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Scopus Author ID: 16646415100

Biography

Dr. Filip Mika, is a leader of the Laboratories for Electron Microscopy in the Institute of Scientific Instruments of the Czech Academy of Sciences. He is an expert in the field of Monte Carlo simulation of the interaction of the beams with matter and signal detection. His skills include secondary electron spectroscopy, very-low-energy and non-charging electron microscopy methods. Filip focuses on imaging of insulators (organic crystals pigments), nano-composites, and dopants in semiconductors. He is an author of more then 40 original papers published in international scientific journals and in proceedings of international conferences with more then 150 citations (H-index 7 @ WoS).

Activities

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Employment (1)

Czech Academy of Sciences, Institute of Scientific Instruments: Brno, CZ

Team leader (Microscopy and Microanalysis)
Employment
Source: Self-asserted source
Filip Mika

Education and qualifications (2)

Brno University of Technology: Brno, CZ

2002-09-01 to 2007-10-01 | Ph.D. (elektro)
Education
Source: Self-asserted source
Filip Mika

Brno University of Technology: Brno, CZ

1997 to 2002 | Ing. (Microelectronics)
Education
Source: Self-asserted source
Filip Mika

Works (27)

SERS-Tags: Selective Immobilization and Detection of Bacteria by Strain-Specific Antibodies and Surface-Enhanced Raman Scattering

Biosensors
2023-01-24 | Journal article
DOI: 10.3390/bios13020182
Contributors: Markéta Benešová; Silvie Bernatová; Filip Mika; Zuzana Pokorná; Jan Ježek; Martin Šiler; Ota Samek; Filip Růžička; Katarina Rebrošová; Pavel Zemánek et al.
Source: check_circle
Crossref
grade
Preferred source (of 2)‎

Beam shaping and probe characterization in the scanning electron microscope

Ultramicroscopy
2021 | Journal article
DOI: 10.1016/j.ultramic.2021.113268
EID:

2-s2.0-85104406836

Part of ISSN: 18792723 03043991
Contributors: Řiháček, T.; Horák, M.; Schachinger, T.; Mika, F.; Matějka, M.; Krátký, S.; Fořt, T.; Radlička, T.; Johnson, C.W.; Novák, L. et al.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Nanostructures for Achieving Selective Properties of a Thermophotovoltaic Emitter

Nanomaterials
2021-09-19 | Journal article
DOI: 10.3390/nano11092443
Contributors: Lucie Šimonová; Milan Matějka; Alexandr Knápek; Tomáš Králík; Zuzana Pokorná; Filip Mika; Tomáš Fořt; Ondřej Man; Pavel Škarvada; Alexandr Otáhal et al.
Source: check_circle
Crossref

Acquisition of the dopant contrast in semiconductors with slow electrons

Journal of Electron Spectroscopy and Related Phenomena
2020 | Journal article
DOI: 10.1016/j.elspec.2019.03.004
EID:

2-s2.0-85063225896

Part of ISSN: 03682048
Contributors: Frank, L.; Hovorka, M.; El-Gomati, M.M.; Müllerová, I.; Mika, F.; Mikmeková, E.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

In-lens band-pass filter for secondary electrons in ultrahigh resolution SEM

Materials
2019 | Journal article
DOI: 10.3390/ma12142307
EID:

2-s2.0-85070449469

Part of ISSN: 19961944
Contributors: Konvalina, I.; Mika, F.; Krátký, S.; Mikmeková, E.M.; Müllerová, I.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Making Sense of Complex Carbon and Metal/Carbon Systems by Secondary Electron Hyperspectral Imaging

Advanced Science
2019 | Journal article
DOI: 10.1002/advs.201900719
EID:

2-s2.0-85070510176

Part of ISSN: 21983844
Contributors: Abrams, K.J.; Dapor, M.; Stehling, N.; Azzolini, M.; Kyle, S.J.; Schäfer, J.; Quade, A.; Mika, F.; Kratky, S.; Pokorna, Z. et al.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Quantitative comparison of simulated and measured signals in the STEM mode of a SEM

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
2018 | Journal article
DOI: 10.1016/j.nimb.2017.10.034
EID:

