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Scopus Author ID: 55579864500

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Tianjin University: Tianjin, CN

Employment
Source: Self-asserted source
Zongwei Xu

Works (50 of 103)

Items per page:
Page 1 of 3

Enhancement of fluorescence collection efficiency of silicon carbide color center via femtosecond laser fabrication of internal micro-optical structures

Optics & Laser Technology
2025-08 | Journal article
DOI: 10.1016/j.optlastec.2025.112661
Contributors: Bing Dong; Qingqing Sun; Jianshi Wang; Ying Song; Fei Ren; Zongwei Xu
Source: check_circle
Crossref

Fabrication of silicon carbide color center nanoparticles by femtosecond laser ablation in liquid

Ceramics International
2024-12 | Journal article
DOI: 10.1016/j.ceramint.2024.10.021
Contributors: Jianshi Wang; Bing Dong; Ying Song; Mengzhi Yan; Qingqing Sun; Zongwei Xu
Source: check_circle
Crossref

First-principles study of electron dynamics of MoS2 under femtosecond laser irradiation from deep ultraviolet to near-infrared wavelengths

The Journal of Chemical Physics
2024-12-14 | Journal article
DOI: 10.1063/5.0232520
Contributors: Huimin Qi; Jinshi Wang; Zongwei Xu; Fengzhou Fang
Source: check_circle
Crossref

Crater-shaped enrichment of VSi color centers in 4H-SiC using single-pulse near-infrared femtosecond laser processing

Applied Physics Letters
2024-12-09 | Journal article
DOI: 10.1063/5.0231271
Contributors: Mengzhi Yan; Junlei Zhao; Ying Song; Bing Dong; Yifei Duan; Jianshi Wang; Qingqing Sun; Zongwei Xu
Source: check_circle
Crossref

Femtosecond laser controllable annealing for color centers based on ion-implanted silicon carbide substrate

Ceramics International
2024-11 | Journal article
DOI: 10.1016/j.ceramint.2024.09.009
Contributors: Jianshi Wang; Ying Song; Bing Dong; Yukun Zhao; Qingqing Sun; Mengzhi Yan; Chengqi Yao; Quanbin Du; Zongwei Xu
Source: check_circle
Crossref

Molecular dynamics simulation study of nitrogen vacancy color centers prepared by carbon ion implantation into diamond

Nanotechnology and Precision Engineering
2024-09-01 | Journal article
DOI: 10.1063/10.0025756
Contributors: Wei Zhao; Zongwei Xu; Pengfei Wang; Hanyi Chen
Source: check_circle
Crossref

An Integrated Solution to FIB-Induced Hydride Artifacts in Pure Zirconium

Micromachines
2024-08-01 | Journal article
DOI: 10.3390/mi15080999
Contributors: Yi Qiao; Zongwei Xu; Shilei Li; Fu Wang; Yubo Huang
Source: check_circle
Crossref
grade
Preferred source (of 2)‎

Silicon Vacancy Color Centers in 6H-SiC Fabricated by Femtosecond Laser Direct Writing

Nanomanufacturing and Metrology
2023-12 | Journal article
DOI: 10.1007/s41871-023-00186-6
Contributors: Zhanqi Zhou; Zongwei Xu; Ying Song; Changkun Shi; Kun Zhang; Bing Dong
Source: check_circle
Crossref

Probing the thermally driven response of Raman-active phonon modes in sapphire single crystals by in situ Raman spectroscopy

Ceramics International
2023-10 | Journal article
DOI: 10.1016/j.ceramint.2023.08.018
Contributors: Zhixiang Tao; Ying Song; Zongwei Xu
Source: check_circle
Crossref

On the interpretation of confocal spectral depth profiling of color center and carrier concentration by photoluminescence and Raman of implanted 4H–SiC

Ceramics International
2023-05 | Journal article
DOI: 10.1016/j.ceramint.2022.12.214
Contributors: Ying Song; Zongwei Xu; Mathias Rommel
Source: check_circle
Crossref

Raman investigation of lattice anharmonicity and substrate-induced effects in AlN heteroepilayers

