Personal information
Activities
Employment (1)
Researcher (Academic)
(Centro Universitario de la Defensa)
Employment
Source:
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Universidad de Zaragoza
Works (27)
Sensors
2024-05-03
|
Journal article
Contributors:
José Antonio Albajez;
Jesús Velázquez;
Marta Torralba;
Lucía C. Díaz-Pérez;
José Antonio Yagüe-Fabra;
Juan José Aguilar
Source:
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Crossref
grade
Preferred source
(of
2)
Applied Sciences
2023-12-27
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Journal article
Contributors:
Raquel Acero;
Marta Torralba;
Emilio-David Valverde;
Lourdes Roc;
Antonio Rezusta
Source:
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Crossref
grade
Preferred source
(of
2)
Machines
2023-01-05
|
Journal article
Contributors:
Adrian Miqueo;
Marcos Gracia-Cadarso;
Marta Torralba;
Francisco Gil-Vilda;
José Antonio Yagüe-Fabra
Source:
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Crossref
grade
Preferred source
(of
2)
Processes
2023-01-05
|
Journal article
Contributors:
Adrian Miqueo;
José A. Yagüe-Fabra;
Marta Torralba;
María-José Oliveros;
Guido Tosello
Source:
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Crossref
grade
Preferred source
(of
2)
Applied Sciences
2020-11-29
|
Journal article
Contributors:
Adrian Miqueo;
Marta Torralba;
José A. Yagüe-Fabra
Source:
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Crossref
grade
Preferred source
(of
2)
Applied Sciences
2019-12
|
Journal article
|
Author
Contributors:
Raquel Acero;
Marta Torralba Gracia;
Roberto Pérez-Moya;
José Antonio Pozo
Source:
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Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
Applied Sciences
2019-11
|
Journal article
|
Author
Contributors:
Lucia Diaz Perez;
Marta Torralba Gracia;
Jose Antonio Albajez;
José Antonio Yagüe Fabra
Source:
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Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
Micromachines
2019-09-10
|
Journal article
Contributors:
Lucía Díaz Pérez;
Beatriz Rubio Serrano;
José A. Albajez García;
José A. Yagüe Fabra;
Esmeralda Mainar Maza;
Marta Torralba Gracia
Source:
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Crossref
Materials
2018
|
Journal article
EID:
2-s2.0-85051757562
Contributors:
Ontiveros, S.;
Jiménez, R.;
Yagüe-Fabra, J.A.;
Torralba, M.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
grade
Preferred source
(of
2)
International Journal of Advanced Manufacturing Technology
2018
|
Journal article
EID:
2-s2.0-85044786298
Contributors:
Torralba, M.;
Jiménez, R.;
Yagüe-Fabra, J.A.;
Ontiveros, S.;
Tosello, G.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Micromachines
2018-08-22
|
Journal article
Contributors:
Lucía Candela Díaz Pérez;
Marta Torralba Gracia;
José Antonio Albajez García;
José Antonio Yagüe Fabra
Source:
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Crossref
International Journal of Mechatronics and Manufacturing Systems
2017
|
Journal article
EID:
2-s2.0-85022326409
Contributors:
Torralba, M.;
Albajez, J.A.;
Yagüe-Fabra, J.A.;
Aguilar, J.J.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Sensors (Switzerland)
2017
|
Journal article
EID:
2-s2.0-85019636563
Contributors:
Jiménez, R.;
Torralba, M.;
Yagüe-Fabra, J.A.;
Ontiveros, S.;
Tosello, G.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Sensors (Switzerland)
2017
|
Journal article
EID:
2-s2.0-85028710153
Contributors:
Torralba, M.;
Díaz-Pérez, L.C.;
Valenzuela, M.;
Albajez, J.A.;
Yagüe-Fabra, J.A.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Procedia Manufacturing
2017
|
Journal article
EID:
2-s2.0-85030836759
Contributors:
Díaz-Pérez, L.C.;
Torralba, M.;
Albajez, J.A.;
Yagüe-Fabra, J.A.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Proceedings of the 17th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2017
2017
|
Conference paper
EID:
2-s2.0-85041323651
Contributors:
Díaz-Pérez, L.;
Torralba, M.;
Albajez, J.A.;
Yagüe-Fabra, J.A.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016
2016
|
Conference paper
EID:
2-s2.0-84984621704
Contributors:
Torralba, M.;
Díaz-Pérez, L.;
Valenzuela, M.;
Albajez, J.;
Yagüe-Fabra, J.;
Aguilar, J.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Sensors (Switzerland)
2016
|
Journal article
EID:
2-s2.0-84954349580
Contributors:
Torralba, M.;
Yagüe-Fabra, J.A.;
Albajez, J.A.;
Aguilar, J.J.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Measurement: Journal of the International Measurement Confederation
2016
|
Journal article
EID:
2-s2.0-84963692173
Contributors:
Torralba, M.;
Valenzuela, M.;
Yagüe-Fabra, J.A.;
Albajez, J.A.;
Aguilar, J.J.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Measurement Science and Technology
2015
|
Journal article
EID:
2-s2.0-84948456757
Contributors:
Torralba, M.;
Hastings, D.J.;
Thousand, J.D.;
Nowakowski, B.K.;
Smith, S.T.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Procedia Engineering
2015
|
Conference paper
EID:
2-s2.0-84962786544
Contributors:
Torralba, M.;
Albajez, J.A.;
Yagüe, J.A.;
Aguilar, J.A.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry, LMPMI 2014
2014
|
Conference paper
EID:
2-s2.0-84907372462
Contributors:
Torralba, M.;
Yagüe-Fabra, J.A.;
Albajez, J.A.;
Valenzuela, M.;
Acero, R.;
Aguilar, J.J.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Key Engineering Materials
2014
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Book
EID:
2-s2.0-84904107142
Contributors:
Acero, R.;
Albajez, J.A.;
Yagüe-Fabra, J.A.;
Torralba, M.;
Valenzuela, M.;
Aguilar, J.J.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Proceedings of the 13th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2013
2013
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Conference paper
EID:
2-s2.0-84908206170
Contributors:
Valenzuela, M.;
Torralba, M.;
J.Albajez, A.;
Yagüe, J.A.;
Aguilar, J.J.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
11th IMEKO TC14 International Symposium on Measurement and Quality Control, ISMQC 2013
2013
|
Conference paper
EID:
2-s2.0-84907355122
Contributors:
Torralba, M.;
Yagüe-Fabra, J.A.;
Albajez, J.A.;
Valenzuela, M.;
Acero, R.;
Aguilar, J.J.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Procedia Engineering
2013
|
Conference paper
EID:
2-s2.0-84891686679
Contributors:
Acero, R.;
Albajez, J.A.;
Yagüe-Fabra, J.A.;
Torralba, M.;
Valenzuela, M.;
Aguilar, J.J.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier
Proceedings of the 12th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2012
2012
|
Conference paper
EID:
2-s2.0-84907373344
Contributors:
Torralba, M.;
Valenzuela, M.;
Acero, R.;
Yagüe-Fabra, J.A.;
Albajez, J.A.;
Aguilar, J.J.;
Hocken, R.J.
Source:
Marta Torralba Gracia
via
Scopus - Elsevier