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Detecting anomalies in X-ray diffraction images using convolutional neural networks

Expert Systems with Applications
2021-07 | Journal article
DOI: 10.1016/j.eswa.2021.114740
Contributors: Adam Czyzewski; Faustyna Krawiec; Dariusz Brzezinski; Przemyslaw Jerzy Porebski; Wladek Minor
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