Ceramics International
2023-05 | Journal article
DOI: 10.1016/j.ceramint.2023.01.007
Contributors: Zhixiang Tao; Ying Song; Li Zhang; Zongwei Xu
Source: check_circle
Crossref

Process exploration of β-Ga2O3 blind hole processing by water-assisted femtosecond laser technology

Journal of Alloys and Compounds
2023-04 | Journal article
DOI: 10.1016/j.jallcom.2023.168769
Contributors: Kun Zhang; Zongwei Xu; Bing Dong; Shengnan Zhang
Source: check_circle
Crossref

Divacancy and silicon vacancy color centers in 4H-SiC fabricated by hydrogen and dual ions implantation and annealing

Ceramics International
2023-03 | Journal article
DOI: 10.1016/j.ceramint.2022.10.219
Contributors: Tianze Sun; Zongwei Xu; Jintong Wu; Yexin Fan; Fei Ren; Ying Song; Long Yang; Pingheng Tan
Source: check_circle
Crossref

Patterning the surface structure of transparent hard-brittle material β-Ga2O3 by ultrashort pulse laser

Ceramics International
2022-10 | Journal article
DOI: 10.1016/j.ceramint.2022.06.061
Contributors: Kun Zhang; Zongwei Xu; Hong Wang; Shengnan Zhang; Bing Dong
Source: check_circle
Crossref

MD simulation study on defect evolution and doping efficiency of p-type doping of 3C-SiC by Al ion implantation with subsequent annealing

Journal of Materials Chemistry C
2021 | Journal article
DOI: 10.1039/D0TC05374K
Contributors: Jintong Wu; Zongwei Xu; Lei Liu; Alexander Hartmaier; Mathias Rommel; Kai Nordlund; Tao Wang; Rebecca Janisch; Junlei Zhao
Source: check_circle
Crossref

Single-Wedge Lift-Out for Atom Probe Tomography Al/Ni Multilayers Specimen Preparation Based on Dual-Beam-FIB

Micromachines
2021-12-27 | Journal article
DOI: 10.3390/mi13010035
Contributors: Yi Qiao; Yalong Zhao; Zheng Zhang; Binbin Liu; Fusheng Li; Huan Tong; Jintong Wu; Zhanqi Zhou; Zongwei Xu; Yue Zhang
Source: check_circle
Crossref
grade
Preferred source (of 2)‎

Molecular dynamics simulation of color centers in silicon carbide by helium and dual ion implantation and subsequent annealing

Ceramics International
2021-09 | Journal article
DOI: 10.1016/j.ceramint.2021.05.172
Contributors: Yexin Fan; Ying Song; Zongwei Xu; Bing Dong; Jintong Wu; Mathias Rommel; Kun Zhang; Junlei Zhao; Rui Zhu; Bingsheng Li et al.
Source: check_circle
Crossref

Interfacial stress characterization of GaN epitaxial layer with sapphire substrate by confocal Raman spectroscopy

Nanotechnology and Precision Engineering
2021-06-01 | Journal article
DOI: 10.1063/10.0003818
Contributors: Zengqi Zhang; Zongwei Xu; Ying Song; Tao Liu; Bing Dong; Jiayu Liu; Hong Wang
Source: check_circle
Crossref

Crystal anisotropy-dependent shear angle variation in orthogonal cutting of single crystalline copper

Precision Engineering
2020 | Journal article
DOI: 10.1016/j.precisioneng.2020.01.006
EID:

2-s2.0-85078755440
Contributors: Wang, Z.; Zhang, J.; Xu, Z.; Zhang, J.; Li, G.; Zhang, H.; Li, Z.; Hassan, H.U.; Fang, F.; Hartmaier, A. et al.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Effect of ion implantation on material removal mechanism of 6H-SiC in nano-cutting: A molecular dynamics study

Computational Materials Science
2020 | Journal article
DOI: 10.1016/j.commatsci.2019.109476
EID:

2-s2.0-85076345030
Contributors: Liu, B.; Xu, Z.; Wang, Y.; Gao, X.; Kong, R.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Nanocutting mechanism of 6H-SiC investigated by scanning electron microscope online observation and stress-assisted and ion implant-assisted approaches

