Personal information

Process Safety
United States

Biography

Bruce K. Vaughen, Ph.D., P.E., CCPSC, (brucv@aiche.org) is the Lead Process Safety Subject Matter Expert at the Center for Chemical Process Safety (CCPS), a Technology Alliance in the American Institute of Chemical Engineers (AIChE). He has more than two and a half decades of process safety experience, including engineering, research, teaching, and consulting experiences in DuPont, DuPont Teijin Films, Cabot Corporation, BakerRisk, and CCPS, and as a visiting assistant professor at Rose-Hulman Institute of Technology, Terre Haute, Indiana. His roles have included leading global Process Safety Management (PSM) efforts, updating and developing corporate PSM standards, and developing PSM training and workshops. He is a co-author with James A. Klein for the book Process Safety: Key Concepts and Practical Approaches (CRCPress 2017) and is the principal author of three CCPS guideline books: Process Safety During the Transient Operating Mode (Wiley 2021); Siting and Layout of Facilities (Wiley, 2018); and Integrating Management Systems and Metrics to Improve Process Safety Performance (Wiley, 2016). He has developed training modules for AIChE’s Safety and Chemical Engineering Education (SAChE) program through AIChE. He holds a BS degree in chemical engineering from the University of Michigan, Ann Arbor, Michigan, MS and PhD degrees in chemical engineering from Vanderbilt University, Nashville, Tennessee, and is a registered professional engineer in the USA.

Activities

Employment (7)

American Institute of Chemical Engineers: New York, NY, US

2018-08-14 to present | Lead Process Safety Subject Matter Expert (Center for Chemical Process Safety)
Employment
Source: Self-asserted source
Bruce Vaughen

Baker Engineering and Risk Consultants Inc: San Antonio, TX, US

2012-06-20 to 2017-05-02 | Principal Consultant (Process Safety)
Employment
Source: Self-asserted source
Bruce Vaughen

Cabot Corp: Tuscola, IL, US

2008-04-01 to 2012-05-31 | Global Process Safety Mangement Coordinator, FMO (Fumed Metal Oxides; Process Safety)
Employment
Source: Self-asserted source
Bruce Vaughen

Rose Hulman Institute of Technology: Terre Haute, IN, US

2007-06-01 to 2008-03-31 | Visiting Assistant Professor (Chemical Engineering)
Employment
Source: Self-asserted source
Bruce Vaughen

DuPont Teijin Films: Hopewell, VA, US

2000-05-31 to 2007-05-31 | Process Safety Management Coordinator (Process Safety)
Employment
Source: Self-asserted source
Bruce Vaughen

EI Dupont de Nemours and Co: Tonwanda (Buffalo), NY, US

1991-05-01 to 2000-04-31 | Process Engineer; Process Safety Management Coordinator (Tedlar Operations)
Employment
Source: Self-asserted source
Bruce Vaughen

EI Dupont de Nemours and Co: Wilmington, DE, US

1989-09-01 to 1991-04-01 | Research Engineer (Tedar Research and Development)
Employment
Source: Self-asserted source
Bruce Vaughen

Education and qualifications (3)

Vanderbilt University: Nashville, TN, US

1986-06-01 to 1989-06-01 | Ph.D. (Chemical Engineering)
Education
Source: Self-asserted source
Bruce Vaughen

Vanderbilt University: Nashville, TN, US

1984-09-01 to 1986-06-01 | M.S. Ch.E. (Chemical Engineering)
Education
Source: Self-asserted source
Bruce Vaughen

University of Michigan: Ann Arbor, MI, US

1980-09-01 to 1984-06-01 | B.S. Ch. E. (Chemical Engineering)
Education
Source: Self-asserted source
Bruce Vaughen

Works (43)

Process Safety: Key Concepts and Practical Approaches

Taylor & Francis (CRCPress)
2017-05-04 | Book
Source: Self-asserted source
Bruce Vaughen

Use the bow tie diagram to help reduce process safety risk

Chemical Engineering Progress
2016 | Other
EID:

2-s2.0-85006905599

Contributors: Bloch, K.; Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Guidelines for integrating management systems and metrics to improve process safety performance

Process Safety Progress
2015 | Journal article
EID:

2-s2.0-84938697880

Contributors: Vaughen, B.K.; Downes, A.; Fox, J.; Belonger, D.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Three decades after Bhopal: What we have learned about effectively managing process safety risks

Process Safety Progress
2015 | Journal article
EID:

2-s2.0-84949257764

Contributors: Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Three decades after Bhopal: What we have learned about effectively managing process safety risks

30th Center for Chemical Process Safety International Conference 2015 - Topical Conference at the 2015 AIChE Spring Meeting and 11th Global Congress on Process Safety
2015 | Conference paper
EID:

2-s2.0-84942049201

Contributors: Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Guidelines for integrating management systems and metrics to improve process safety performance

