Personal information

optical design;signal modeling ;optical signal processing ;machine learning;instrument
China

Activities

Employment (2)

Shanghai Institute of Optics and Fine Mechanics: Shanghai, CN

2023-11 to present | Associate professor
Employment
Source: Self-asserted source
Cheng Chen

Shanghai Jiaotong University Press: Shanghai, Shanghai, CN

2020-11-11 to 2022-11-10 | Postdoc position (Department of Instrument Science and Engineering, School of Electronic Information and Electrical Engineering)
Employment
Source: Self-asserted source
Cheng Chen

Professional activities (2)

Huazhong University of Science and Technology: Wuhan, Hubei, CN

2015-09-01 to 2020-10-08 | research assistant, Ph.D candidate (School of Mechanical Science & Engineering )
Invited position
Source: Self-asserted source
Cheng Chen

Huazhong University of Science and Technology: Wuhan, Hubei, CN

2011-09-01 to 2015-06-30 | undergraduate (School of Mechanical Science & Engineering)
Invited position
Source: Self-asserted source
Cheng Chen

Works (19)

Sparse domain robust denoising method in optically-sectioned structured illumination microscopy for complex surface measurement

Optics and Lasers in Engineering
2024-09 | Journal article
Contributors: Changchun Chai; Cheng Chen; Tong Qu; Xiaojun Liu
Source: check_circle
Crossref

Honeycomb effect elimination in differential phase fiber-bundle-based endoscopy

Optics Express
2024-06-03 | Journal article
Contributors: Jingyi Wang; Cheng Chen; Wu You; Yuheng Jiao; Xiaojun Liu; Xiangqian Jiang; Wenlong Lu
Source: check_circle
Crossref

Random-access multi-focus manipulation through superpixel-encoding wavefront engineering

Applied Physics Express
2022-11-01 | Journal article
Contributors: Gaoyu Zou; Rongjun Shao; Linxian Liu; Qiaozhi He; Chunxu Ding; Cheng Chen; Jiamiao Yang; Yuan Qu
Source: check_circle
Crossref

Asymmetry robust centroid localization in confocal microscopy

Optics Letters
2022-04-15 | Journal article
Contributors: Cheng Chen; Changchun Chai; Xiaojun Liu; Xiangqian Jiang; Wenlong Lu
Source: check_circle
Crossref

Crosstalk decoupling measurement method to determine the six degrees of freedom of motion error of linear stages

Applied Optics
2022-02-20 | Journal article
Contributors: Kuan Diao; Cheng Chen; Richard Leach; Xiaojun Liu; Wenlong Lu; Wenjun Yang
Source: check_circle
Crossref

High-contrast light focusing through scattering media with multi-pixel encoding

Applied Physics Express
2021-09-01 | Journal article
Contributors: Linxian Liu; Kui Ma; Yuan Qu; Qiaozhi He; Rongjun Shao; Cheng Chen; Jiamiao Yang
Source: check_circle
Crossref

Locally adaptive thresholding centroid localization in confocal microscopy

Optics Letters
2021-04-01 | Journal article
Contributors: Cheng Chen; Richard Leach; Jian Wang; Xiaojun Liu; Xiangqian Jiang; Wenlong Lu
Source: check_circle
Crossref

Two-dimensional spectral signal model for chromatic confocal microscopy

Optics Express
2021-03-01 | Journal article
Contributors: Cheng Chen; Richard Leach; Jian Wang; Xiaojun Liu; Xiangqian Jiang; Wenlong Lu
Source: check_circle
Crossref

Deep learning based one-shot optically-sectioned structured illumination microscopy for surface measurement

Optics Express
2021-02-01 | Journal article
Contributors: Changchun Chai; Cheng Chen; Xiaojun Liu; ZiLi Lei
Source: check_circle
Crossref

Dual-Probe Atomic Force Microscopy based on tuning fork probes for critical dimension metrology

Ultramicroscopy
2020-12 | Journal article
Part of ISSN: 0304-3991
Source: Self-asserted source
Cheng Chen

Rapid characterization of nano-scale structures in large-scale ultra-precision surfaces

Optics and Lasers in Engineering
2020-11 | Journal article
Part of ISSN: 0143-8166
Source: Self-asserted source
Cheng Chen

Unambiguous measurement range and error tolerance in dual-wavelength interferometry

Applied Optics
2020-10-10 | Journal article
Part of ISSN: 1559-128X
Part of ISSN: 2155-3165
Source: Self-asserted source
Cheng Chen

Traceable atomic force microscope based on monochromatic light interference

Precision Engineering
2020-01 | Journal article
Part of ISSN: 0141-6359
Source: Self-asserted source
Cheng Chen

A rapid measurement method for structured surface in white light interferometry

Journal of Microscopy
2019-12 | Journal article
Part of ISSN: 0022-2720
Part of ISSN: 1365-2818
Source: Self-asserted source
Cheng Chen

Fast and accurate mean-shift vector based wavelength extraction for chromatic confocal microscopy

Measurement Science and Technology
2019-11-01 | Journal article
Part of ISSN: 0957-0233
Part of ISSN: 1361-6501
Source: Self-asserted source
Cheng Chen
grade
Preferred source (of 2)‎

Influence of optical aberrations on the peak extraction in confocal microscopy

Optics Communications
2019-10 | Journal article
Part of ISSN: 0030-4018
Source: Self-asserted source
Cheng Chen

Characterization of the displacement response in chromatic confocal microscopy with a hybrid radial basis function network

Optics Express
2019-08-05 | Journal article
Part of ISSN: 1094-4087
Source: Self-asserted source
Cheng Chen

Corrected parabolic fitting for height extraction in confocal microscopy

Optics Express
2019-02-04 | Journal article
Part of ISSN: 1094-4087
Source: Self-asserted source
Cheng Chen

Influence of sample surface height for evaluation of peak extraction algorithms in confocal microscopy

Applied Optics
2018-08-01 | Journal article
Part of ISSN: 1559-128X
Part of ISSN: 2155-3165
Source: Self-asserted source
Cheng Chen