International Journal of Advanced Manufacturing Technology
2020 | Journal article
DOI: 10.1007/s00170-019-04886-6
EID:

2-s2.0-85077685579
Contributors: Xu, Z.; Liu, L.; He, Z.; Tian, D.; Hartmaier, A.; Zhang, J.; Luo, X.; Rommel, M.; Nordlund, K.; Zhang, G. et al.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Depth Profiling of Ion-Implanted 4H–SiC Using Confocal Raman Spectroscopy

Crystals
2020-02 | Journal article | Author
DOI: 10.3390/cryst10020131
Contributors: Ying Song; Zongwei Xu; Tao Liu; Mathias Rommel; Hong Wang; Yufang Wang; Fengzhou Fang
Source: check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source (of 3)‎

A hybrid laser ablation and chemical etching process for manufacturing nature-inspired anisotropic superhydrophobic structures

European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 19th International Conference and Exhibition, EUSPEN 2019
2019 | Conference paper
EID:

2-s2.0-85070947457
Contributors: Cai, Y.; Luo, X.; Xu, Z.; Lau, K.H.A.; Ding, F.; Qin, Y.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Crystal plasticity finite element modeling and simulation of diamond cutting of polycrystalline copper

Journal of Manufacturing Processes
2019 | Journal article
DOI: 10.1016/j.jmapro.2019.01.007
EID:

2-s2.0-85059659936
Contributors: Wang, Z.; Zhang, J.; Xu, Z.; Zhang, J.; Hassan, H.U.; Li, G.; Zhang, H.; Hartmaier, A.; Fang, F.; Yan, Y. et al.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Determination of compensation ratios of al-implanted 4H-SIC by tcad modelling of TLM measurements

Materials Science Forum
2019 | Book
DOI: 10.4028/www.scientific.net/MSF.963.445
EID:

2-s2.0-85071845897
Contributors: Kocher, M.; Yao, B.; Weisse, J.; Rommel, M.; Xu, Z.W.; Erlbacher, T.; Bauer, A.J.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Effect of tool edge radius on material removal mechanism of single-crystal silicon: Numerical and experimental study

Computational Materials Science
2019 | Journal article
DOI: 10.1016/j.commatsci.2019.03.025
EID:

2-s2.0-85063320228
Contributors: Liu, B.; Xu, Z.; Chen, C.; Pang, K.; Wang, Y.; Ruan, Q.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Electron paramagnetic resonance characterization of aluminum ion implantationinduced defects in 4H-SiC

Nami Jishu yu Jingmi Gongcheng/Nanotechnology and Precision Engineering
2019 | Journal article
EID:

2-s2.0-85078029328
Contributors: Wang, X.; Xu, Z.; Rommel, M.; Dong, B.; Song, L.; Tee, C.A.T.; Fang, F.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

In situ experimental study on material removal behaviour of single-crystal silicon in nanocutting

International Journal of Mechanical Sciences
2019 | Journal article
DOI: 10.1016/j.ijmecsci.2019.01.015
EID:

2-s2.0-85059800295
Contributors: Liu, B.; Xu, Z.; Chen, C.; Li, R.; Wang, C.; Yang, X.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

In-situ experiment on critical thickness of brittle-ductile transition of single-crystal silicon,单晶硅脆塑转变临界厚度的原位实验

Gongcheng Kexue Xuebao/Chinese Journal of Engineering
2019 | Journal article
DOI: 10.13374/j.issn2095-9389.2019.03.007
EID:

2-s2.0-85066139701
Contributors: Liu, B.; Xu, Z.-W.; Li, R.; He, Z.-D.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

MD simulation of stress-assisted nanometric cutting mechanism of 3C silicon carbide

Industrial Lubrication and Tribology
2019 | Journal article
DOI: 10.1108/ILT-03-2019-0096
EID:

2-s2.0-85069522348
Contributors: Liu, L.; Xu, Z.; Tian, D.; Hartmaier, A.; Luo, X.; Zhang, J.; Nordlund, K.; Fang, F.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Molecular dynamics simulation of helium ion implantation into silicon and its migration

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
2019 | Journal article
DOI: 10.1016/j.nimb.2019.06.034
EID:

2-s2.0-85068516228
Contributors: Liu, L.; Xu, Z.; Li, R.; Zhu, R.; Xu, J.; Zhao, J.; Wang, C.; Nordlund, K.; Fu, X.; Fang, F.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Molecular dynamics simulation of silicon ion implantation into diamond and subsequent annealing

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
2019 | Journal article
DOI: 10.1016/j.nimb.2018.04.027
EID:

2-s2.0-85046134600
Contributors: Fu, X.; Xu, Z.; He, Z.; Hartmaier, A.; Fang, F.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Nanofabrication of nitrogen-vacancy color center

Current Nanoscience
2019 | Journal article
DOI: 10.2174/157341371505190617141920
EID:

2-s2.0-85071029771
Contributors: Luo, H.; Xu, Z.; Shi, C.; Hu, M.; Sun, F.; Shang, L.; Fang, F.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Nitrogen-vacancy color centers in diamond fabricated by ultrafast laser nanomachining

Springer Tracts in Mechanical Engineering
2019 | Book chapter
DOI: 10.1007/978-981-13-3335-4_11
EID:

2-s2.0-85060127864
Contributors: Shi, C.; Luo, H.; Xu, Z.; Fang, F.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Raman characterization of carrier concentrations of al-implanted 4H-SIC with low carrier concentration by photo-generated carrier effect

Crystals
2019 | Journal article
DOI: 10.3390/cryst9080428
EID:

2-s2.0-85073279789
Contributors: Liu, T.; Xu, Z.; Rommel, M.; Fang, F.; Wang, H.; Song, Y.; Wang, Y.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Raman spectroscopy characterization of ion implanted 4H-SiC and its annealing effects

Materials Science Forum
2019 | Book
DOI: 10.4028/www.scientific.net/MSF.963.424
EID:

2-s2.0-85071872732
Contributors: Xu, Z.W.; Song, Y.; Rommel, M.; Liu, T.; Kocher, M.; He, Z.D.; Wang, H.; Yao, B.T.; Liu, L.; Fang, F.Z.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Surface- and tip-enhanced Raman scattering in tribology and Lubricant detection-a prospective

Lubricants
2019 | Journal article
DOI: 10.3390/lubricants7090081
EID:

2-s2.0-85073100086
Contributors: Zhang, K.; Xu, Z.; Rosenkranz, A.; Song, Y.; Xue, T.; Fang, F.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Surface-enhanced Raman scattering on nanodiamond-derived carbon onions

Nami Jishu yu Jingmi Gongcheng/Nanotechnology and Precision Engineering
2019 | Journal article
EID:

2-s2.0-85072580910
Contributors: Song, Y.; Xu, Z.; Rosenkranz, A.; Rommel, M.; Shi, C.; Fang, F.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

A Simplified and Cost-Effective Optical Absorber and Corresponding Photo-Thermal Effect

Plasmonics
2018 | Journal article
DOI: 10.1007/s11468-017-0508-2
EID:

2-s2.0-85010715402
Contributors: Zhang, L.; You, Y.; Fu, Y.; Xu, Z.; Fang, F.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Experimental study on size effect of tool edge and subsurface damage of single crystal silicon in nano-cutting

International Journal of Advanced Manufacturing Technology
2018 | Journal article
DOI: 10.1007/s00170-018-2310-5
EID:

2-s2.0-85048636352
Contributors: Liu, B.; Fang, F.; Li, R.; Xu, Z.; Liang, Y.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Study on SERS Substrates Fabricated by Spin Self-Assembly Colloidal Nanospheres,旋涂自组装胶体纳米球制备SERS基底的研究

Nami Jishu yu Jingmi Gongcheng/Nanotechnology and Precision Engineering
2018 | Journal article
DOI: 10.13494/j.npe.20170026
EID:

