Personal information
Activities
Employment (1)
Employment
Source:
Petr Zavyalov
Works (17)
PHOTONICS Russia
2024-12-05
|
Journal article
Contributors:
М.А. Завьялова;
П.С. Завьялов;
А.В. Солдатенко
Source:
check_circle
Crossref
PHOTONICS Russia
2022-12-12
|
Journal article
Contributors:
М.А. Завьялова;
П.С. Завьялов;
М.В. Савченко
Source:
check_circle
Crossref
PHOTONICS Russia
2021-11-15
|
Journal article
Contributors:
М.А. Завьялова;
П.С. Завьялов;
М.В. Савченко
Source:
check_circle
Crossref
Optoelectronics, Instrumentation and Data Processing
2020
|
Journal article
EID:
2-s2.0-85099263985
Contributors:
Zavyalov, P.S.;
Kravchenko, M.S.;
Zhimuleva, E.S.
Source:
Petr Zavyalov
via
Scopus - Elsevier
Optoelectronics, Instrumentation and Data Processing
2020
|
Journal article
EID:
2-s2.0-85099200321
Contributors:
Zavyalov, P.S.;
Khakimov, D.R.;
Gushchina, A.A.;
Ermolenko, A.V.;
Skokov, D.V.;
Sartakov, V.Y.
Source:
Petr Zavyalov
via
Scopus - Elsevier
Optoelectronics, Instrumentation and Data Processing
2018
|
Journal article
EID:
2-s2.0-85044827734
Contributors:
Zhimuleva, E.S.;
Zavyalov, P.S.;
Kravchenko, M.S.
Source:
Petr Zavyalov
via
Scopus - Elsevier
Journal of Physics: Conference Series
2018
|
Conference paper
EID:
2-s2.0-85059016766
Contributors:
Zavyalov, P.S.;
Finogenov, L.V.;
Zhimuleva, E.S.;
Kravchenko, M.S.;
Khakimov, D.R.;
Savinov, K.I.;
Savchenko, M.V.;
Beloborodov, A.V.;
Karlin, V.E.
Source:
Petr Zavyalov
via
Scopus - Elsevier
Optoelectronics, Instrumentation and Data Processing
2017
|
Journal article
EID:
2-s2.0-85038115405
Contributors:
Zavyalov, P.S.;
Karlin, V.E.;
Kravchenko, M.S.;
Finogenov, L.V.;
Khakimov, D.R.
Source:
Petr Zavyalov
via
Scopus - Elsevier
Optoelectronics, Instrumentation and Data Processing
2017
|
Journal article
EID:
2-s2.0-85038081667
Contributors:
Bessmeltsev, V.P.;
Zavyalov, P.S.;
Korolkov, V.P.;
Nasyrov, R.K.;
Terentyev, V.S.
Source:
Petr Zavyalov
via
Scopus - Elsevier
Russian Journal of Nondestructive Testing
2016
|
Journal article
EID:
2-s2.0-84988700972
Contributors:
Zav’yalov, P.S.;
Finogenov, L.V.;
Vlasov, E.V.
Source:
Petr Zavyalov
via
Scopus - Elsevier
Measurement Science Review
2015
|
Journal article
EID:
2-s2.0-84925874024
Contributors:
Zavyalov, P.
Source:
Petr Zavyalov
via
Scopus - Elsevier
International Journal of Automation Technology
2015
|
Journal article
EID:
2-s2.0-84940838150
Contributors:
Chugui, Y.V.;
Verkhoglyad, A.G.;
Zavyalov, P.S.;
Sysoev, E.V.;
Kulikov, R.V.;
Vykhristyuk, I.A.;
Zavyalova, M.A.;
Poleshchuk, A.G.;
Korolkov, V.P.
Source:
Petr Zavyalov
via
Scopus - Elsevier
Measurement Science Review
2013
|
Journal article
EID:
2-s2.0-84900848439
Contributors:
Chugui, Y.;
Verkhoglyad, A.;
Poleshchuk, A.;
Korolkov, V.;
Sysoev, E.;
Zavyalov, P.
Source:
Petr Zavyalov
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2013
|
Conference paper
EID:
2-s2.0-84893950272
Contributors:
Senchenko, E.S.;
Zavyalov, P.S.;
Finogenov, L.V.;
Khakimov, D.R.
Source:
Petr Zavyalov
via
Scopus - Elsevier
Computer Optics
2013
|
Journal article
EID:
2-s2.0-84907423421
Contributors:
Zavyalov, P.S.;
Chugui, Y.V.
Source:
Petr Zavyalov
via
Scopus - Elsevier
VDI Berichte
2004
|
Book
EID:
2-s2.0-19744380974
Contributors:
Chugui, Yu.V.;
Finogenov, L.V.;
Kiryanov, V.P.;
Nikitin, V.G.;
Sametov, A.R.;
Zavyalov, P.S.
Source:
Petr Zavyalov
via
Scopus - Elsevier
VDI Berichte
2004
|
Book
EID:
2-s2.0-19444382784
Contributors:
Chugui, Yu.;
Finogenov, L.;
Kiryanov, V.;
Nikitin, V.;
Sametov, A.;
Zavyalov, P.
Source:
Petr Zavyalov
via
Scopus - Elsevier