Personal information

Activities

Employment (1)

Konstruktorsko-tehnologiceskij institut naucnogo priborostroenia SO RAN: Novosibirsk, RU

Employment
Source: Self-asserted source
Petr Zavyalov

Works (17)

Конфокальная гиперхроматическая оптическая система с повышенными энергетическими характеристиками

PHOTONICS Russia
2024-12-05 | Journal article
Contributors: М.А. Завьялова; П.С. Завьялов; А.В. Солдатенко
Source: check_circle
Crossref

Конфокальный гиперхроматический датчик поверхности на основе суперлюминесцентного диода

PHOTONICS Russia
2022-12-12 | Journal article
Contributors: М.А. Завьялова; П.С. Завьялов; М.В. Савченко
Source: check_circle
Crossref

Экспериментальные исследования волоконного конфокального датчика на основе метода хроматического кодирования

PHOTONICS Russia
2021-11-15 | Journal article
Contributors: М.А. Завьялова; П.С. Завьялов; М.В. Савченко
Source: check_circle
Crossref

Control and Positioning System for Reflector of ‘‘Millimetron’’ Observatory: Design and Development

Optoelectronics, Instrumentation and Data Processing
2020 | Journal article
EID:

2-s2.0-85099263985

Part of ISSN: 19347944 87566990
Contributors: Zavyalov, P.S.; Kravchenko, M.S.; Zhimuleva, E.S.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

Light Section Method of Alignment Control for Weapon Barrels

Optoelectronics, Instrumentation and Data Processing
2020 | Journal article
EID:

2-s2.0-85099200321

Part of ISSN: 19347944 87566990
Contributors: Zavyalov, P.S.; Khakimov, D.R.; Gushchina, A.A.; Ermolenko, A.V.; Skokov, D.V.; Sartakov, V.Y.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

Development of Telecentric Objectives for Dimensional Inspection Systems

Optoelectronics, Instrumentation and Data Processing
2018 | Journal article
EID:

2-s2.0-85044827734

Part of ISSN: 19347944 87566990
Contributors: Zhimuleva, E.S.; Zavyalov, P.S.; Kravchenko, M.S.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

Using diffractive optical elements for industrial products geometrical parameters inspection

Journal of Physics: Conference Series
2018 | Conference paper
EID:

2-s2.0-85059016766

Part of ISSN: 17426596 17426588
Contributors: Zavyalov, P.S.; Finogenov, L.V.; Zhimuleva, E.S.; Kravchenko, M.S.; Khakimov, D.R.; Savinov, K.I.; Savchenko, M.V.; Beloborodov, A.V.; Karlin, V.E.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

Application of diffractive elements for improving the efficiency of systems for cylindrical surface inspection

Optoelectronics, Instrumentation and Data Processing
2017 | Journal article
EID:

2-s2.0-85038115405

Part of ISSN: 19347944 87566990
Contributors: Zavyalov, P.S.; Karlin, V.E.; Kravchenko, M.S.; Finogenov, L.V.; Khakimov, D.R.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

Diffractive focusing fan-out element for the parallel DNA sequencer

Optoelectronics, Instrumentation and Data Processing
2017 | Journal article
EID:

2-s2.0-85038081667

Part of ISSN: 19347944 87566990
Contributors: Bessmeltsev, V.P.; Zavyalov, P.S.; Korolkov, V.P.; Nasyrov, R.K.; Terentyev, V.S.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

A dedicated optical system for the quality inspection of cylindrical surfaces

Russian Journal of Nondestructive Testing
2016 | Journal article
EID:

2-s2.0-84988700972

Part of ISSN: 16083385 10618309
Contributors: Zav’yalov, P.S.; Finogenov, L.V.; Vlasov, E.V.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

3D hole inspection using lens with high field curvature

Measurement Science Review
2015 | Journal article
EID:

2-s2.0-84925874024

Part of ISSN: 13358871
Contributors: Zavyalov, P.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

Optical measuring and laser technologies for scientific and industrial applications

International Journal of Automation Technology
2015 | Journal article
EID:

2-s2.0-84940838150

Part of ISSN: 18838022 18817629
Contributors: Chugui, Y.V.; Verkhoglyad, A.G.; Zavyalov, P.S.; Sysoev, E.V.; Kulikov, R.V.; Vykhristyuk, I.A.; Zavyalova, M.A.; Poleshchuk, A.G.; Korolkov, V.P.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

3D optical measuring systems and laser technologies for scientific and industrial applications

Measurement Science Review
2013 | Journal article
EID:

2-s2.0-84900848439

Part of ISSN: 13358871
Contributors: Chugui, Y.; Verkhoglyad, A.; Poleshchuk, A.; Korolkov, V.; Sysoev, E.; Zavyalov, P.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

Nuclear fuel assemblies' deformations measurement by optoelectronic methods in cooling ponds

Proceedings of SPIE - The International Society for Optical Engineering
2013 | Conference paper
EID:

2-s2.0-84893950272

Part of ISSN: 1996756X 0277786X
Contributors: Senchenko, E.S.; Zavyalov, P.S.; Finogenov, L.V.; Khakimov, D.R.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

The formation of light templates for large-sized objects using the diffraction optics methods

Computer Optics
2013 | Journal article
EID:

2-s2.0-84907423421

Part of ISSN: 01342452
Contributors: Zavyalov, P.S.; Chugui, Y.V.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

An optoelectronic method for comprehensive hole inspection

VDI Berichte
2004 | Book
EID:

2-s2.0-19744380974

Part of ISSN: 00835560
Contributors: Chugui, Yu.V.; Finogenov, L.V.; Kiryanov, V.P.; Nikitin, V.G.; Sametov, A.R.; Zavyalov, P.S.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier

Inspection of holes parameters using a ring diffractive focuser

VDI Berichte
2004 | Book
EID:

2-s2.0-19444382784

Part of ISSN: 00835560
Contributors: Chugui, Yu.; Finogenov, L.; Kiryanov, V.; Nikitin, V.; Sametov, A.; Zavyalov, P.
Source: Self-asserted source
Petr Zavyalov via Scopus - Elsevier