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https://business.utsa.edu/faculty/profiles/han-david.html

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Employment (1)

The University of Texas at San Antonio: San Antonio, US

Employment
Source: Self-asserted source
David Han

Education and qualifications (1)

McMaster University: Hamilton, CA

Ph.D. Statistics
Education
Source: Self-asserted source
David Han

Works (13)

Bayesian estimation of the mean time between failures of subsystems with different causes using interval‐censored system maintenance data

Quality and Reliability Engineering International
2024-11 | Journal article
DOI: 10.1002/qre.3606
Contributors: David Han; James D. Brownlow; Jesse Thompson; Ralph G. Brooks
Source: check_circle
Crossref

Big Data Analytics, Data Science, ML&AI for Connected, Data-driven Precision Agriculture and Smart Farming Systems: Challenges and Future Directions

2023-05-09 | Conference paper
DOI: 10.1145/3576914.3588337
Contributors: David Han
Source: check_circle
Crossref

Parameter Estimation Using EM Algorithm For Lifetimes From Step-Stress and Constant-Stress Accelerated Life Tests With Interval Monitoring

IEEE Transactions on Reliability
2021-03 | Journal article | Author
DOI: 10.1109/tr.2019.2957710
Part of ISSN: 0018-9529
Part of ISSN: 1558-1721
Contributors: David Han; Tianyu Bai
Source: Self-asserted source
David Han
grade
Preferred source (of 2)‎

On the Existence of the Optimal Step-Stress Accelerated Life Tests Under Progressive Type-I Censoring

IEEE Transactions on Reliability
2020-09 | Journal article | Author
DOI: 10.1109/tr.2019.2915773
Part of ISSN: 0018-9529
Part of ISSN: 1558-1721
Contributors: David Han
Source: Self-asserted source
David Han
grade
Preferred source (of 2)‎

Design optimization of a simple step-stress accelerated life test – Contrast between continuous and interval inspections with non-uniform step durations

Reliability Engineering & System Safety
2020-07 | Journal article
DOI: 10.1016/j.ress.2020.106875
Part of ISSN: 0951-8320
Contributors: David Han; Tianyu Bai
Source: Self-asserted source
David Han

Expected termination times of progressively Type‐I censored step‐stress accelerated life tests under continuous and interval inspections

Statistica Neerlandica
2020-05 | Journal article | Author
DOI: 10.1111/stan.12190
Part of ISSN: 0039-0402
Part of ISSN: 1467-9574
Contributors: David Han
Source: Self-asserted source
David Han
grade
Preferred source (of 2)‎

Optimal design of a simple step‐stress accelerated life test under progressive type I censoring with nonuniform durations for exponential lifetimes

Quality and Reliability Engineering International
2019-07 | Journal article | Author
DOI: 10.1002/qre.2523
Part of ISSN: 0748-8017
Part of ISSN: 1099-1638
Contributors: David Han
Source: Self-asserted source
David Han
grade
Preferred source (of 2)‎

Bayesian estimation of the analyte concentrations using the sensor responses and the design optimization of a sensor system

Chemometrics and Intelligent Laboratory Systems
2018-05 | Journal article
DOI: 10.1016/j.chemolab.2018.03.015
Part of ISSN: 0169-7439
Contributors: David Han; Kevin Johnson
Source: Self-asserted source
David Han

Optimal accelerated life tests under a cost constraint with non-uniform stress durations

Quality Engineering
2017-07-03 | Journal article
DOI: 10.1080/08982112.2017.1313982
Part of ISSN: 0898-2112
Part of ISSN: 1532-4222
Contributors: David Han
Source: Self-asserted source
David Han

Time and cost constrained optimal designs of constant-stress and step-stress accelerated life tests

Reliability Engineering & System Safety
2015-08 | Journal article
DOI: 10.1016/j.ress.2015.03.026
Part of ISSN: 0951-8320
Contributors: David Han
Source: Self-asserted source
David Han

Estimation in step-stress life tests with complementary risks from the exponentiated exponential distribution under time constraint and its applications to UAV data

Statistical Methodology
2015-03 | Journal article
DOI: 10.1016/j.stamet.2014.09.001
Part of ISSN: 1572-3127
Contributors: David Han
Source: Self-asserted source
David Han

Inference for a Step-Stress Model With Competing Risks for Failure From the Generalized Exponential Distribution Under Type-I Censoring

IEEE Transactions on Reliability
2015-03 | Journal article
DOI: 10.1109/tr.2014.2336392
Part of ISSN: 0018-9529
Part of ISSN: 1558-1721
Contributors: David Han; Debasis Kundu
Source: Self-asserted source
David Han

Comparison between constant-stress and step-stress accelerated life tests under Time Constraint

Naval Research Logistics (NRL)
2013-10 | Journal article
DOI: 10.1002/nav.21551
Part of ISSN: 0894-069X
Contributors: David Han; H.K.T. Ng
Source: Self-asserted source
David Han

Peer review (2 reviews for 1 publication/grant)

Review activity for Reliability engineering & systems safety. (2)
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