Personal information

Other IDs

Scopus Author ID: 23975956600

Activities

Collapse all

Works (18)

Porosity and conductivity in ballistic deposition with power-law distributed noise

Modern Physics Letters B
2023 | Journal article
DOI: 10.1142/S0217984923501750
EID:

2-s2.0-85165873968

Part of ISSN: 02179849
Contributors: Rahimi, M.; Hosseinabadi, S.; Masoudi, A.A.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Porosity and Conductivity in Ballistic Deposition with Power-Law Distributed Noise

SSRN
2022 | Other
EID:

2-s2.0-85134746020

Part of ISSN: 15565068
Contributors: Rahimi, M.; Hosseinabadi, S.; Masoudi, A.A.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Random deposition with spatially correlated noise (RD-SCN) model: Multi-affine analysis

Chaos, Solitons and Fractals
2021 | Journal article
DOI: 10.1016/j.chaos.2020.110596
EID:

2-s2.0-85099254679

Part of ISSN: 09600779
Contributors: Hosseinabadi, S.; Masoudi, A.A.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Scaling feature of nano-scale friction based on the inverse statistical approach

Physica A: Statistical Mechanics and its Applications
2021 | Journal article
DOI: 10.1016/j.physa.2021.125994
EID:

2-s2.0-85103989785

Part of ISSN: 03784371
Contributors: Tely, B.H.; Hosseinabadi, S.; Matin, L.F.; Jafari, G.R.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

NUMERICAL and THEORETICAL STUDY of the CASIMIR FORCE CORRECTIONS between TWO ROUGH SURFACES

Surface Review and Letters
2020 | Journal article
DOI: 10.1142/S0218625X19501956
EID:

2-s2.0-85078766252

Part of ISSN: 0218625X
Contributors: Hassanzadeh, H.; Masoudi, A.A.; Hosseinabadi, S.; Khorrami, M.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Random deposition with surface relaxation model accompanied by long-range correlated noise

Physica A: Statistical Mechanics and its Applications
2020 | Journal article
DOI: 10.1016/j.physa.2020.125130
EID:

2-s2.0-85089801289

Part of ISSN: 03784371
Contributors: Hosseinabadi, S.; Karimi, Z.; Masoudi, A.A.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Contour loop analysis of multi-affine nanostructure AZO rough surfaces

Surface Topography: Metrology and Properties
2019 | Journal article
DOI: 10.1088/2051-672X/ab326f
EID:

2-s2.0-85074616480

Part of ISSN: 2051672X
Contributors: Hosseinabadi, S.; Shirazi, M.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Random deposition with a power-law noise model: Multiaffine analysis

Physical Review E
2019 | Journal article
DOI: 10.1103/PhysRevE.99.012130
EID:

2-s2.0-85060142642

Part of ISSN: 24700053 24700045
Contributors: Hosseinabadi, S.; Masoudi, A.A.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Iso-height lines of multifractal etched silicon rough surfaces

Materials Science in Semiconductor Processing
2018 | Journal article
DOI: 10.1016/j.mssp.2018.06.011
EID:

2-s2.0-85050813082

Part of ISSN: 13698001
Contributors: Hosseinabadi, S.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Roughness kinetic and multiaffinity of anisotropic etched silicon

Superlattices and Microstructures
2017 | Journal article
DOI: 10.1016/j.spmi.2016.12.030
EID:

2-s2.0-85007499496

Part of ISSN: 10963677 07496036
Contributors: Hosseinabadi, S.; Rajabi, M.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Statistical and fractal features of nanocrystalline AZO thin films

Physica A: Statistical Mechanics and its Applications
2017 | Journal article
DOI: 10.1016/j.physa.2017.03.033
EID:

2-s2.0-85017421963

Part of ISSN: 03784371
Contributors: Hosseinabadi, S.; Abrinaei, F.; Shirazi, M.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Erratum: Dynamical and geometrical exponents of self affine rough surfaces on regular and random lattices (Journal of Statistical Mechanics: Theory and Experiment (2014)(P12023))

Journal of Statistical Mechanics: Theory and Experiment
2015 | Journal article
DOI: 10.1088/1742-5468/2015/07/E07001
EID:

2-s2.0-84937866584

Part of ISSN: 17425468
Contributors: Hosseinabadi, S.; Sadegh Movahed, S.M.; Rajabpour, M.A.; Vaez Allaei, S.M.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Dynamical and geometrical exponents of self-affine rough surfaces on regular and random lattices

Journal of Statistical Mechanics: Theory and Experiment
2014 | Journal article
DOI: 10.1088/1742-5468/2014/12/P12023
EID:

2-s2.0-84919665291

Part of ISSN: 17425468
Contributors: Hosseinabadi, S.; Sadegh Movahed, S.M.; Rajabpour, M.A.; Vaez Allaei, S.M.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Stochastic and fractal properties of silicon and porous silicon rough surfaces

Journal of Physics: Conference Series
2013 | Conference paper
DOI: 10.1088/1742-6596/454/1/012035
EID:

2-s2.0-84885607365

Part of ISSN: 17426596 17426588
Contributors: Hosseinabadi, S.; Rajabi, M.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Geometrical exponents of contour loops on synthetic multifractal rough surfaces: Multiplicative hierarchical cascade p model

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics
2012 | Journal article
DOI: 10.1103/PhysRevE.85.031113
EID:

2-s2.0-84859098986

Part of ISSN: 15393755 15502376
Contributors: Hosseinabadi, S.; Rajabpour, M.A.; Sadegh Movahed, M.; Vaez Allaei, S.M.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Statistical analysis of radial interface growth

Journal of Statistical Mechanics: Theory and Experiment
2012 | Journal article
DOI: 10.1088/1742-5468/2012/02/L02001
EID:

2-s2.0-84857772221

Part of ISSN: 17425468
Contributors: Masoudi, A.A.; Hosseinabadi, S.; Davoudi, J.; Khorrami, M.; Kohandel, M.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Solid-on-solid model for surface growth in 2+1 dimensions

Physica B: Condensed Matter
2010 | Journal article
DOI: 10.1016/j.physb.2010.01.105
EID:

2-s2.0-77949265462

Part of ISSN: 09214526
Contributors: Hosseinabadi, S.; Masoudi, A.A.; Sadegh Movahed, M.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier

Investigating aluminum thin films properties by stochastic analysis

Surface and Interface Analysis
2008 | Journal article
DOI: 10.1002/sia.2719
EID:

2-s2.0-40749140332

Part of ISSN: 01422421 10969918
Contributors: Hosseinabadi, S.; Mortezaali, A.; Masoudi, A.A.
Source: Self-asserted source
sakineh hosseinabadi via Scopus - Elsevier
How many people are using ORCID?