Personal information
No personal information available
Activities
Employment (1)
2013-10-01
to
present
|
Associate Professor
(School of Electrical and Electronic Engineering)
Employment
Source:
Mingxing Du
Education and qualifications (1)
2008-09-01
to
2012-06-01
|
PhD.
(school of electrical and information engineering)
Education
Source:
Mingxing Du
Works (30)
IEEE Transactions on Device and Materials Reliability
2024
|
Journal article
Contributors:
Xiyuan Huang;
Mingxing Du;
Hongze Fu;
Sai Gao
Source:
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Crossref
IEEE Transactions on Components, Packaging and Manufacturing Technology
2024
|
Journal article
Contributors:
Qing Yan;
Aoyang Li;
Gengji Wang;
Jinliang Yin;
Chao Dong;
Mingxing Du
Source:
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Crossref
Microelectronics Journal
2024-12
|
Journal article
Contributors:
Chao Dong;
Sai Gao;
Yulin Liu;
Gengji Wang;
Jinliang Yin;
Mingxing Du
Source:
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Crossref
IEEE Transactions on Power Electronics
2024-10
|
Journal article
Contributors:
Jianxiong Yang;
Yanbo Che;
Li Ran;
Borong Hu;
Mingxing Du
Source:
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Crossref
IEEE Transactions on Electron Devices
2024-10
|
Journal article
Contributors:
Mingxing Du;
Fan Liu;
Jinliang Yin;
Chao Dong;
Ziwei Ouyang
Source:
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Crossref
IEEE Transactions on Components, Packaging and Manufacturing Technology
2024-01
|
Journal article
Contributors:
Sai Gao;
Zhihui Ren;
Mingxing Du;
Chengpeng Chu;
Jinliang Yin;
Chao Dong
Source:
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Crossref
2023-09-26
|
Conference paper
Contributors:
Xin Wang;
Mingxing Du;
Jinglei Zhang;
Xiaoping He
Source:
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Crossref
Microelectronics Journal
2023-04
|
Journal article
Contributors:
Yulin Liu;
Mingxing Du;
Jinliang Yin;
Chao Dong
Source:
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Crossref
Journal of Power Electronics
2023-04
|
Journal article
Contributors:
Fan Liu;
Mingxing Du;
Jinliang Yin;
Chao Dong;
Ziwei Ouyang
Source:
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Crossref
Microelectronics Journal
2023-01
|
Journal article
Contributors:
Chao Dong;
Jingwei Hu;
Mingxing Du
Source:
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Crossref
IEEE Transactions on Device and Materials Reliability
2022-03
|
Journal article
Contributors:
Jianxiong Yang;
Yanbo Che;
Li Ran;
Mingxing Du;
Huaping Jiang;
Muzixiang Xiao
Source:
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Crossref
IEEE Transactions on Device and Materials Reliability
2021-12
|
Journal article
Contributors:
Chengpeng Chu;
Chao Dong;
Jing Hu;
Mingxing Du;
Ziwei Ouyang
Source:
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Crossref
Microelectronics Journal
2021-10
|
Journal article
Contributors:
Mingxing Du;
Jinlei Xin;
Hongbin Wang;
Ziwei Ouyang;
Kexin Wei
Source:
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Crossref
IEEE Transactions on Electromagnetic Compatibility
2021-08
|
Journal article
Contributors:
Chengpeng Chu;
Chao Dong;
Mingxing Du;
Xuesong Zhou;
Ziwei Ouyang
Source:
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Crossref
IEEE Journal of Emerging and Selected Topics in Power Electronics
2021-08
|
Journal article
Contributors:
Wenbai Wang;
Mingxing Du;
Kexin Wei
Source:
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Crossref
IEEE Transactions on Electron Devices
2021-04
|
Journal article
Contributors:
Jinlei Xin;
Mingxing Du;
Ziwei Ouyang;
Kexin Wei
Source:
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Crossref
IEEE Transactions on Device and Materials Reliability
2021-03
|
Journal article
Contributors:
Mingxing Du;
Jinlei Xin;
Hongbin Wang;
Ziwei Ouyang
Source:
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Crossref
Energies
2021-01-29
|
Journal article
Contributors:
Jiateng Song;
Hongbin Wang;
Mingxing Du;
Lei Peng;
Shuai Zhang;
Guizhi Xu
Source:
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Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Components, Packaging and Manufacturing Technology
2020-08
|
Journal article
Contributors:
Mingxing Du;
Qiuya Guo;
Hongbin Wang;
Ziwei Ouyang;
Kexin Wei
Source:
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Crossref
IEEE Transactions on Electron Devices
2020-05
|
Journal article
Contributors:
Mingxing Du;
Jinlei Xin;
Hongbin Wang;
Ziwei Ouyang;
Kexin Wei
Source:
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Crossref
IEEE Transactions on Electron Devices
2020-01
|
Journal article
Contributors:
Lei Jing;
Mingxing Du;
Kexin Wei;
William Gerard Hurley
Source:
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Crossref
IEEE Transactions on Electron Devices
2019-11
|
Journal article
Contributors:
Mingxing Du;
Qingyi Kong;
Ziwei Ouyang;
Kexin Wei;
William G. Hurley
Source:
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Crossref
Energies
2019-10-23
|
Journal article
Contributors:
Mingxing Du;
Yu Tang;
Min Li;
Jiayong Zou;
Yigang Ma;
Jinyu Sun;
Lei Liu;
Qingguo Zeng
Source:
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Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Electron Devices
2019-09
|
Journal article
Contributors:
Lei Jing;
Mingxing Du;
Kexin Wei;
William Gerard Hurley
Source:
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Crossref
IEEE Transactions on Device and Materials Reliability
2019-09
|
Journal article
Contributors:
Mingxing Du;
Yu Tang;
Mengchao Gao;
Ziwei Ouyang;
Kexin Wei;
William Gerard Hurley
Source:
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Crossref
IEEE Transactions on Device and Materials Reliability
2019-06
|
Journal article
Contributors:
Jiangyong Zhang;
Mingxing Du;
Lei Jing;
Kexin Wei;
William Gerard Hurley
Source:
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Crossref
Energies
2019-05
|
Journal article
|
Author
Contributors:
Qingyi Kong;
Mingxing Du;
Ziwei Ouyang;
Kexin Wei;
William Gerard Hurley
Source:
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Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
Energies
2019-03
|
Journal article
|
Author
Contributors:
Qingyi Kong;
Mingxing Du;
Ziwei Ouyang;
Kexin Wei;
William Gerard Hurley
Source:
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Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
Electronics
2019-03
|
Journal article
|
Author
Contributors:
Mingxing Du;
Ye Tian;
Wenbai Wang;
Ziwei Ouyang;
Kexin Wei
Source:
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Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
2018-01-23
|
Other
Contributors:
Ning An;
Mingxing Du;
Zhen Hu;
Kexin Wei
Source:
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Crossref