Personal information
X-ray optics, Plasma diagnostics, Space optics, Remote sensing, Infrared imaging
China
Activities
Employment (1)
Employment
Source:
Yaran Li
Works (19)
Proceedings of SPIE - The International Society for Optical Engineering
2024
|
Conference paper
EID:
2-s2.0-85207836899
Contributors:
Li, Y.
Source:
Yaran Li
via
Scopus - Elsevier
Zhongguo Jiguang/Chinese Journal of Lasers
2024
|
Journal article
EID:
2-s2.0-85191871731
Contributors:
Zhu, H.;
Chen, J.;
Zeng, Z.;
Xu, Q.;
Wang, X.;
Li, Y.;
Li, X.
Source:
Yaran Li
via
Scopus - Elsevier
Applied Optics
2023
|
Journal article
EID:
2-s2.0-85171238283
Contributors:
Li, Y.;
Ma, H.;
Chen, Y.;
Li, Z.;
Wang, D.
Source:
Yaran Li
via
Scopus - Elsevier
Guangxue Xuebao/Acta Optica Sinica
2023
|
Journal article
EID:
2-s2.0-85158024299
Contributors:
Yaran, L.
Source:
Yaran Li
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2023
|
Conference paper
EID:
2-s2.0-85191003718
Contributors:
Li, Y.;
Jiang, C.
Source:
Yaran Li
via
Scopus - Elsevier
Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering
2023
|
Journal article
EID:
2-s2.0-85171771935
Contributors:
Zhu, H.;
Chen, J.;
Zeng, Z.;
Wang, X.;
Li, Y.;
Wang, X.;
Li, X.
Source:
Yaran Li
via
Scopus - Elsevier
Review of Scientific Instruments
2022
|
Journal article
EID:
2-s2.0-85139116501
Contributors:
Li, Y.;
Li, W.;
Chen, L.;
Ma, H.;
Xu, X.;
Xu, J.;
Wang, X.;
Mu, B.
Source:
Yaran Li
via
Scopus - Elsevier
Zhongguo Jiguang/Chinese Journal of Lasers
2022
|
Journal article
EID:
2-s2.0-85148297740
Contributors:
Chen, J.;
Wang, X.;
Zhu, H.;
Zeng, Z.;
Li, Y.;
Luo, S.;
Wang, X.;
Lin, C.
Source:
Yaran Li
via
Scopus - Elsevier
Scientific Reports
2021
|
Journal article
EID:
2-s2.0-85110754531
Contributors:
Ren, K.;
Wu, J.;
Dong, J.;
Li, Y.;
Huang, T.;
Zhao, H.;
Liu, Y.;
Cao, Z.;
Zhang, J.;
Mu, B.
et al.
Source:
Yaran Li
via
Scopus - Elsevier
Journal of Instrumentation
2019
|
Conference paper
EID:
2-s2.0-85082829871
Contributors:
Zhang, X.;
Chen, Z.;
Li, Y.;
Mu, B.;
Jiang, W.;
Dong, J.;
Yan, J.;
Yu, B.;
Xu, J.;
Wang, X.
et al.
Source:
Yaran Li
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2019
|
Conference paper
EID:
2-s2.0-85077814267
Contributors:
Jie, X.;
Li, Y.;
Han, S.;
Wang, Y.;
Zhu, L.
Source:
Yaran Li
via
Scopus - Elsevier
Optics Express
2019
|
Journal article
EID:
2-s2.0-85063505736
Contributors:
Li, Y.;
Dong, J.;
Xie, Q.;
Xu, J.;
Liu, H.;
Li, W.;
Wang, X.;
Mu, B.;
Wang, Z.;
Chen, F.
et al.
Source:
Yaran Li
via
Scopus - Elsevier
Review of Scientific Instruments
2018
|
Journal article
EID:
2-s2.0-85041004298
Contributors:
Li, Y.;
Xie, Q.;
Chen, Z.;
Xin, Q.;
Wang, X.;
Mu, B.;
Wang, Z.;
Liu, S.;
Ding, Y.
Source:
Yaran Li
via
Scopus - Elsevier
Review of Scientific Instruments
2018
|
Journal article
EID:
2-s2.0-85053670374
Contributors:
Ren, K.;
Cao, Z.;
Dong, J.;
Mu, B.;
Xie, Q.;
Li, Y.;
Zhang, J.;
Huang, T.;
Yang, J.;
Wang, F.
et al.
Source:
Yaran Li
via
Scopus - Elsevier
Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams
2018
|
Journal article
EID:
2-s2.0-85063664161
Contributors:
Li, Y.;
Xie, Q.;
Chen, Z.;
Xin, Q.;
Mu, B.
Source:
Yaran Li
via
Scopus - Elsevier
Applied Optics
2017
|
Journal article
EID:
2-s2.0-85018501695
Contributors:
Li, Y.;
Mu, B.;
Xie, Q.;
He, Y.;
Chen, Z.;
Wang, Z.;
Cao, Z.;
Dong, J.;
Liu, S.;
Ding, Y.
Source:
Yaran Li
via
Scopus - Elsevier
Optics Express
2017
|
Journal article
EID:
2-s2.0-85011632653
Contributors:
Xie, Q.;
Mu, B.;
Li, Y.;
Wang, X.;
Huang, Q.;
Wang, Z.;
Cao, Z.;
Dong, J.;
Liu, S.;
Ding, Y.
Source:
Yaran Li
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2016
|
Conference paper
EID:
2-s2.0-85010711861
Contributors:
Xie, Q.;
Mu, B.;
Li, Y.;
Huang, Q.;
Wang, Z.;
Cao, Z.;
Dong, J.;
Liu, S.;
Ding, Y.
Source:
Yaran Li
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2016
|
Conference paper
EID:
2-s2.0-85010720935
Contributors:
Li, Y.;
Mu, B.;
Xie, Q.;
Wang, X.;
Wang, Z.
Source:
Yaran Li
via
Scopus - Elsevier