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Education and qualifications (1)

Georgia Institute of Technology: Atlanta, GA, US

2019-01 | Ph.D. (Mechanical Engineering)
Education
Source: Self-asserted source
David B. Brown

Works (6)

A variational method for the sheath potential of hypersonic leading edges with space-charge limitations

Physics of Plasmas
2024-10-01 | Journal article
DOI: 10.1063/5.0222634
Part of ISSN: 1070-664X
Part of ISSN: 1089-7674
Contributors: Nasr Ghoniem; David B. Brown; Yue Huang
Source: Self-asserted source
David B. Brown

Thermal Boundary Conductance and Phonon Transmission in Hexagonal Boron Nitride/Graphene Heterostructures

physica status solidi (a)
2019-12 | Journal article | Author
DOI: 10.1002/pssa.201900446
Part of ISSN: 1862-6300
Part of ISSN: 1862-6319
Contributors: David B. Brown; Thomas L. Bougher; Xiang Zhang; Pulickel M. Ajayan; Baratunde A. Cola; satish kumar
Source: Self-asserted source
David B. Brown

Spatial Mapping of Thermal Boundary Conductance at Metal–Molybdenum Diselenide Interfaces

ACS Applied Materials & Interfaces
2019-04-17 | Journal article | Author
DOI: 10.1021/acsami.8b22702
Part of ISSN: 1944-8244
Part of ISSN: 1944-8252
Contributors: David B. Brown; Wenqing Shen; Xufan Li; Kai Xiao; David B. Geohegan; Satish Kumar
Source: Self-asserted source
David B. Brown

Oxidation limited thermal boundary conductance at metal-graphene interface

Carbon
2018-11 | Journal article | Author
DOI: 10.1016/j.carbon.2018.08.002
Part of ISSN: 0008-6223
Contributors: David B. Brown; Thomas L. Bougher; Baratunde Cola; Satish Kumar
Source: Self-asserted source
David B. Brown

Silicon Nanowire Arrays Based On-Chip Thermoelectric Generators

IEEE Transactions on Components, Packaging and Manufacturing Technology
2015-08 | Journal article
DOI: 10.1109/tcpmt.2015.2450234
Part of ISSN: 2156-3950
Part of ISSN: 2156-3985
Contributors: KamYu Lee; David Brown; Satish Kumar
Source: Self-asserted source
David B. Brown

On the assessment of voids in the thermal interface material on the thermal performance of a silicon chip package

Microelectronics Reliability
2013-12 | Journal article
DOI: 10.1016/j.microrel.2013.05.006
Part of ISSN: 0026-2714
Contributors: Bladimir Ramos-Alvarado; David Brown; Xiuping Chen; Bo Feng; G.P. Peterson
Source: Self-asserted source
David B. Brown

Peer review (1 review for 1 publication/grant)

Review activity for ACS applied materials & interfaces. (1)
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