29th Center for Chemical Process Safety International Conference 2014, CCPS 2014 - Topical Conference at the 2014 AIChE Spring Meeting and 10th Global Congress on Process Safety
2014 | Conference paper
EID:

2-s2.0-84909960116

Contributors: Vaughen, B.K.; Downes, A.; Fox, J.; Belonger, D.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

A surgical risk reduction approach to reduce global process safety risk: The "PSM gamma-knife"

Process Safety Progress
2012 | Journal article
EID:

2-s2.0-84861222437

Contributors: Vaughen, B.K.; Kruger, P.; Hauser, T.A.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

A tribute to Trevor Kletz: What we are doing and why we are doing it

Journal of Loss Prevention in the Process Industries
2012 | Journal article
EID:

2-s2.0-84865571601

Contributors: Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

An approach to help departments meet the new abet process safety requirements

Chemical Engineering Education
2012 | Journal article
EID:

2-s2.0-84861054532

Contributors: Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Continuing our Process Safety Management (PSM) journey: How time and technology have helped change the public's view

AIChE Annual Meeting, Conference Proceedings
2012 | Conference paper
EID:

2-s2.0-84889731491

Contributors: Vaughen, B.K.; Kletz, T.A.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Continuing our Process Safety Management (PSM) journey: How time and technology have helped change the public's view

Global Congress on Process Safety 2012 - Topical Conference at the 2012 AIChE Spring Meeting and 8th Global Congress on Process Safety
2012 | Conference paper
EID:

2-s2.0-84875672278

Contributors: Vaughen, B.K.; Kletz, T.A.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Continuing our process safety management journey

Process Safety Progress
2012 | Journal article
EID:

2-s2.0-84869508674

Contributors: Vaughen, B.K.; Kletz, T.A.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

What you don't manage will leak: A tribute to Trevor Kletz

Process Safety and Environmental Protection
2012 | Journal article
EID:

2-s2.0-84867096426

Contributors: Vaughen, B.K.; Klein, J.A.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

A case study-combining incident investigation approaches to identify system-related root causes

Process Safety Progress
2011 | Journal article
EID:

2-s2.0-81355161328

Contributors: Vaughen, B.K.; Muschara, T.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

A surgical risk reduction approach to reduce global process safety risk: The "pSM Gamma-Knife"

AIChE Annual Meeting, Conference Proceedings
2011 | Conference paper
EID:

2-s2.0-84860231926

Contributors: Vaughen, B.K.; Kruger, P.; Hauser, T.A.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

A surgical risk reduction approach to reduce global process safety risk: The "PSM gamma-knife"

26th Center for Chemical Process Safety International Conference 2011, CCPS - Topical Conference at the 2011 AIChE Spring Meeting and 7th Global Congress on Process Safety
2011 | Conference paper
EID:

2-s2.0-80051678669

Contributors: Vaughen, B.K.; Kruger, P.; Hauser, T.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Addressing human error in systemic failures: A case study combining incident investigation approaches

AIChE Annual Meeting, Conference Proceedings
2011 | Conference paper
EID:

2-s2.0-84860237808

Contributors: Vaughen, B.K.; Muschara, T.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

An approach to integrate plant reliability efforts with a mechanical integrity program

26th Center for Chemical Process Safety International Conference 2011, CCPS - Topical Conference at the 2011 AIChE Spring Meeting and 7th Global Congress on Process Safety
2011 | Conference paper
EID:

2-s2.0-80051689470

Contributors: Vaughen, B.K.; Nagel, J.F.; Allen, M.J.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

An approach to integrate plant reliability efforts with a Mechanical Integrity Program

AIChE Annual Meeting, Conference Proceedings
2011 | Conference paper
EID:

2-s2.0-84860246488

Contributors: Vaughen, B.K.; Nagel, J.F.; Allen, M.J.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Continuing our journey to bridge the process safety gap between academia and industry: Meeting the new ABET process safety expectations

AIChE Annual Meeting, Conference Proceedings
2011 | Conference paper
EID:

2-s2.0-84863407134

Contributors: Vaughen, B.K.; Spicer, T.O.; Martin, R.E.; Morrison, D.T.; Klein, J.A.; Rockstraw, D.A.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Implement an operational discipline program to improve plant process safety

Chemical Engineering Progress
2011 | Other
EID:

2-s2.0-79960080983

Contributors: Klein, J.A.; Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Improving operational discipline to prevent loss of containment incidents

Process Safety Progress
2011 | Journal article
EID:

2-s2.0-79961130567

Contributors: Vaughen, B.K.; Klein, J.A.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Integrate plant reliability efforts with mechanical integrity

Process Safety Progress
2011 | Journal article
EID:

2-s2.0-81355149761

Contributors: Vaughen, B.K.; Nagel, J.F.; Allen, M.J.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Using the ISA 84/HAZOP/LOPA procedure to design a safety instrumented system for a fumed silica burner

Process Safety Progress
2011 | Journal article
EID:

