Personal information

Countries

Germany

Activities

Collapse all

Employment (1)

RWTH Aachen University: Aachen, DE

2019-10-01 to 2025-03-31 | PhD Student (Institut für Werkstoffe der Elektrotechnik II)
Employment
Source: Self-asserted source
Nils Kopperberg

Education and qualifications (1)

RWTH Aachen University: Aachen, Nordrhein-Westfalen, DE

2013-10 to 2019-09 | M. Sc. (Physics)
Education
Source: Self-asserted source
Nils Kopperberg

Works (9)

Effect of Programming Schemes on Short-Term Instability in 1T1R Configuration

IEEE Access
2025 | Journal article
DOI: 10.1109/ACCESS.2025.3547818
Contributors: Xiaohua Liu; Yang Chen; Nils Kopperberg; Oliver Solfronk; Susanne Hoffmann-Eifert; Stephan Menzel; Rainer Waser; Stefan Wiefels
Source: check_circle
Crossref

Reliability effects of lateral filament confinement by nano-scaling the oxide in memristive devices

Nanoscale Horizons
2024 | Journal article
DOI: 10.1039/D3NH00520H
Contributors: Pascal Stasner; Nils Kopperberg; Kristoffer Schnieders; Tyler Hennen; Stefan Wiefels; Stephan Menzel; Rainer Waser; Dirk J. Wouters
Source: check_circle
Crossref

Reliability Aspects of 28 nm BEOL‐Integrated Resistive Switching Random Access Memory

physica status solidi (a)
2024-11 | Journal article
DOI: 10.1002/pssa.202300401
Contributors: Stefan Wiefels; Nils Kopperberg; Karl Hofmann; Jan Otterstedt; Dirk Wouters; Rainer Waser; Stephan Menzel
Source: check_circle
Crossref

Accurate evaluation method for HRS retention of VCM ReRAM

APL Materials
2024-03-01 | Journal article
DOI: 10.1063/5.0188573
Contributors: N. Kopperberg; D. J. Wouters; R. Waser; S. Menzel; S. Wiefels
Source: check_circle
Crossref

Influence of moisture on the ferroelectric properties of sputtered hafnium oxide thin films

Journal of Applied Physics
2023-11-14 | Journal article
DOI: 10.1063/5.0171345
Contributors: Fenja Berg; Nils Kopperberg; Jan Lübben; Ilia Valov; Xiaochao Wu; Ulrich Simon; Ulrich Böttger
Source: check_circle
Crossref

Endurance of 2 Mbit Based BEOL Integrated ReRAM

IEEE Access
2022 | Journal article
DOI: 10.1109/ACCESS.2022.3223657
Contributors: Nils Kopperberg; Stefan Wiefels; Karl Hofmann; Jan Otterstedt; Dirk J. Wouters; Rainer Waser; Stephan Menzel
Source: check_circle
Crossref

NEUROTEC I: Neuro-inspired Artificial Intelligence Technologies for the Electronics of the Future

2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
2022-03-14 | Conference paper
DOI: 10.23919/date54114.2022.9774755
Contributors: Melvin Galicia; Stephan Menzel; Farhad Merchant; Maximilian Muller; Hsin-Yu Chen; Qing-Tai Zhao; Felix Cuppers; Abdur R. Jalil; Qi Shu; Peter Schuffelgen et al.
Source: Self-asserted source
Nils Kopperberg

A Consistent Model for Short-Term Instability and Long-Term Retention in Filamentary Oxide-Based Memristive Devices

ACS Applied Materials & Interfaces
2021-12-08 | Journal article
DOI: 10.1021/acsami.1c14667
Contributors: Nils Kopperberg; Stefan Wiefels; Sergej Liberda; Rainer Waser; Stephan Menzel
Source: check_circle
Crossref

HRS Instability in Oxide-Based Bipolar Resistive Switching Cells

IEEE Transactions on Electron Devices
2020-10 | Journal article | Author
DOI: 10.1109/ted.2020.3018096
Part of ISSN: 0018-9383
Part of ISSN: 1557-9646
Contributors: Stefan Wiefels; Christopher Bengel; Nils Kopperberg; Kaihua Zhang; Rainer Waser; Stephan Menzel
Source: Self-asserted source
Nils Kopperberg
grade
Preferred source (of 2)‎
How many people are using ORCID?