Personal information
Semiconducting materials, Thin films, Metal Oxides, Nanomaterials, Materials characterization,
Egypt
Activities
Employment (2)
2009
to
present
|
Researcher
(Solid state physics)
Employment
Source:
Mohammed M. Gomaa
2016-04-04
to
2018-04
|
visiting researcher
(Department of Physics, Chemistry and Biology)
Employment
Source:
Mohammed M. Gomaa
Education and qualifications (3)
2018
|
Ph.D., Preparation and characterization of P-type transparent semiconductor oxide thin Films
Education
Source:
Mohammed M. Gomaa
2012
|
M.Sc., Studying the effect of nanosized laser controlled on some physical properties of cobalt salts thin films
(National Institute of Laser Enhanced Science (NILS), Cairo university)
Education
Source:
Mohammed M. Gomaa
2002
|
B.Sc
(Chemistry and Physics)
Education
Source:
Mohammed M. Gomaa
Works (22)
Journal of Photochemistry and Photobiology A: Chemistry
2025-01
|
Journal article
Contributors:
Mohamed H. Sayed;
Mohammed M. Gomaa;
Tomáš Imrich;
Roman Nebel;
Michael Neumann-Spallart;
Josef Krýsa;
Hana Krýsová;
Mostafa Boshta
Source:
Mohammed M. Gomaa
Materials Advances
2024
|
Journal article
Contributors:
Mohamed H. Sayed;
Tina Dilova;
Genoveva Atanasova;
Georgi Avdeev;
Mostafa Boshta;
Anna Og. Dikovska;
Mohammed M. Gomaa
Source:
check_circle
Crossref
RSC Advances
2024
|
Journal article
Contributors:
Dina A. El Mously;
Amr M. Mahmoud;
Mohammed M. Gomaa;
Hend Z. Yamani
Source:
check_circle
Crossref
OpenAlex
2024-01-03
|
Other
Contributors:
M. Boshta;
Mohammed M. Gomaa;
M.H. Sayed;
Hagar Mohamed;
А. Shengelaya;
Ekaterine Chikoidze;
Yves DUMONT;
M. Neumann‐Spallart
Source:
check_circle
DataCite
OpenAlex
2024-01-03
|
Other
Contributors:
M. Boshta;
Mohammed M. Gomaa;
M.H. Sayed;
Hagar Mohamed;
А. Shengelaya;
Ekaterine Chikoidze;
Yves DUMONT;
M. Neumann‐Spallart
Source:
check_circle
DataCite
grade
Preferred source
(of
2)
RSC Advances
2023
|
Journal article
Contributors:
Mohammed M. Gomaa;
Mohamed H. Sayed;
Mahmoud S. Abdel-Wahed;
Mostafa Boshta
Source:
check_circle
Crossref
Advanced Materials Interfaces
2023-12-21
|
Journal article
Contributors:
Yuanju Qu;
Mohammed M. Gomaa;
Mohamed H. Sayed;
Mostafa Boshta;
Grzegorz Greczynski;
Rositsa Yakimova;
Jianwu Sun
Source:
Mohammed M. Gomaa
Emergent Materials
2023-09-27
|
Journal article
Contributors:
M.H. Sayed;
M.M. Gomaa;
W.H. Eisa;
M. Boshta
Source:
Mohammed M. Gomaa
Results in Optics
2023-08
|
Journal article
Contributors:
Mohamed H. Sayed;
Mohammed M. Gomaa;
Mostafa Boshta
Source:
Mohammed M. Gomaa
Analytical and Bioanalytical Chemistry
2023-06-30
|
Journal article
Contributors:
Hend Z. Yamani;
Nardine Safwat;
Amr M. Mahmoud;
Miriam F. Ayad;
Maha F. Abdel-Ghany;
Mohammed M. Gomaa
Source:
Mohammed M. Gomaa
ECS Journal of Solid State Science and Technology
2023-02-01
|
Journal article
Contributors:
M.M. Gomaa;
M.H. Sayed;
M. Boshta
Source:
check_circle
Crossref
Source:
Mohammed M. Gomaa
grade
Preferred source
(of
2)
Emergent Materials
2022-06-02
|
Journal article
Source:
Mohammed M. Gomaa
Solid State Communications
2022-02
|
Journal article
Contributors:
M.M. Gomaa;
M.H. Sayed;
A.M. Abo El-Soud;
M. Boshta
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
Journal of Alloys and Compounds
2021-12
|
Journal article
Source:
Mohammed M. Gomaa
grade
Preferred source
(of
2)
Materials Science in Semiconductor Processing
2020
|
Journal article
EID:
2-s2.0-85078135049
Contributors:
Gomaa, M.M.;
Sayed, M.H.;
Chikoidze, E.;
Dumont, Y.;
Boshta, M.
Source:
Mohammed M. Gomaa
via
Scopus - Elsevier
Journal of Materials Science-Materials in Electronics
2018
|
Journal article
WOSUID:
WOS:000435671800028
Contributors:
Gomaa, M. M.;
RezaYazdi, G.;
Rodner, M.;
Greczynski, G.;
Boshta, M.;
Osman, M. B. S.;
Khranovskyy, V.;
Eriksson, J.;
Yakimova, R.
Source:
Mohammed M. Gomaa
via
ResearcherID
grade
Preferred source
(of
2)
Materials Technology
2017
|
Journal article
EID:
2-s2.0-84978499651
Contributors:
Boshta, M.;
Binetti, S.;
Le Donne, A.;
Gomaa, M.;
Acciarri, M.
Source:
Mohammed M. Gomaa
via
Scopus - Elsevier
Materials Science in Semiconductor Processing
2017
|
Journal article
WOSUID:
WOS:000401092800007
Contributors:
Gomaa, M. M.;
Yazdi, G. Reza;
Schmidt, Susann;
Boshta, M.;
Khranovskyy, V.;
Eriksson, F.;
Farag, B. S.;
Osman, M. B. S.;
Yakimova, R.
Source:
Mohammed M. Gomaa
via
ResearcherID
grade
Preferred source
(of
2)
Journal of Physics D-Applied Physics
2016
|
Journal article
WOSUID:
WOS:000375255800015
Contributors:
Chikoidze, E.;
Boshta, M.;
Gomaa, M.;
Tchelidze, T.;
Daraselia, D.;
Japaridze, D.;
Shengelaya, A.;
Dumont, Y.;
Neumann-Spallart, M.
Source:
Mohammed M. Gomaa
via
ResearcherID
grade
Preferred source
(of
2)
Physical Review B
2016
|
Journal article
WOSUID:
WOS:000390250500004
Contributors:
Papierska, J.;
Ciechan, A.;
Boguslawski, P.;
Boshta, M.;
Gomaa, M. M.;
Chikoidze, E.;
Dumont, Y.;
Drabinska, A.;
Przybylinska, H.;
Gardias, A.
et al.
Source:
Mohammed M. Gomaa
via
ResearcherID
grade
Preferred source
(of
2)
Journal of Materials Science-Materials in Electronics
2016
|
Journal article
WOSUID:
WOS:000368054600093
Contributors:
Gomaa, M. M.;
Boshta, M.;
Farag, B. S.;
Osman, M. B. S.
Source:
Mohammed M. Gomaa
via
ResearcherID
grade
Preferred source
(of
2)