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Works (21)

Hilbert–Huang Transform Based Transient Analysis in Voltage Source Converter Interfaced Direct Current System

IEEE Transactions on Industrial Electronics
2021-11 | Journal article
DOI: 10.1109/TIE.2020.3038056
Contributors: Dongyu Li; Abhisek Ukil; Kuntal Satpathi; Yew Ming Yeap
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Crossref

Improved S Transform-Based Fault Detection Method in Voltage Source Converter Interfaced DC System

IEEE Transactions on Industrial Electronics
2021-06 | Journal article
DOI: 10.1109/TIE.2020.2988193
Contributors: Dongyu Li; Abhisek Ukil; Kuntal Satpathi; Yew Ming Yeap
Source: check_circle
Crossref

Analysis of Driving Behavior's Impact on Battery Discharge Rate for Electric Vehicles

2019 IEEE Intelligent Transportation Systems Conference, ITSC 2019
2019 | Conference paper
DOI: 10.1109/ITSC.2019.8917265
EID:

2-s2.0-85076803453
Contributors: Yeap, Y.M.; Tran, D.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Modelling and Analytics of Driving-related Energy Performance of Electric Vehicles

2019 IEEE Intelligent Transportation Systems Conference, ITSC 2019
2019 | Conference paper
DOI: 10.1109/ITSC.2019.8917474
EID:

2-s2.0-85076806340
Contributors: Neo, Y.R.D.; Tran, D.; Yeap, Y.M.; Lim, L.H.I.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Power systems frequency estimation using amplitude tracking square wave for low-end protective relays

Measurement: Journal of the International Measurement Confederation
2019 | Journal article
DOI: 10.1016/j.measurement.2019.03.068
EID:

2-s2.0-85064463796

Part of ISBN:

02632241
Contributors: Ukil, A.; Yeap, Y.M.; Satpathi, K.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Capacitive discharge based transient analysis with fault detection methodology in DC system

International Journal of Electrical Power and Energy Systems
2018 | Journal article
DOI: 10.1016/j.ijepes.2017.10.023
EID:

2-s2.0-85034106691

Part of ISBN:

01420615
Contributors: Yeap, Y.M.; Geddada, N.; Ukil, A.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Fault identification in AC and DC systems using stft analysis of high frequency components

2017 IEEE Innovative Smart Grid Technologies - Asia: Smart Grid for Smart Community, ISGT-Asia 2017
2018 | Conference paper
DOI: 10.1109/ISGT-Asia.2017.8378463
EID:

2-s2.0-85049986800
Contributors: Ukil, A.; Yeap, Y.M.; Satpathi, K.; Geddada, N.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Time- and Frequency-Domain Fault Detection in a VSC-Interfaced Experimental DC Test System

IEEE Transactions on Industrial Informatics
2018-10 | Journal article
DOI: 10.1109/TII.2018.2796068
Contributors: Yew Ming Yeap; Nagesh Geddada; Kuntal Satpathi; Abhisek Ukil
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Experimental Validation of Fault Identification in VSC-Based DC Grid System

IEEE Transactions on Industrial Electronics
2018-06 | Journal article
DOI: 10.1109/TIE.2017.2767560
Contributors: Nagesh Geddada; Yew Ming Yeap; Abhisek Ukil
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Crossref
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Short-Time Fourier Transform Based Transient Analysis of VSC Interfaced Point-to-Point DC System

IEEE Transactions on Industrial Electronics
2018-05 | Journal article
DOI: 10.1109/TIE.2017.2758745
Contributors: Kuntal Satpathi; Yew Ming Yeap; Abhisek Ukil; Nagesh Geddada
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Analysis and validation of wavelet transform based DC fault detection in HVDC system

Applied Soft Computing Journal
2017 | Journal article
DOI: 10.1016/j.asoc.2017.07.039
EID:

2-s2.0-85026887505

Part of ISBN:

15684946
Contributors: Yeap, Y.M.; Geddada, N.; Ukil, A.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Comparative evaluation of power loss in HVAC and HVDC transmission systems

IEEE Region 10 Annual International Conference, Proceedings/TENCON
2017 | Conference paper
DOI: 10.1109/TENCON.2016.7848080
EID:

2-s2.0-85015449404

Part of ISBN:

21593450 21593442
Contributors: May, T.W.; Yeap, Y.M.; Ukil, A.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Fault and load change differentiation in high voltage direct current (HVDC) system

IEEE International Conference on Power Electronics, Drives and Energy Systems, PEDES 2016
2017 | Conference paper
DOI: 10.1109/PEDES.2016.7914384
EID:

2-s2.0-85042311849
Contributors: Geddada, N.; Yeap, Y.M.; Ukil, A.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Fault location estimation for VSC-HVDC system using Artificial Neural Network

IEEE Region 10 Annual International Conference, Proceedings/TENCON
2017 | Conference paper
DOI: 10.1109/TENCON.2016.7848050
EID:

2-s2.0-85015417162

Part of ISBN:

21593450 21593442
Contributors: Vasanth, S.; Yeap, Y.M.; Ukil, A.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Circulating current controller in dq reference frame for MMC based HVDC system

IECON Proceedings (Industrial Electronics Conference)
2016 | Conference paper
DOI: 10.1109/IECON.2016.7793646
EID:

2-s2.0-85010028152
Contributors: Geddada, N.; Ukil, A.; Yeap, Y.M.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Fault detection in HVDC system using Short Time Fourier Transform

IEEE Power and Energy Society General Meeting
2016 | Conference paper
DOI: 10.1109/PESGM.2016.7741323
EID:

2-s2.0-85002145853

Part of ISBN:

19449933 19449925
Contributors: Yeap, Y.M.; Ukil, A.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

STFT analysis of high frequency components in transient signals in multi-terminal HVDC system

IECON Proceedings (Industrial Electronics Conference)
2016 | Conference paper
DOI: 10.1109/IECON.2016.7793094
EID:

2-s2.0-85010042295
Contributors: Yeap, Y.M.; Ukil, A.; Geddada, N.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Differentiation of fault and load change in HVDC system using Amplitude Tracking Square Wave

2015 IEEE Eindhoven PowerTech, PowerTech 2015
2015 | Conference paper
DOI: 10.1109/PTC.2015.7232301
EID:

2-s2.0-84951335233
Contributors: Yeap, Y.M.; Ukil, A.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Short-circuit protection for MV & LVDC grid

Asia-Pacific Power and Energy Engineering Conference, APPEEC
2014 | Conference paper
DOI: 10.1109/APPEEC.2014.7065999
EID:

2-s2.0-84936984864

Part of ISBN:

21574847 21574839
Contributors: Lee, K.C.; Ukil, A.; Yeap, Y.-M.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Simulation and analysis of faults in high voltage DC (HVDC) power transmission

IECON Proceedings (Industrial Electronics Conference)
2014 | Conference paper
DOI: 10.1109/IECON.2014.7048744
EID:

2-s2.0-84983121667
Contributors: Karthikeyan, M.; Yeap, Y.M.; Ukil, A.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier

Wavelet based fault analysis in HVDC system

IECON Proceedings (Industrial Electronics Conference)
2014 | Conference paper
DOI: 10.1109/IECON.2014.7048852
EID:

2-s2.0-84983123707
Contributors: Yeap, Y.M.; Ukil, A.
Source: Self-asserted source
Yew Ming Yeap via Scopus - Elsevier
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