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Employment (1)

Hebei Semiconductor Research Institute: Shijiazhuang, Hebei, CN

2012-07-18 to present
Employment
Source: Self-asserted source
Yibang Wang

Education and qualifications (2)

Handan Purified Equipment Research Institute: Handan, Hebei, CN

2009-09-01 to 2012-07-01 | Master ( Instrument design)
Education
Source: Self-asserted source
Yibang Wang

Nanjing University of Aeronautics and Astronautics: Nanjing, Jiangsu, CN

2004-09-01 to 2009-07-01 | Bachelor (Communication engineering )
Education
Source: Self-asserted source
Yibang Wang

Works (6)

An Advanced Calibration Method for Probe Leakage Correction in On-Wafer Test Systems

IEEE Transactions on Microwave Theory and Techniques
2023-02 | Journal article
DOI: 10.1109/TMTT.2022.3200050
Contributors: Yibang Wang; Xingchang Fu; Aihua Wu; Ye Huo; Chen Liu; Peng Luan; Lihua Lei; Faguo Liang; Chong Li
Source: check_circle
Crossref

Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy

IEEE Transactions on Instrumentation and Measurement
2020-11 | Journal article
DOI: 10.1109/TIM.2020.2995970
Contributors: Peng Luan; Yibang Wang; Wei Zhao; Chen Liu; Faguo Liang; Aihua Wu; Jing Du
Source: check_circle
Crossref

Calibration on the Fly—A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky Systems

IEEE Transactions on Microwave Theory and Techniques
2020-08 | Journal article
DOI: 10.1109/TMTT.2020.2988461
Contributors: Aihua Wu; Chen Liu; Faguo Liang; Xuefeng Zou; Yibang Wang; Peng Luan; Chong Li; Nick Ridler
Source: check_circle
Crossref

A Reformulation and Sensitivity Analysis of TRL

IEEE Transactions on Instrumentation and Measurement
2020-07 | Journal article
DOI: 10.1109/TIM.2019.2950825
Contributors: Wei Zhao; Yibang Wang
Source: check_circle
Crossref

Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems

IEEE Transactions on Instrumentation and Measurement
2020-06 | Journal article
DOI: 10.1109/TIM.2019.2929671
Contributors: Aihua Wu; Xingchang Fu; Chen Liu; Chong Li; Yibang Wang; Faguo Liang; Peng Luan
Source: check_circle
Crossref

Development of gallium-arsenide-based GCPW calibration kits for on-wafer measurements in the W-band

International Journal of Microwave and Wireless Technologies
2020-06-12 | Journal article
DOI: 10.1017/S1759078719001521
Contributors: Yibang Wang; Xingchang Fu; Aihua Wu; Chen Liu; Peng Luan; Faguo Liang; Wei Zhao; Xiaobang Shang
Source: check_circle
Crossref
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