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Works (3)

Guest Editorial: Introduction to the Special Section on the 2023 Asian Solid-State Circuits Conference (A-SSCC)

IEEE Journal of Solid-State Circuits
2024-10 | Journal article
Contributors: Ken Takeuchi; Tetsuya Iizuka; Kazuko Nishimura; Jerald Yoo
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Characterization of Plasma Process-Induced Low-Density Defect Creation by Lateral Junction Leakage

IEEE Journal of the Electron Devices Society
2022 | Journal article
Contributors: Yoshihiro Sato; Satoshi Shibata; Takayoshi Yamada; Kazuko Nishimura; Masayuki Yamasaki; Masashi Murakami; Keiichiro Urabe; Koji Eriguchi
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Predicting the effects of plasma-induced damage on p–n junction leakage and its application in the characterization of defect distribution

Journal of Vacuum Science & Technology B
2022-12-01 | Journal article
Contributors: Yoshihiro Sato; Satoshi Shibata; Kazuko Nishimura; Masayuki Yamasaki; Masashi Murakami; Keiichiro Urabe; Koji Eriguchi
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