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Works (6)

A 1.8-V GPIO With Design-Technology-Reliability Co-Optimization in Sub-3-nm GAA-NS Technology

IEEE Journal of Solid-State Circuits
2025-02 | Journal article
DOI: 10.1109/JSSC.2024.3424264
Contributors: Wen-Chieh Chen; Shih-Hung Chen; Man-Ching Huang; Shu-Wei Chang; Geert Hellings; Guido Groeseneken
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Mechanism of Threshold Voltage Instability in Double Gate α-IGZO Nanosheet TFT Under Bias and Temperature Stress

IEEE Journal of the Electron Devices Society
2024 | Journal article
DOI: 10.1109/JEDS.2024.3406676
Contributors: Muhammad Aslam; Shu-Wei Chang; Yi-Ho Chen; Yao-Jen Lee; Yiming Li; Wen-Hsi Lee
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Temperature-Dependent Hydrogen Modulations of Ultra-Scaled a-IGZO Thin Film Transistor Under Gate Bias Stress

IEEE Open Journal of Nanotechnology
2024 | Journal article
DOI: 10.1109/OJNANO.2024.3386123
Contributors: Muhammad Aslam; Shu-Wei Chang; Min-Hui Chuang; Yi-Ho Chen; Yao-Jen Lee; Yiming Li
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Sub-μm Gate-All-Around-Like Amorphous-InGaZnO Transistors With Record-High fT of 2.09 GHz

IEEE Transactions on Electron Devices
2024-08 | Journal article
DOI: 10.1109/TED.2024.3421185
Contributors: Shu-Wei Chang; Hsin-Hui Hu; Chen-Wei Wu; Wen-Hsiang Lu; Wen-Hsi Lee; Yao-Jen Lee
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Temperature Dependent Anomalous Threshold Voltage Modulation of a-IGZO TFT by Incorporating Variant Gate Stresses

ECS Journal of Solid State Science and Technology
2024-06-03 | Journal article
DOI: 10.1149/2162-8777/ad52c1
Contributors: Muhammad Aslam; Shu-Wei Chang; Yi-Ho Chen; Yao-Jen Lee; Yiming Li; Wen-Hsi Lee
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Nanosheet-Compatible Complementary-Field Effect Transistor Logic Non-Volatile Memory Device

ECS Journal of Solid State Science and Technology
2022-09-01 | Journal article
DOI: 10.1149/2162-8777/ac8dbf
Contributors: Shu-Wei Chang; Yu-Ming Chang; Wen-Hsi Lee; Yao-Jen Lee; Darsen D. Lu
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