Personal information
Activities
Employment (2)
2015-10-01
to
present
|
PostDoc
(Department of Materials Science and Engineering)
Employment
Source:
Carl Wadell
2010-04-19
to
2015-04-28
|
PhD Student
(Applied Physics)
Employment
Source:
Carl Wadell
Education and qualifications (4)
2010-04
to
2015-04
|
PhD
(Physics)
Education
Source:
Carl Wadell
2010-04
to
2012-12
|
LicEng
(Physics)
Education
Source:
Carl Wadell
2008-08
to
2010-04
|
MSc
(Applied Physics)
Education
Source:
Carl Wadell
2005-08
to
2008-08
|
BSc
(Engineering Physics)
Education
Source:
Carl Wadell
Works (19)
ACS Photonics
2018-12-19
|
Journal article
Contributors:
Taeko Matsukata;
Carl Wadell;
Nikolaos Matthaiakakis;
Naoki Yamamoto;
Takumi Sannomiya
Source:
check_circle
Crossref
ACS Photonics
2018-07-18
|
Journal article
Contributors:
Zac Thollar;
Carl Wadell;
Taeko Matsukata;
Naoki Yamamoto;
Takumi Sannomiya
Source:
check_circle
Crossref
The Journal of Physical Chemistry C
2017-12-07
|
Journal article
Contributors:
Carl Wadell;
Akira Yasuhara;
Takumi Sannomiya
Source:
check_circle
Crossref
ACS Nano
2017-02-28
|
Journal article
Contributors:
Carl Wadell;
Satoshi Inagaki;
Tomiro Nakamura;
Ji Shi;
Yoshio Nakamura;
Takumi Sannomiya
Source:
check_circle
Crossref
Optical Materials Express
2016
|
Journal article
EID:
2-s2.0-84964727985
Contributors:
Ohno, T.;
Wadell, C.;
Inagaki, S.;
Shi, J.;
Nakamura, Y.;
Matsushita, S.;
Sannomiya, T.
Source:
Carl Wadell
via
Scopus - Elsevier
ACS Sensors
2016-06
|
Journal article
Contributors:
Rickard Frost;
Carl Wadell;
Anders Hellman;
Sverker Molander;
Sofia Svedhem;
Michael Persson;
Christoph Langhammer
Source:
Carl Wadell
via
Crossref Metadata Search
Nanoscale
2015
|
Journal article
EID:
2-s2.0-84931416087
Contributors:
Wadell, C.;
Langhammer, C.
Source:
Carl Wadell
via
Scopus - Elsevier
Nature Materials
2015
|
Journal article
EID:
2-s2.0-84947868624
Contributors:
Syrenova, S.;
Wadell, C.;
Nugroho, F.A.A.;
Gschneidtner, T.A.;
Diaz Fernandez, Y.A.;
Nalin, G.;
͆witlik, D.;
Westerlund, F.;
Antosiewicz, T.J.;
Zhdanov, V.P.
et al.
Source:
Carl Wadell
via
Scopus - Elsevier
Nano Letters
2015
|
Journal article
EID:
2-s2.0-84929167814
Contributors:
Wadell, C.;
Nugroho, F.A.A.;
Lidström, E.;
Iandolo, B.;
Wagner, J.B.;
Langhammer, C.
Source:
Carl Wadell
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2015
|
Conference paper
EID:
2-s2.0-84943423966
Contributors:
Antosiewicz, T.J.;
Apell, S.P.;
Wadell, C.;
Langhammer, C.
Source:
Carl Wadell
via
Scopus - Elsevier
Advanced Optical Materials
2015
|
Journal article
EID:
2-s2.0-84954379470
Contributors:
Antosiewicz, T.J.;
Wadell, C.;
Langhammer, C.
Source:
Carl Wadell
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2014
|
Conference paper
EID:
2-s2.0-84919640608
Contributors:
Wadell, C.;
Syrenova, S.;
Langhammer, C.
Source:
Carl Wadell
via
Scopus - Elsevier
2014
|
Journal article
EID:
2-s2.0-84919725921
Contributors:
Wadell, C.;
Syrenova, S.;
Langhammer, C.
Source:
Carl Wadell
via
Scopus - Elsevier
2014
|
Journal article
EID:
2-s2.0-84900507283
Contributors:
Syrenova, S.;
Wadell, C.;
Langhammer, C.
Source:
Carl Wadell
via
Scopus - Elsevier
2014
|
Journal article
EID:
2-s2.0-84911946903
Contributors:
Diaz Fernandez, Y.A.;
Gschneidtner, T.A.;
Wadell, C.;
Fornander, L.H.;
Lara Avila, S.;
Langhammer, C.;
Westerlund, F.;
Moth-Poulsen, K.
Source:
Carl Wadell
via
Scopus - Elsevier
2014
|
Journal article
EID:
2-s2.0-84900426717
Contributors:
Wadell, C.;
Pingel, T.;
Olsson, E.;
Zorić, I.;
Zhdanov, V.P.;
Langhammer, C.
Source:
Carl Wadell
via
Scopus - Elsevier
2012
|
Journal article
EID:
2-s2.0-84866856952
Contributors:
Antosiewicz, T.J.;
Apell, S.P.;
Wadell, C.;
Langhammer, C.
Source:
Carl Wadell
via
Scopus - Elsevier
2012
|
Journal article
EID:
2-s2.0-84866334816
Contributors:
Wadell, C.;
Antosiewicz, T.J.;
Langhammer, C.
Source:
Carl Wadell
via
Scopus - Elsevier
2011
|
Journal article
EID:
2-s2.0-79951985020
Contributors:
Sjöström, J.;
Bergman, R.;
Wadell, C.;
Moberg, T.;
Swenson, J.;
Mattsson, J.
Source:
Carl Wadell
via
Scopus - Elsevier