Personal information

Low-frequency noise, MOSFET
Ukraine

Activities

Employment (1)

Institute of Semiconductor Physics: Kiev, UA

2008 to present
Employment
Source: Self-asserted source
Valeriya Kudina

Education and qualifications (1)

ISP: Kiev, UA

2005 to 2008 | PhD
Education
Source: Self-asserted source
Valeriya Kudina

Works (12)

PROFESSIONAL DEVELOPMENT OF ACADEMIC STAFF BY MEANS OF INFORMATION AND COMMUNICATION TECHNOLOGIES: THE UKRAINIAN EXPERINCE

Information Technologies and Learning Tools
2022-09-29 | Journal article
Contributors: Неля Григорівна Ничкало; Наталія Петрівна Муранова; Олена Станіславівна Волярска; Валерія Василівна Кудіна
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A high speed PE-ALD ZnO Schottky diode rectifier with low interface-state density

Journal of Physics D: Applied Physics
2018-01-02 | Journal article
Part of ISSN: 0022-3727
Contributors: Jidong Jin; Jiawei Zhang; Andrew Shaw; Valeriya N Kudina; Ivona Z Mitrovic; Jacqueline S Wrench; Paul R Chalker; Claudio Balocco; Aimin Song; Steve Hall
Source: Self-asserted source
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Preferred source (of 2)‎

Hopping Conduction in Structures with Ge Nanoclusters Grown on Oxidized Si (001)

Journal of Nano Research
2016-02 | Journal article
Part of ISSN: 1661-9897
Contributors: Vladimir Lysenko; Y.V. Gomeniuk; Valeriya N. Kudina; Nikolay Garbar; Sergey Kondratenko; Yevgenij Ye. Melnichuk; Yurii N. Kozyrev
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Physical Insights on Charge Transport Mechanism and the LF Noise Behavior in Oxidized Si Structures with Ge Nanoclusters

Journal of Nano Research
2016-02 | Journal article
Part of ISSN: 1661-9897
Contributors: Vladimir Lysenko; Yurii V. Gomeniuk; Valeriya N. Kudina; Nikolay Garbar; Sergey Kondratenko; Yurii N. Kozyrev
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Impact of processing and back-gate biasing conditions on the low-frequency noise of ultra-thin buried oxide silicon-on-insulator nMOSFETs

Solid-State Electronics
2015-03 | Journal article
Part of ISSN: 0038-1101
Contributors: V. Kudina; N. Garbar; E. Simoen; C. Claeys
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Effect of Ge-Nanoislands on the Low-Frequency Noise in Si/SiO<sub>x</sub>/Ge Structures

Advanced Materials Research
2013-11 | Journal article
Part of ISSN: 1662-8985
Contributors: N.P. Garbar; Valeriya N. Kudina; V.S. Lysenko; S.V. Kondratenko; Yu.N. Kozyrev
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Drain currents and their excess noise in triple gate bulk p-channel FinFETs of different geometry

Microelectronics Reliability
2013-03 | Journal article
Part of ISSN: 0026-2714
Contributors: N. Lukyanchikova; N. Garbar; V. Kudina; A. Smolanka; E. Simoen; C. Claeys
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Noise characteristics of nanoscaled SOI MOSFETs

International Conference Micro- and Nano-Electronics 2012
2013-01-08 | Conference paper
Contributors: Nataliya Lukyanchikova; Nikolay Garbar; Valeriya Kudina; Alexander Smolanka; Eddy Simoen; Cor Claeys; Alexander A. Orlikovsky
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LKE and BGI Lorentzian noise in strained and non-strained tri-gate SOI FinFETs with HfSiON/SiO2 gate dielectric

Solid-State Electronics
2011-09 | Journal article
Part of ISSN: 0038-1101
Contributors: N. Lukyanchikova; N. Garbar; V. Kudina; A. Smolanka; E. Simoen; C. Claeys
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Linear kink effect Lorentzians in the noise spectra of n- and p-channel fin field-effect transistors processed in standard and strained silicon-on-insulator substrates

Solid-State Electronics
2009-06 | Journal article
Part of ISSN: 0038-1101
Contributors: N. Lukyanchikova; N. Garbar; V. Kudina; A. Smolanka; C. Claeys; E. Simoen
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High gate voltage drain current leveling off and its low-frequency noise in 65nm fully-depleted strained and non-strained SOI nMOSFETs

Solid-State Electronics
2008-05 | Journal article
Part of ISSN: 0038-1101
Contributors: N. Lukyanchikova; N. Garbar; V. Kudina; A. Smolanka; M. Lokshin; E. Simoen; C. Claeys
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Analytical Model for the Impact of the Twin Gate on the Floating-Body-Related Low-Frequency Noise Overshoot in Silicon-on-Insulator MOSFETs

IEEE Transactions on Electron Devices
2006 | Journal article
Part of ISSN: 0018-9383
Contributors: Nataliya Lukyanchikova; Nikolay Garbar; Alexander Smolanka; Valeriya Kudina; Cor Claeys; Eddy Simoen
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