2-s2.0-79955743360

Contributors: Vaughen, B.K.; Mudd, J.O.; Pierce, B.E.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

A SAChE module designed to bridge process safety's troubled waters: Meeting the new academic process safety requirements

AIChE Annual Meeting, Conference Proceedings
2010 | Conference paper
EID:

2-s2.0-78751473670

Contributors: Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Improving operating discipline through the successful implementation of a mandated Behavior-based safety program

Process Safety Progress
2010 | Journal article
EID:

2-s2.0-77955249687

Contributors: Vaughen, B.K.; Lock, K.J.; Floyd, T.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Improving operational discipline programs to prevent loss of containment incidents

AIChE Annual Meeting, Conference Proceedings
2010 | Conference paper
EID:

2-s2.0-77955257155

Contributors: Vaughen, B.K.; Klein, J.A.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Improving operational discipline programs to prevent loss of containment incidents

10AIChE - 2010 AIChE Spring Meeting and 6th Global Congress on Process Safety
2010 | Conference paper
EID:

2-s2.0-77955986611

Contributors: Vaughen, B.K.; Klein, J.A.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Using the ISA 84 / HAZOP / LOPA procedure to design a Safety Instrumented System (SIS) for a fumed silica burner

AIChE Annual Meeting, Conference Proceedings
2010 | Conference paper
EID:

2-s2.0-77955250893

Contributors: Vaughen, B.K.; Mudd, J.O.; Pierce, B.E.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

A revised program for operational discipline

Process Safety Progress
2008 | Journal article
EID:

2-s2.0-40749154850

Contributors: Klein, J.A.; Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Enhancing the undergraduate chemical engineering curriculum with an industrial process safety approach

ASEE Annual Conference and Exposition, Conference Proceedings
2008 | Conference paper
EID:

2-s2.0-80053775181

Contributors: Vaughen, B.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Enhancing the undergraduate chemical engineering laboratory with an industrial process safety approach

42nd Loss Prevention Symposium, LPS 2008, Topical Conference at the 2008 AIChE Spring National Meeting
2008 | Conference paper
EID:

2-s2.0-84912553328

Contributors: Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Enhancing the undergraduate chemical engineering laboratory with an industrial process safety approach

AIChE Annual Meeting, Conference Proceedings
2008 | Conference paper
EID:

2-s2.0-56449099950

Contributors: Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Evaluating and improving operational discipline

AIChE Annual Meeting, Conference Proceedings
2007 | Conference paper
EID:

2-s2.0-80053862568

Contributors: Klein, J.A.; Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Evaluating and improving operational discipline

9th Process Plant Safety Symposium, PPSS 2007, Held at the 2007 AIChE Spring National Meeting
2007 | Conference paper
EID:

2-s2.0-84912095951

Contributors: Klein, J.A.; Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

The next generation operational discipline program at DuPont

American Institute of Chemical Engineers - 22nd Annual International Conference of the Center for Chemical Process Safety, CCPS 2007
2007 | Conference paper
EID:

2-s2.0-55349123283

Contributors: Klein, J.A.; Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

The next generation operational discipline program at DuPont

AIChE Annual Meeting, Conference Proceedings
2007 | Conference paper
EID:

2-s2.0-57049121836

Contributors: Klein, J.A.; Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

A time-saving approach for separating and focusing on human factors checklist discussion questions

Process Safety Progress
2006 | Other
EID:

2-s2.0-33845709693

Contributors: Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Statistical analysis of human factors checklists

2005 AIChE Spring National Meeting, Conference Proceedings
2005 | Conference paper
EID:

2-s2.0-22444442938

Contributors: Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Critical variables in gaseous corrosion testing

Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts
1988 | Conference paper
EID:

2-s2.0-0024130706

Contributors: Jeannotte, Dexter; Biyani, Shriram; Roth, John; Hall, Larry; Davies, Sue; Vaughen, Bruce; Steppan, James
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Electrolytic Copper Migration in Accelerated Tests I. Polyethylene Glycol-400 Doped with Ammonium Perchlorate

Journal of the Electrochemical Society
1988 | Journal article
EID:

2-s2.0-0024065874

Contributors: Vaughen, B.K.; Roth, J.A.; Steppan, J.J.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

Cyclic Voltammetric Study of Copper Electrode Pretreatment for Metal Migration and Corrosion Rates

Journal of the Electrochemical Society
1987 | Journal article
EID:

2-s2.0-0023400581

Contributors: Hall, L.C.; Major, C.P.; Steppan, J.J.; Roth, J.A.; Vaughen, B.K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier

IMMOBILIZATION METHOD FOR THE RECOVERY OF CELLULASE USED IN CELLULOSE CONVERSION TO ETHANOL.

Symposium Papers - Energy from Biomass and Wastes
1984 | Conference paper
EID:

2-s2.0-0021625535

Contributors: Woodward, Jonathan; Hillman, Sheri K.; Vaughen, Bruce K.
Source: Self-asserted source
Bruce Vaughen via Scopus - Elsevier