Personal information
interfacial electrochemistry
China
Activities
Employment (1)
2001-03-01
to
2017
|
Prof.
(Department of Chemistry)
Employment
Source:
kang shi
Education and qualifications (3)
1996-11-01
to
2000-11-26
|
Ph.D
Education
Source:
kang shi
1989-09-01
to
1992-07-31
|
Master of Science
(Chemistry)
Education
Source:
kang shi
1983-09-01
to
1987-07-31
|
Bachelor of Science
(Chemistry)
Education
Source:
kang shi
Professional activities (2)
2003-01-01
to
present
Membership
Source:
kang shi
2000-03-05
to
present
(Chemistry)
Membership
Source:
kang shi
Works (36)
Journal of Power Sources
2024-12
|
Journal article
Contributors:
Ying Wang;
Mengfei Qiao;
Liqing Qiao;
Kang Shi
Source:
check_circle
Crossref
The Journal of Physical Chemistry C
2023-07-20
|
Journal article
Contributors:
Lianhuan Han;
Hantao Xu;
Kang Shi;
Jian-Zhang Zhou;
Fang-Zu Yang;
Dongping Zhan;
Zhong-Qun Tian;
Zhao-Wu Tian
Source:
check_circle
Crossref
Journal of Manufacturing Processes
2023-01-24
|
Journal article
Contributors:
Liqing Qiao;
Liwei Ou;
Kang Shi
Source:
kang shi
Electrochimica Acta
2022-12
|
Journal article
Contributors:
Ying Wang;
Mengfei Qiao;
Liqing Qiao;
Kang Shi
Source:
check_circle
Crossref
ECS Journal of Solid State Science and Technology
2022-05-01
|
Journal article
Contributors:
Sai Guo;
Mingming Zhang;
Liqing Qiao;
Huiqing Hu;
Kang Shi
Source:
check_circle
Crossref
grade
Preferred source
(of
2)‎
Science
2022-04-15
|
Journal article
Contributors:
Jianwei Zheng;
Lele Huang;
Cun-Hao Cui;
Zuo-Chang Chen;
Xu-Feng Liu;
Xinping Duan;
Xin-Yi Cao;
Tong-Zong Yang;
Hongping Zhu;
Kang Shi
et al.
Source:
check_circle
Crossref
grade
Preferred source
(of
2)‎
Journal of The Electrochemical Society
2020-12-01
|
Journal article
Contributors:
Huiqing Hu;
Sai Guo;
Yahui Wang;
Kang Shi
Source:
check_circle
Crossref
The International Journal of Advanced Manufacturing Technology
2019-12
|
Journal article
Source:
kang shi
grade
Preferred source
(of
2)‎
CIRP Annals- Manufacturing Technology
2019-08-08
|
Journal article
Source:
kang shi
Precision Engineering
2019-01
|
Journal article
Source:
kang shi
Precision Engineering
2019-01
|
Journal article
Source:
kang shi
grade
Preferred source
(of
12)‎
Journal of The Electrochemical Society
2017
|
Journal article
Source:
kang shi
Accounts of Chemical Research
2016
|
Journal article
EID:
2-s2.0-84995756444
Contributors:
Zhan, D.;
Han, L.;
Zhang, J.;
Shi, K.;
Zhou, J.-Z.;
Tian, Z.-W.;
Tian, Z.-Q.
Source:
kang shi
via
Scopus - Elsevier
Journal of Electroanalytical Chemistry
2016
|
Journal article
EID:
2-s2.0-85002607011
Contributors:
Gao, Y.-X.;
Wu, D.;
Yang, Y.-X.;
Wang, W.-J.;
Xie, S.-Y.;
Shiu, K.-K.;
Shi, K.
Source:
kang shi
via
Scopus - Elsevier
Chemical Communications
2016
|
Journal article
EID:
2-s2.0-84960861510
Contributors:
Liu, K.-G.;
Liu, X.-Y.;
Guan, Z.-J.;
Shi, K.;
Lin, Y.-M.;
Wang, Q.-M.
Source:
kang shi
via
Scopus - Elsevier
Precision Engineering
2015
|
Journal article
EID:
2-s2.0-84910017635
Contributors:
Shan, K.;
Zhou, P.;
Cai, J.;
Kang, R.;
Shi, K.;
Guo, D.
Source:
kang shi
via
Scopus - Elsevier
Chemical Communications
2014
|
Journal article
EID:
2-s2.0-84893560660
Contributors:
Jiang, Z.-G.;
Shi, K.;
Lin, Y.-M.;
Wang, Q.-M.
Source:
kang shi
via
Scopus - Elsevier
Electrochimica Acta
2014
|
Journal article
EID:
2-s2.0-84907931353
Contributors:
Wang, C.;
Zhang, H.-W.;
Zhang, J.-F.;
Wu, D.;
Tian, Z.-Q.;
Tian, Z.-W.;
Shi, K.
Source:
kang shi
via
Scopus - Elsevier
Chemical Communications
2013
|
Journal article
EID:
2-s2.0-84880852677
Contributors:
Fang, Q.;
Zhou, J.-Z.;
Zhan, D.;
Shi, K.;
Tian, Z.-W.;
Tian, Z.-Q.
