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Works (18)

A relation model between integrated circuit yield and reliability based on the defect's uniform distribution

Tien Tzu Hsueh Pao/Acta Electronica Sinica
2012 | Journal article
DOI:

10.3969/j.issn.0372-2112.2012.08.027

Contributors: Zhao, T.-X.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Analysis of coupling capacitance among interconnections based on defect's uniform distribution

Jisuanji Xuebao/Chinese Journal of Computers
2009 | Journal article
DOI:

10.3724/SP.J.1016.2009.01147

Contributors: Duan, X.-C.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Analysis to interconnect lifetime affected by integrated circuit manufacturing defect

Jisuanji Xuebao/Chinese Journal of Computers
2006 | Journal article
Contributors: Zhao, T.-X.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Estimation of early-life reliability based on integrated-circuit yield model

Tien Tzu Hsueh Pao/Acta Electronica Sinica
2005 | Journal article
Contributors: Zhao, T.-X.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

A new estimation model of IC interconnect lifetime based on uniform defect distribution model

Chinese Journal of Electronics
2004 | Journal article
Contributors: Zhao, T.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Novel optimal model of and the solution to the layer yield of IC's

Xi'an Dianzi Keji Daxue Xuebao/Journal of Xidian University
2004 | Journal article
Contributors: Jing, M.-E.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Advanced SiC semiconductor devices and their applications

Xi'an Dianzi Keji Daxue Xuebao/Journal of Xidian University
2002 | Journal article
Contributors: Zhang, J.-C.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Study of critical area extraction for soft fault of opens

Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
2002 | Journal article
Contributors: Chen, T.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Y/R model of integrated circuits based on the open circuit fault of interconnections

Tien Tzu Hsueh Pao/Acta Electronica Sinica
2002 | Journal article
Contributors: Zhao, T.-X.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Method for VLSI yield optimization design based on the sub-processing-element level redundancy

Xi'an Dianzi Keji Daxue Xuebao/Journal of Xidian University
2001 | Journal article
Contributors: Zhao, T.X.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Relation between reliability and yield of IC's based on discrete defect distribution model

IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
2001 | Journal article
Contributors: Zhao, T.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Relation between reliability and yield of IC's based on discrete model

Tien Tzu Hsueh Pao/Acta Electronica Sinica
2001 | Journal article
Contributors: Zhao, T.-X.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Reliability model of IC interconnect based on defect distribution statistics

Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
2001 | Journal article
Contributors: Chen, T.-F.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

VLSI yield optimization based on the redundancy at the sub-processing-element level

IEICE Transactions on Information and Systems
2001 | Journal article
Contributors: Zhao, T.
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

VLSI yield optimization based on the sub-processing-element level redundancy

IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
2000 | Journal article
Contributors: Zhao, Tianxu
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Correlation analysis and modeling on device model parameters

Tien Tzu Hsueh Pao/Acta Electronica Sinica
1999 | Journal article
Contributors: Hao, Yue
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

New approach to model the IC defect outlines

Tien Tzu Hsueh Pao/Acta Electronica Sinica
1999 | Journal article
Contributors: Jiang, Xiaohong
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier

Three-D fault-tolerant structure and yield analysis of VLSI circuit

Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
1999 | Journal article
Contributors: Zhao, Tianxu
Source: Self-asserted source
Tianxu Zhao via Scopus - Elsevier