Personal information

Activities

Works (6)

A Method for Accelerated Aging Tests of Power Modules for Photovoltaic Inverters Considering the Inverter Mission Profiles

IEEE Transactions on Power Electronics
2019 | Journal article
EID:

2-s2.0-85072262491

Part of ISSN: 19410107 08858993
Contributors: Dbeiss, M.; Avenas, Y.; Zara, H.; Dupont, L.; Shakarchi, F.A.
Source: Self-asserted source
Lucas, Mouhannad Dbeiss via Scopus - Elsevier

Power semiconductor ageing test bench dedicated to photovoltaic applications

IEEE Transactions on Industry Applications
2019 | Journal article
EID:

2-s2.0-85064938397

Part of ISSN: 19399367 00939994
Contributors: Dbeiss, M.; Avenas, Y.
Source: Self-asserted source
Lucas, Mouhannad Dbeiss via Scopus - Elsevier

In-situ condition monitoring system to study the ageing of power semiconductor devices in photovoltaic inverters

CIPS 2018 - 10th International Conference on Integrated Power Electronics Systems
2018 | Conference paper
EID:

2-s2.0-85096562586

Part of ISBN: 9783800745401
Contributors: Dbeiss, M.; Avenas, Y.; Zara, H.; Dupont, L.
Source: Self-asserted source
Lucas, Mouhannad Dbeiss via Scopus - Elsevier

Power semiconductor ageing test bench dedicated to photovoltaic applications

Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
2018 | Conference paper
EID:

2-s2.0-85046944679

Part of ISBN: 9781538611807
Contributors: Dbeiss, M.; Avenas, Y.
Source: Self-asserted source
Lucas, Mouhannad Dbeiss via Scopus - Elsevier

A method for accelerated ageing tests of photovoltaic inverters considering the application’s mission profiles

2017 19th European Conference on Power Electronics and Applications, EPE 2017 ECCE Europe
2017 | Conference paper
EID:

2-s2.0-85042153086

Part of ISBN: 9789075815276
Contributors: Dbeiss, M.G.; Avenas, Y.; Zara, H.; Dupont, L.
Source: Self-asserted source
Lucas, Mouhannad Dbeiss via Scopus - Elsevier

Comparison of the electro-thermal constraints on SiC MOSFET and Si IGBT power modules in photovoltaic DC/AC inverters

Microelectronics Reliability
2017 | Journal article
EID:

2-s2.0-85032202696

Part of ISSN: 00262714
Contributors: Dbeiss, M.; Avenas, Y.; Zara, H.
Source: Self-asserted source
Lucas, Mouhannad Dbeiss via Scopus - Elsevier