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Inline Mapping of Amorphous Silicon Layer Thickness of Heterojunction Precursors Using Multispectral Imaging

SiliconPV Conference Proceedings
2025-01-03 | Journal article | Author
Part of DOI: 10.52825/siliconpv.v2i
URI:

https://www.tib-op.org/ojs/index.php/siliconpv/article/view/1324

Part of ISSN: 2940-2123
Contributors: Saravana Kumar; Christian Diestel; SAED AL-HAJJAWI; Jurriaan Schmitz; Marc Hemsendorf; Jonas Haunschild; Stefan J. Rupitsch; Stefan Rein
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Inline Mapping of Amorphous Silicon Layer Thickness of Heterojunction Precursors Using Multispectral Imaging

SiliconPV Conference Proceedings
2025-01-03 | Journal article
DOI: 10.52825/siliconpv.v2i.1324
Contributors: Saravana Kumar; Christian Diestel; Saed Al-Hajjawi; Jurriaan Schmitz; Marc Hemsendorf; Jonas Haunschild; Stefan J. Rupitsch; Stefan Rein
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Crossref
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Inline Characterization of Ultrathin Amorphous Silicon Stacks in Silicon Heterojunction Solar Cell Precursors With Differential Reflectance Spectroscopy

IEEE Journal of Photovoltaics
2023 | Journal article
DOI: 10.1109/JPHOTOV.2023.3301132
Contributors: Saravana Kumar; Henri Vahlman; Saed Al-Hajjawi; Christian Diestel; Jonas Haunschild; Stefan J. Rupitsch; Stefan Rein
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Crossref

Monitoring of Porous Silicon Layers Used for Epitaxial Wafer Production With Inline Reflectance Spectroscopy

IEEE Journal of Photovoltaics
2022-07 | Journal article
DOI: 10.1109/JPHOTOV.2022.3176429
Contributors: Henri Johannes Vahlman; Saed Al-Hajjawi; Jonas Haunschild; Nico Wohrle; Maxi Richter; Lukas Jablonka; Hans Schremmer; Stefan Rein
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