Source:
kang shi
via
Scopus - Elsevier
Journal of Electroanalytical Chemistry
2013
|
Journal article
EID:
2-s2.0-84882273928
Contributors:
Zhou, P.;
Kang, R.;
Shi, K.;
Guo, D.;
Shan, K.;
Li, Z.
Source:
kang shi
via
Scopus - Elsevier
Chemistry - A European Journal
2012
|
Journal article
EID:
2-s2.0-84863297748
Contributors:
Chen, J.-H.;
Gao, Z.-Y.;
Weng, Q.-H.;
Jiang, W.-S.;
He, Q.;
Liang, H.;
Deng, L.-L.;
Xie, S.-L.;
Huang, H.-Y.;
Lu, X.
et al.
Source:
kang shi
via
Scopus - Elsevier
Catalysis Communications
2011
|
Journal article
EID:
2-s2.0-80053443474
Contributors:
Jia, J.;
Wang, R.;
Wang, H.;
Ji, S.;
Key, J.;
Linkov, V.;
Shi, K.;
Lei, Z.
Source:
kang shi
via
Scopus - Elsevier
NEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems
2011
|
Conference paper
EID:
2-s2.0-80053311392
Contributors:
Zhan, D.;
Han, L.;
Yang, D.;
Jiang, L.-M.;
Tang, J.;
Sun, J.-J.;
Shi, K.;
Zhou, J.;
Tian, Z.-Q.;
Tian, Z.-W.
Source:
kang shi
via
Scopus - Elsevier
Journal of Materials Chemistry
2011
|
Journal article
EID:
2-s2.0-80755142979
Contributors:
Ben, T.;
Shi, K.;
Cui, Y.;
Pei, C.;
Zuo, Y.;
Guo, H.;
Zhang, D.;
Xu, J.;
Deng, F.;
Tian, Z.
et al.
Source:
kang shi
via
Scopus - Elsevier
Angewandte Chemie - International Edition
2010
|
Journal article
EID:
2-s2.0-77749283479
Contributors:
Qiao, J.;
Shi, K.;
Wang, Q.-M.
Source:
kang shi
via
Scopus - Elsevier
Electroanalysis
2010
|
Journal article
EID:
2-s2.0-78650287252
Contributors:
Shi, K.;
Lei, Y.;
Wang, S.;
Shiu, K.-K.
Source:
kang shi
via
Scopus - Elsevier
Journal of Electroanalytical Chemistry
2008
|
Journal article
EID:
2-s2.0-40649090381
Contributors:
Huang, B.-Q.;
Wang, L.;
Shi, K.;
Xie, Z.-X.;
Zheng, L.-S.
Source:
kang shi
via
Scopus - Elsevier
Electrochimica Acta
2007
|
Journal article
EID:
2-s2.0-34247646530
Contributors:
Shi, K.;
Hu, K.;
Wang, S.;
Lau, C.-Y.;
Shiu, K.-K.
Source:
kang shi
via
Scopus - Elsevier
Electrochimica Acta
2006
|
Journal article
EID:
2-s2.0-33244491000
Contributors:
Shi, K.;
Shiu, K.-K.
Source:
kang shi
via
Scopus - Elsevier
Journal of Solid State Electrochemistry
2005
|
Journal article
EID:
2-s2.0-21144441048
Contributors:
Shi, K.;
Tang, J.;
Zhang, L.;
Zhou, Y.-L.;
Qu, D.-S.;
Sun, L.-N.;
Tian, Z.-Q.
Source:
kang shi
via
Scopus - Elsevier
Journal of Electroanalytical Chemistry
2005
|
Journal article
EID:
2-s2.0-21844436274
Contributors:
Jiang, L.M.;
Liu, Z.F.;
Tang, J.;
Zhang, L.;
Shi, K.;
Tian, Z.Q.;
Liu, P.K.;
Sun, L.N.;
Tian, Z.W.
Source:
kang shi
via
Scopus - Elsevier
Journal of Electroanalytical Chemistry
2004
|
Journal article
EID:
2-s2.0-9244226504
Contributors:
Shi, K.;
Shiu, K.-K.
Source:
kang shi
via
Scopus - Elsevier
Analytical Chemistry
2002
|
Journal article
EID:
2-s2.0-0037083686
Contributors:
Shi, K.;
Shiu, K.-K.
Source:
kang shi
via
Scopus - Elsevier
Electroanalysis
2001
|
Journal article
EID:
2-s2.0-0035179588
Contributors:
Shi, K.;
Shiu, K.-K.
Source:
kang shi
via
Scopus - Elsevier
Electroanalysis
2000
|
Journal article
EID:
2-s2.0-0033653410
Contributors:
Shiu, K.-K.;
Shi, K.
Source:
kang shi
via
Scopus - Elsevier
Electroanalysis
1998
|
Journal article
EID:
2-s2.0-0000838832
Contributors:
Shiu, K.-K.;
Shi, K.
Source:
kang shi
via
Scopus - Elsevier