peng; Vivek K Goyal
Source: check_circle
Crossref

Secondary electron count imaging in SEM

Ultramicroscopy
2023-03 | Journal article
DOI: 10.1016/j.ultramic.2022.113662
Contributors: Akshay Agarwal; John Simonaitis; Vivek K. Goyal; Karl K. Berggren
Source: check_circle
Crossref

Online Beam Current Estimation in Particle Beam Microscopy

IEEE Transactions on Computational Imaging
2022 | Journal article
DOI: 10.1109/TCI.2022.3182212
Contributors: Sheila W. Seidel; Luisa Watkins; Minxu Peng; Akshay Agarwal; Christopher Yu; Vivek K Goyal
Source: check_circle
Crossref

Image-histogram-based secondary electron counting to evaluate detective quantum efficiency in SEM

Ultramicroscopy
2021-05 | Journal article
DOI: 10.1016/j.ultramic.2021.113238
Contributors: Akshay Agarwal; John Simonaitis; Karl K. Berggren
Source: check_circle
Crossref

Superconducting MoN thin films prepared by DC reactive magnetron sputtering for nanowire single-photon detectors

Superconductor Science and Technology
2021-03-01 | Journal article
DOI: 10.1088/1361-6668/abda5f
Contributors: Lily Hallett; Ilya Charaev; Akshay Agarwal; Andrew Dane; Marco Colangelo; Di Zhu; Karl K Berggren
Source: check_circle
Crossref

Focused-helium-ion-beam blow forming of nanostructures: radiation damage and nanofabrication

Nanotechnology
2020-01-17 | Journal article
DOI: 10.1088/1361-6528/ab4a65
Contributors: Chung-Soo Kim; Richard G Hobbs; Akshay Agarwal; Yang Yang; Vitor R Manfrinato; Michael P Short; Ju Li; Karl K Berggren
Source: check_circle
Crossref

Enhancement of Optical Response in Nanowires by Negative-Tone PMMA Lithography

IEEE Transactions on Applied Superconductivity
2019-08 | Journal article
DOI: 10.1109/tasc.2019.2898677
Part of ISSN: 1051-8223
Part of ISSN: 1558-2515
Part of ISSN: 2378-7074
Source: Self-asserted source
Akshay Agarwal

Performance Analysis of Interaction-Free-Measurement-based Electron Microscopy

Microscopy and Microanalysis
2019-08 | Journal article
DOI: 10.1017/s1431927619001491
Part of ISSN: 1431-9276
Part of ISSN: 1435-8115
Source: Self-asserted source
Akshay Agarwal

Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination

Physical Review A
2019-06-05 | Journal article
DOI: 10.1103/physreva.99.063809
Part of ISSN: 2469-9926
Part of ISSN: 2469-9934
Source: Self-asserted source
Akshay Agarwal

Exploring proximity effects and large depth of field in helium ion beam lithography: large-area dense patterns and tilted surface exposure

Nanotechnology
2018-05-08 | Journal article
DOI: 10.1088/1361-6528/aabe22
Part of ISSN: 0957-4484
Contributors: Ranveig Flatabø; Akshay Agarwal; Richard Hobbs; Martin M Greve; Bodil Holst; Karl K Berggren
Source: Self-asserted source
Akshay Agarwal via Crossref Metadata Search
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A nanofabricated, monolithic, path-separated electron interferometer

Scientific Reports
2017 | Journal article
DOI: 10.1038/s41598-017-01466-0
EID:

2-s2.0-85019255018
Contributors: Agarwal, A.; Kim, C.-S.; Hobbs, R.; Dyck, D.V.; Berggren, K.K.
Source: Self-asserted source
Akshay Agarwal via Scopus - Elsevier

Bias sputtered NbN and superconducting nanowire devices

Applied Physics Letters
2017 | Journal article
DOI: 10.1063/1.4990066
EID:

2-s2.0-85029666642
Contributors: Dane, A.E.; McCaughan, A.N.; Zhu, D.; Zhao, Q.; Kim, C.-S.; Calandri, N.; Agarwal, A.; Bellei, F.; Berggren, K.K.
Source: Self-asserted source
Akshay Agarwal via Scopus - Elsevier

Monolithic Multi-Grating Diffraction in a Convergent Electron Beam

Microscopy and Microanalysis
2016-07 | Journal article
DOI: 10.1017/s1431927616001689
Part of ISSN: 1431-9276
Part of ISSN: 1435-8115
Source: Self-asserted source
Akshay Agarwal

Effect of barrier thickness on structural, optical, and spectral behaviors of vertically strain coupled InAs/GaAs quantum dot infrared photodetectors

J. Vac. Sci. Technol. B
2014-09 | Journal article
DOI: 10.1116/1.4894461
Contributors: Hemant Ghadi; Akshay Agarwal; Sourav Adhikary; Binita Tongbram; Arjun Mandal; Subhananda Chakrabarti; Naresh Babu Pendyala; Sachin Prajapati; Ashwani Kumar
Source: Self-asserted source
Akshay Agarwal via Crossref Metadata Search

One order enhancement of detectivity in quaternary capped InAs/GaAs quantum dot infrared photodetectors due to vertical coupling of quantum dot layers

Thin Solid Films
2014-09 | Journal article
DOI: 10.1016/j.tsf.2014.07.010
Contributors: Hemant Ghadi; Akshay Agarwal; Sourav Adhikary; Jay Agawane; Arjun Mandal; Subhananda Chakrabarti; Naresh Babu Pendyala; Sachin Prajapati
Source: Self-asserted source
Akshay Agarwal via Crossref Metadata Search

Power and efficiency analysis of a realistic resonant tunneling diode thermoelectric

Appl. Phys. Lett.
2014-07-07 | Journal article
DOI: 10.1063/1.4888859
Contributors: Akshay Agarwal; Bhaskaran Muralidharan
Source: Self-asserted source
Akshay Agarwal via Crossref Metadata Search

Tuning in spectral response due to rapid thermal annealing on dot-in-a-well infrared photodetectors

Superlattices and Microstructures
2014-01 | Journal article
DOI: 10.1016/j.spmi.2013.10.036
Contributors: H. Ghadi; S. Adhikary; A. Agarwal; S. Chakrabarti
Source: Self-asserted source
Akshay Agarwal via Crossref Metadata Search

Investigation of thermal interdiffusion in InAs/In0.15Ga0.85As/GaAs quantum dot-in-a-well heterostructures

Journal of Luminescence
2013-11 | Journal article
DOI: 10.1016/j.jlumin.2013.04.030
Contributors: A. Agarwal; M. Srujan; S. Chakrabarti; S. Krishna
Source: Self-asserted source
Akshay Agarwal via Crossref Metadata Search

More than one order enhancement in peak detectivity (D*) for quantum dot infrared photodetectors implanted with low energy light ions (H−)

Applied Physics Letters
2013-02-04 | Journal article
DOI: 10.1063/1.4791675
Part of ISSN: 0003-6951
Part of ISSN: 1077-3118
Source: Self-asserted source
Akshay Agarwal
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