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Employment (1)

Delft University of Technology: Delft, Zuid-Holland, NL

2020-11-01 to 2024-11-01 | PhD student (Imaging Physics)
Employment
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Arent Kievits

Works (4)

Corrigendum to: FAST-EM array tomography: a workflow for multibeam volume electron microscopy

Methods in Microscopy
2025-01-03 | Journal article
DOI: 10.1515/mim-2024-2001
Contributors: Arent J. Kievits; B. H. Peter Duinkerken; Ryan Lane; Cecilia de Heus; Daan van Beijeren Bergen en Henegouwen; Tibbe Höppener; Anouk H. G. Wolters; Nalan Liv; Ben N. G. Giepmans; Jacob P. Hoogenboom
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FAST-EM array tomography: a workflow for multibeam volume electron microscopy

Methods in Microscopy
2024-08-02 | Journal article
DOI: 10.1515/mim-2024-0005
Contributors: Arent J. Kievits; B. H. Peter Duinkerken; Ryan Lane; Cecilia de Heus; Daan van Beijeren Bergen en Henegouwen; Tibbe Höppener; Anouk H. G. Wolters; Nalan Liv; Ben N. G. Giepmans; Jacob P. Hoogenboom
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Crossref

Optical STEM detection for scanning electron microscopy

Ultramicroscopy
2024-02 | Journal article
DOI: 10.1016/j.ultramic.2023.113877
Contributors: Arent J. Kievits; B.H. Peter Duinkerken; Job Fermie; Ryan Lane; Ben N.G. Giepmans; Jacob P. Hoogenboom
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Crossref

How innovations in methodology offer new prospects for volume electron microscopy

Journal of Microscopy
2022-09 | Journal article
DOI: 10.1111/jmi.13134
Contributors: Arent J. Kievits; Ryan Lane; Elizabeth C. Carroll; Jacob P. Hoogenboom
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