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Scopus Author ID: 51764499800

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Estonia

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Employment (1)

Tallinn University of Technology: Tallinn, EE

2011 to present | PhD student (Department of Computer Systems)
Employment
Source: Self-asserted source
Konstantin Shibin

Education and qualifications (2)

Tallinn University of Technology: Tallinn, EE

2009 to 2011 | Master (Department of Computer Systems)
Education
Source: Self-asserted source
Konstantin Shibin

Tallinn University of Technology: Tallinn, EE

2006 to 2009 | BSc (Department of Computer Systems)
Education
Source: Self-asserted source
Konstantin Shibin

Works (13)

Designing Reliable Cyber-Physical Systems

Lecture Notes in Electrical Engineering
2018 | Book
DOI: 10.1007/978-3-319-62920-9_2
EID:

2-s2.0-85034454180
Contributors: Aleksandrowicz, G.; Arbel, E.; Bloem, R.; ter Braak, T.D.; Devadze, S.; Fey, G.; Jenihhin, M.; Jutman, A.; Kerkhoff, H.G.; Könighofer, R. et al.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier

IEEE 1687 Compliant Ecosystem for Embedded Instrumentation Access and In-Field Health Monitoring

AUTOTESTCON (Proceedings)
2018 | Conference paper
DOI: 10.1109/AUTEST.2018.8532559
EID:

2-s2.0-85058230613
Contributors: Tsertov, A.; Jutman, A.; Shibin, K.; Devadze, S.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier

Health Management for Self-Aware SoCs Based on IEEE 1687 Infrastructure

IEEE Design and Test
2017 | Journal article
DOI: 10.1109/MDAT.2017.2750902
EID:

2-s2.0-85037723856
Contributors: Shibin, K.; Devadze, S.; Jutman, A.; Grabmann, M.; Pricken, R.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier

On-line fault classification and handling in IEEE1687 based fault management system for complex SoCs

LATS 2016 - 17th IEEE Latin-American Test Symposium
2016 | Conference paper
DOI: 10.1109/LATW.2016.7483342
EID:

2-s2.0-84978531823
Contributors: Shibin, K.; Devadze, S.; Jutman, A.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier

Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures

Journal of Electronic Testing: Theory and Applications (JETTA)
2016 | Journal article
DOI: 10.1007/s10836-016-5588-y
EID:

2-s2.0-84964452131
Contributors: Aleksejev, I.; Devadze, S.; Jutman, A.; Shibin, K.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier

Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687

AUTOTESTCON (Proceedings)
2016 | Conference paper
DOI: 10.1109/AUTEST.2016.7589605
EID:

2-s2.0-84994376715
Contributors: Jutman, A.; Shibin, K.; Devadze, S.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier

At-Speed Testing of Inter-Die Connections of 3D-SICs in the Presence of Shore Logic

Proceedings of the Asian Test Symposium
2015 | Conference paper
DOI: 10.1109/ATS.2015.21
EID:

2-s2.0-84963538046
Contributors: Shibin, K.; Chickermane, V.; Keller, B.; Papameletis, C.; Marinissen, E.J.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier

Virtual reconfigurable scan-chains on FPGAs for optimized board test

2015 16th Latin-American Test Symposium, LATS 2015
2015 | Conference paper
DOI: 10.1109/LATW.2015.7102411
EID:

2-s2.0-84933557221
Contributors: Aleksejev, I.; Devadze, S.; Jutman, A.; Shibin, K.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier

Asynchronous fault detection in IEEE P1687 instrument network

Proceedings - IEEE 23rd North Atlantic Test Workshop, NATW 2014
2014 | Conference paper
DOI: 10.1109/NATW.2014.24
EID:

2-s2.0-84906708313
Contributors: Shibin, K.; Devadze, S.; Jutman, A.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier

Effective scalable IEEE 1687 instrumentation network for fault management

IEEE Design and Test
2013 | Journal article
DOI: 10.1109/MDAT.2013.2278535
EID:

2-s2.0-84900025438
Contributors: Jutman, A.; Shibin, K.; Devadze, S.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier

Open-source JTAG simulator bundle for labs

International Journal of Electronics and Telecommunications
2012 | Journal article
DOI: 10.2478/v10177-012-0032-4
EID:

2-s2.0-84876259533
Contributors: Shibin, K.; Devadze, S.; Rosin, V.; Jutman, A.; Ubar, R.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier

Trainer 1149: A boundary scan simulation bundle for labs

Proceedings of the 18th International Conference - Mixed Design of Integrated Circuits and Systems, MIXDES 2011
2011 | Conference paper
EID:

2-s2.0-80053326013
Contributors: Jutman, A.; Ubar, R.; Devadze, S.; Shibin, K.; Rosin, V.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier

Understanding boundary scan test with trainer 1149

2011 Proceedings of the 22nd EAEEIE Annual Conference, EAEEIE 2011
2011 | Conference paper
EID:

2-s2.0-84859051439
Contributors: Jutman, A.; Ubar, R.; Devadze, S.; Shibin, K.; Rosin, V.
Source: Self-asserted source
Konstantin Shibin via Scopus - Elsevier
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