2-s2.0-85033458029

Part of ISSN: 0168583X
Contributors: Walker, C.G.H.; Konvalina, I.; Mika, F.; Frank, L.; Müllerová, I.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

The effect of amorphous and crystal sodium warfarin and its content uniformity on bioequivalence of tablets

European Journal of Pharmaceutical Sciences
2018 | Journal article
DOI: 10.1016/j.ejps.2018.09.022
EID:

2-s2.0-85054244270

Part of ISSN: 18790720 09280987
Contributors: Franc, A.; Muselík, J.; Zeman, J.; Lukášová, I.; Kurhajec, S.; Bartoníčková, E.; Galvánková, L.; Mika, F.; Dominik, M.; Vetchý, D.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

“Secondary electron spectra of semi-crystalline polymers – A novel polymer characterisation tool?”

Journal of Electron Spectroscopy and Related Phenomena
2018 | Journal article
DOI: 10.1016/j.elspec.2017.08.001
EID:

2-s2.0-85028364158

Part of ISSN: 03682048
Contributors: Dapor, M.; Masters, R.C.; Ross, I.; Lidzey, D.G.; Pearson, A.; Abril, I.; Garcia-Molina, R.; Sharp, J.; Unčovský, M.; Vystavel, T. et al.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Factor analysis in optimization of formulation of high content uniformity tablets containing low dose active substance

European Journal of Pharmaceutical Sciences
2017 | Journal article
DOI: 10.1016/j.ejps.2017.09.017
EID:

2-s2.0-85029430221

Part of ISSN: 18790720 09280987
Contributors: Lukášová, I.; Muselík, J.; Franc, A.; Goněc, R.; Mika, F.; Vetchý, D.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Liquid assisted plasma enhanced chemical vapour deposition with a non-thermal plasma jet at atmospheric pressure

Thin Solid Films
2017 | Journal article
DOI: 10.1016/j.tsf.2016.09.022
EID:

2-s2.0-84994528758

Part of ISSN: 00406090
Contributors: Schäfer, J.; Fricke, K.; Mika, F.; Pokorná, Z.; Zajíčková, L.; Foest, R.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Effect of Hydrogen Plasma on Model Corrosion Layers of Bronze

Journal of Physics: Conference Series
2016 | Conference paper
DOI: 10.1088/1742-6596/715/1/012006
EID:

2-s2.0-84977631729

Part of ISSN: 17426596 17426588
Contributors: Fojtiková, P.; Sázavská, V.; Mika, F.; Krčma, F.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Thin (111) oriented CoFe <inf>2</inf> O <inf>4</inf> and Co <inf>3</inf> O <inf>4</inf> films prepared by decomposition of layered cobaltates

Applied Surface Science
2016 | Journal article
DOI: 10.1016/j.apsusc.2016.03.130
EID:

2-s2.0-84962425635

Part of ISSN: 01694332
Contributors: Buršík, J.; Soroka, M.; Uhrecký, R.; Kužel, R.; Mika, F.; Huber, Š.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Growth and characterization of thin oriented Co<inf>3</inf>O<inf>4</inf> (111) films obtained by decomposition of layered cobaltates Na<inf>x</inf>CoO<inf>2</inf>

Journal of Solid State Chemistry
2015 | Journal article
DOI: 10.1016/j.jssc.2015.03.014
EID:

2-s2.0-84926167667

Part of ISSN: 1095726X 00224596
Contributors: Buršík, J.; Soroka, M.; Kužel, R.; Mika, F.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Imaging with STEM Detector, Experiments vs. Simulation

Microscopy and Microanalysis
2015 | Journal article
DOI: 10.1017/S143192761501315X
EID:

2-s2.0-84994242431

Part of ISSN: 14358115 14319276
Contributors: Mika, F.; Walker, C.G.H.; Konvalina, I.; Müllerová, I.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Noise of low-energy electron beam

2015 International Conference on Noise and Fluctuations, ICNF 2015
2015 | Conference paper
DOI: 10.1109/ICNF.2015.7288583
EID:

2-s2.0-84961844742
Contributors: Sikula, J.; Grmela, L.; Bartlova, M.; Kuparowitz, T.; Knapek, A.; Mika, F.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Optimizing the Recognition of Surface Crystallography

Microscopy and Microanalysis
2015 | Journal article
DOI: 10.1017/S1431927615013252
EID:

2-s2.0-84993970616

Part of ISSN: 14358115 14319276
Contributors: Frank, L.; Mika, F.; Müllerová, I.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Three-dimensional optical trapping of a plasmonic nanoparticle using low numerical aperture optical tweezers

Scientific Reports
2015 | Journal article
DOI: 10.1038/srep08106
EID:

2-s2.0-84922985325

Part of ISSN: 20452322
Contributors: Brzobohatý, O.; Šiler, M.; Trojek, J.; Chvátal, L.; Karásek, V.; Paták, A.; Pokorná, Z.; Mika, F.; Zemánek, P.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

SEM characterization of carbon nanotubes based active layers of chemical sensors

Proceedings of the 2014 37th International Spring Seminar on Electronics Technology, ISSE 2014
2014 | Conference paper
DOI: 10.1109/ISSE.2014.6887625
EID:

2-s2.0-84908611364
Contributors: Knapek, A.; Mika, F.; Prasek, J.; Majzlikova, P.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Role of reaction atmosphere in preparation of potassium tantalate through sol-gel method

Journal of Sol-Gel Science and Technology
2013 | Journal article
DOI: 10.1007/s10971-013-3158-7
EID:

2-s2.0-84888290243

Part of ISSN: 09280707
Contributors: Buršík, J.; Vaněk, P.; Mika, F.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Very low energy scanning electron microscopy in nanotechnology

International Journal of Nanotechnology
2012 | Journal article
DOI: 10.1504/IJNT.2012.046749
EID:

2-s2.0-84860764190

Part of ISSN: 14757435
Contributors: Müllerová, I.; Hovorka, M.; Mika, F.; Mikmeková, E.; Mikmeková, S.; Pokorná, Z.; Frank, L.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Fine structure of wing scales in chrysozephyrus ataxus butterflies

Materials Transactions
2011 | Journal article
DOI: 10.2320/matertrans.MB201001
EID:

2-s2.0-79955774769

Part of ISSN: 13459678
Contributors: Matějková-Plšková, J.; Mika, F.; Shiojiri, S.; Shiojiri, M.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

2010 | Other
SOURCE-WORK-ID: BASE:c3710975c88e62c65cfdf910b13e15a4f8771d53405d35f448b6aec87861d80b
Contributors: Mika, F. (Filip)
Source: Self-asserted source
Filip Mika via BASE - Bielefeld Academic Search Engine

Profiling N-type dopants in silicon

Materials Transactions
2010 | Journal article
DOI: 10.2320/matertrans.MC200910
EID:

2-s2.0-77949763595

Part of ISSN: 13459678
Contributors: Hovorka, M.; Mika, F.; Mikulík, P.; Frank, L.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Two-dimensional dopant profiling with low-energy SEM

Journal of Microscopy
2008 | Journal article
DOI: 10.1111/j.1365-2818.2008.01957.x
EID:

2-s2.0-41749102403

Part of ISSN: 00222720 13652818
Contributors: Mika, F.; Frank, L.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Dopant contrast in semiconductors as interpretation challenge at imaging by electrons

Materials Transactions
2007 | Journal article
DOI: 10.2320/matertrans.48.936
EID:

2-s2.0-34250818610

Part of ISSN: 13459678
Contributors: Frank, L.; Mika, F.; Hovorka, M.; Valdaitsev, D.; Schönhense, G.; Müllerová, I.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier

Computer controlled low energy SEM

Microscopy and Microanalysis
2003 | Journal article
DOI: 10.1017/S1431927603031179
EID:

2-s2.0-0142092201

Part of ISSN: 14319276
Contributors: Mika, F.; Ryšávka, J.; Lopour, F.; Zadražil, M.; Müllerová, I.; Frank, L.
Source: Self-asserted source
Filip Mika via Scopus - Elsevier
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