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Works (6)

On the Relation Between Reliability and Entropy in Physical Unclonable Functions

IEEE Design & Test
2024-12 | Journal article
Contributors: Vasilii Kulagin; Sergio Vinagrero Gutierrez; Tobias Kilian; Daniel Tille; Ulf Schlichtmann; Giorgio Di Natale; Elena-Ioana Vatajelu
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Python Framework for Modular and Parametric SPICE Netlists Generation

Electronics
2023-09-20 | Journal article
Contributors: Sergio Vinagrero Gutiérrez; Giorgio Di Natale; Elena-Ioana Vatajelu
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SRAM-Based PUF Readouts

Scientific Data
2023-05-27 | Journal article
Contributors: Sergio Vinagrero; Honorio Martin; Alice de Bignicourt; Elena-Ioana Vatajelu; Giorgio Di Natale
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Memristor-based security primitives

2022 IEEE European Test Symposium (ETS)
2022 | Conference paper
Contributors: Gutierrez, Sergio Vinagrero
Source: Self-asserted source
Sergio Vinagrero Gutiérrez

On-line reliability estimation of ring oscillator PUF

2022 IEEE European Test Symposium (ETS)
2022 | Conference paper
Contributors: Gutierrez, Sergio Vinagrero; Di Natale, Giorgio; Vatajelu, Elena-Ioana
Source: Self-asserted source
Sergio Vinagrero Gutiérrez

SRAM-PUF: Platform for Acquisition of Sram-Based Pufs from Micro-Controllers

University Booth-IEEE Design Automation and Test Conference in Europe (DATE 2021)
2021 | Conference paper
Contributors: Gutierrez, Sergio Vinagrero; Martin, Honorio; Vatajelu, Elena Ioana; Di Natale, Giorgio
Source: Self-asserted source
Sergio Vinagrero Gutiérrez

Peer review (1 review for 1 publication/grant)

Review activity for Journal of electronic testing. (1)