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Employment (1)

Hebei Semiconductor Research Institute: Shijiazhuang, Hebei, CN

2012-04-17 to present | Researcher (Metrology Centre)
Employment
Source: Self-asserted source
Chen Liu

Education and qualifications (2)

National Physical Laboratory: Teddington, Middlesex, GB

2017-04-16 to 2017-10-15 | Visiting researcher
Education
Source: Self-asserted source
Chen Liu

Xidian University: Xian, Shaanxi, CN

2009-07-01 to 2012-04-13 | Master of Engineering (School of Mechanical and Electrical Engineering)
Education
Source: Self-asserted source
Chen Liu

Works (9)

An Advanced Calibration Method for Probe Leakage Correction in On-Wafer Test Systems

IEEE Transactions on Microwave Theory and Techniques
2023-02 | Journal article
DOI: 10.1109/TMTT.2022.3200050
Contributors: Yibang Wang; Xingchang Fu; Aihua Wu; Ye Huo; Chen Liu; Peng Luan; Lihua Lei; Faguo Liang; Chong Li
Source: check_circle
Crossref

Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy

IEEE Transactions on Instrumentation and Measurement
2020-11 | Journal article
DOI: 10.1109/TIM.2020.2995970
Contributors: Peng Luan; Yibang Wang; Wei Zhao; Chen Liu; Faguo Liang; Aihua Wu; Jing Du
Source: check_circle
Crossref

Calibration on the Fly—A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky Systems

IEEE Transactions on Microwave Theory and Techniques
2020-08 | Journal article
DOI: 10.1109/TMTT.2020.2988461
Contributors: Aihua Wu; Chen Liu; Faguo Liang; Xuefeng Zou; Yibang Wang; Peng Luan; Chong Li; Nick Ridler
Source: check_circle
Crossref

A “Calibration on the Fly” Method for Millimeter-wave On-wafer Measurement

2020 13th UK-Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT)
2020-08-29 | Conference paper
DOI: 10.1109/ucmmt49983.2020.9296015
ISBN: 9781728190648
Source: Self-asserted source
Chen Liu

Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems

IEEE Transactions on Instrumentation and Measurement
2020-06 | Journal article
DOI: 10.1109/TIM.2019.2929671
Contributors: Aihua Wu; Xingchang Fu; Chen Liu; Chong Li; Yibang Wang; Faguo Liang; Peng Luan
Source: check_circle
Crossref

Development of gallium-arsenide-based GCPW calibration kits for on-wafer measurements in the W-band

International Journal of Microwave and Wireless Technologies
2020-06-12 | Journal article
DOI: 10.1017/S1759078719001521
Contributors: Yibang Wang; Xingchang Fu; Aihua Wu; Chen Liu; Peng Luan; Faguo Liang; Wei Zhao; Xiaobang Shang
Source: check_circle
Crossref

A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model

IEEE Transactions on Microwave Theory and Techniques
2018-08 | Journal article
DOI: 10.1109/TMTT.2018.2832052
Contributors: Chen Liu; Aihua Wu; Chong Li; Nick Ridler
Source: check_circle
Crossref

Development of a verification technique for on-wafer noise figure measurement systems

2017 90th ARFTG Microwave Measurement Symposium (ARFTG)
2017-11 | Conference paper
DOI: 10.1109/arftg.2017.8255878
ISBN: 9781538643563
Source: Self-asserted source
Chen Liu

Evaluation on uncertainty of noise parameter against commercial measurement

2013 IEEE 11th International Conference on Electronic Measurement & Instruments
2013-08 | Conference paper
DOI: 10.1109/icemi.2013.6743024
ISBN: 9781479907595
ISBN: 9781479907571
ISBN: 9781479907588
Source: Self-asserted source
Chen Liu
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