2-s2.0-85058785085
Contributors: Chen, J.; Pei, J.; Xu, Z.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Topic review: Application of raman spectroscopy characterization in micro/nano-machining

Micromachines
2018 | Journal article
DOI: 10.3390/mi9070361
EID:

2-s2.0-85056085453
Contributors: Xu, Z.; He, Z.; Song, Y.; Fu, X.; Rommel, M.; Luo, X.; Hartmaier, A.; Zhang, J.; Fang, F.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

A Cutting Force Detection Method Based on SEM Online Nanometric Cutting

Tianjin Daxue Xuebao (Ziran Kexue yu Gongcheng Jishu Ban)/Journal of Tianjin University Science and Technology
2017 | Journal article
DOI: 10.11784/tdxbz201606009
EID:

2-s2.0-85031711240
Contributors: Xu, Z.; Liu, L.; Jia, R.; Guo, C.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Nanometric cutting of monocrystalline silicon based on EBSD technique

Tianjin Daxue Xuebao (Ziran Kexue yu Gongcheng Jishu Ban)/Journal of Tianjin University Science and Technology
2017 | Journal article
DOI: 10.11784/tdxbz201509015
EID:

2-s2.0-85017552497
Contributors: Xu, Z.; Zhao, B.; Liu, H.; Liu, B.; Guo, C.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Research Status of Surface Enhanced Raman Scattering Substrate Fabrication,表面增强拉曼散射基底制造方法的研究现状

Nami Jishu yu Jingmi Gongcheng/Nanotechnology and Precision Engineering
2017 | Journal article
DOI: 10.13494/j.npe.20140105
EID:

2-s2.0-85056230870
Contributors: Xu, Z.; Li, K.; Pei, J.; Song, Y.; Gao, T.; Wang, L.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

A review on colloidal self-assembly and their applications

Current Nanoscience
2016 | Journal article
DOI: 10.2174/1573413712666160530120807
EID:

2-s2.0-84995948344
Contributors: Xu, Z.; Wang, L.; Fang, F.; Fu, Y.; Yin, Z.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Recent developments in focused ion beam and its application in nanotechnology

Current Nanoscience
2016 | Journal article
DOI: 10.2174/1573413712666160530115305
EID:

2-s2.0-84995920357
Contributors: Xu, Z.; Fu, Y.; Han, W.; Wei, D.; Jiao, H.; Gao, H.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Removal of nanoscale damage induced by FIB nanofabrication on single-crystal diamond using femtosecond laser treatment

Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016
2016 | Conference paper
EID:

2-s2.0-84984598123
Contributors: Xu, Z.; Fang, F.; Wu, W.; Li, W.; He, S.; Hu, M.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Review on FIB-induced damage in diamond materials

Current Nanoscience
2016 | Journal article
DOI: 10.2174/1573413712666160530105707
EID:

2-s2.0-84995877400
Contributors: Tong, Z.; Jiang, X.; Luo, X.; Bai, Q.; Xu, Z.; Blunt, L.; Liang, Y.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier

Annealing recovery of nanoscale silicon surface damage caused by Ga focused ion beam

Applied Surface Science
2015 | Journal article
DOI: 10.1016/j.apsusc.2015.03.059
EID:

2-s2.0-84928790634
Contributors: Xiao, Y.J.; Fang, F.Z.; Xu, Z.W.; Hu, X.T.
Source: Self-asserted source
Zongwei Xu via Scopus - Elsevier
Items per page:
Page 1 of 3

Peer review (18 reviews for 13 publications/grants)

Review activity for Applied physics letters. (3)
Review activity for Ceramics international. (3)
Review activity for Computational materials science. (1)
Review activity for Journal of alloys and compounds. (1)
Review activity for Journal of crystal growth. (1)
Review activity for Journal of manufacturing processes. (2)
Review activity for Journal of Materials Research and Technology. (1)
Review activity for Materials characterization. (1)
Review activity for Measurement. (1)
Review activity for Nanomanufacturing and metrology. (1)
Review activity for Optical materials. (1)
Review activity for Optics and Laser Technology. (1)
Review activity for Vacuum. (1)
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