Personal information
focused ion beam, scanning electron microscopy, plasma focused ion beam
Poland
Activities
Works (1)
Optical Materials
2023-03
|
Journal article
Contributors:
A. Zięba;
K. Hreczycho;
M. Sikora;
A. Chudzyńska;
P. Korzec;
S. Patela
Source:
check_circle
Crossref