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Improved Static Hand Gesture Classification on Deep Convolutional Neural Networks Using Novel Sterile Training Technique

IEEE Access
2021 | Journal article
EID:

2-s2.0-85099530822

Part of ISSN: 21693536
Contributors: Smith, J.W.; Thiagarajan, S.; Willis, R.; Makris, Y.; Torlak, M.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

On Improving Hotspot Detection Through Synthetic Pattern-Based Database Enhancement

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2021 | Journal article
EID:

2-s2.0-85099254368

Part of ISSN: 19374151 02780070
Contributors: Reddy, G.R.; Xanthopoulos, C.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

A Hardware-Based Architecture-Neutral Framework for Real-Time IoT Workload Forensics

IEEE Transactions on Computers
2020 | Journal article
EID:

2-s2.0-85086712159

Part of ISSN: 15579956 00189340
Contributors: Zhou, L.; Hu, Y.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Amplitude-Modulating Analog/RF Hardware Trojans in Wireless Networks: Risks and Remedies

IEEE Transactions on Information Forensics and Security
2020 | Journal article
EID:

2-s2.0-85086893704

Part of ISSN: 15566021 15566013
Contributors: Subramani, K.S.; Helal, N.; Antonopoulos, A.; Nosratinia, A.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

An Efficient MILP-Based Aging-Aware Floorplanner for Multi-Context Coarse-Grained Runtime Reconfigurable FPGAs

Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
2020 | Conference paper
EID:

2-s2.0-85087391933

Contributors: Hu, B.; Shihab, M.; Makris, Y.; Schaefer, B.C.; Sechen, C.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

ATTEST: Application-Agnostic Testing of a Novel Transistor-Level Programmable Fabric

Proceedings of the IEEE VLSI Test Symposium
2020 | Conference paper
EID:

2-s2.0-85086498497

Contributors: Shihab, M.M.; Ramanidharan, B.; Tellakula, S.S.; Rajavendra Reddy, G.; Tian, J.; Sechen, C.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Automated Die Inking

IEEE Transactions on Device and Materials Reliability
2020 | Journal article
EID:

2-s2.0-85086767278

Part of ISSN: 15582574 15304388
Contributors: Xanthopoulos, C.; Neckermann, A.; List, P.; Tschernay, K.-P.; Sarson, P.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Bias Busters: Robustifying DL-based Lithographic Hotspot Detectors Against Backdooring Attacks

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2020 | Journal article
EID:

2-s2.0-85096089677

Part of ISSN: 19374151 02780070
Contributors: Liu, K.; Tan, B.; Reddy, G.R.; Garg, S.; Makris, Y.; Karri, R.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

DECOY: DEflection-Driven HLS-based computation partitioning for obfuscating intellectual propertY

Proceedings - Design Automation Conference
2020 | Conference paper
EID:

2-s2.0-85093958858

Part of ISSN: 0738100X
Contributors: Chen, J.; Zaman, M.; Makris, Y.; Blanton, R.D.S.; Mitra, S.; Schafer, B.C.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Hardware-Based Real-Time Workload Forensics

IEEE Design and Test
2020 | Journal article
EID:

2-s2.0-85078086851

Part of ISSN: 21682364 21682356
Contributors: Zhang, Y.; Zhou, L.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Range-Controlled Floating-Gate Transistors: A Unified Solution for Unlocking and Calibrating Analog ICs

Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
2020 | Conference paper
EID:

2-s2.0-85087402411

Contributors: Rao Nimmalapudi, S.G.; Volanis, G.; Lu, Y.; Antonopoulos, A.; Marshall, A.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Analog Performance Locking through Neural Network-Based Biasing

Proceedings of the IEEE VLSI Test Symposium
2019 | Conference paper
EID:

2-s2.0-85069217305

Contributors: Volanis, G.; Lu, Y.; Rao Nimmalapudi, S.G.; Antonopoulos, A.; Marshall, A.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Automated Die Inking through On-line Machine Learning

2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
2019 | Conference paper
EID:

2-s2.0-85073720725

Contributors: Xanthopoulos, C.; Neckermann, A.; List, P.; Tschernay, K.-P.; Sarson, P.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

CAPE: A cross-layer framework for accurate microprocessor power estimation

Integration
2019 | Journal article
EID:

2-s2.0-85068382827

Part of ISSN: 01679260
Contributors: Zaman, M.; Shihab, M.M.; Coskun, A.K.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Demonstrating and Mitigating the Risk of an FEC-Based Hardware Trojan in Wireless Networks

IEEE Transactions on Information Forensics and Security
2019 | Journal article
EID:

2-s2.0-85067642730

Part of ISSN: 15566021 15566013
Contributors: Subraman, K.S.; Antonopoulos, A.; Abotabl, A.A.; Nosratinia, A.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Design Obfuscation through Selective Post-Fabrication Transistor-Level Programming

Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
2019 | Conference paper
EID:

2-s2.0-85066630284

Contributors: Shihab, M.M.; Tian, J.; Reddy, G.R.; Hu, B.; Swartz, W.; Carrion Schaefer, B.; Sechen, C.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Design space exploration for hotspot detection

Proceedings - 2019 20th International Workshop on Microprocessor/SoC Test, Security and Verification, MTV 2019
2019 | Conference paper
EID:

2-s2.0-85082993684

Contributors: Rajavendra Reddy, G.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Extending the Lifetime of Coarse-Grained Runtime Reconfigurable FPGAs by Balancing Processing Element Usage

Proceedings - 2019 International Conference on Field-Programmable Technology, ICFPT 2019
2019 | Conference paper
EID:

2-s2.0-85084922340

Contributors: Hu, B.; Shihab, M.; Makris, Y.; Schaefer, B.C.; Sechen, C.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Functional obfuscation of hardware accelerators through selective partial design extraction onto an embedded FPGA

Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI
2019 | Conference paper
EID:

2-s2.0-85083193692

Contributors: Hu, B.; Tian, J.; Shihab, M.; Reddy, G.R.; Swartz, W.; Makris, Y.; Schaefer, B.C.; Sechen, C.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Hardware Dithering: A Run-Time Method for Trojan Neutralization in Wireless Cryptographic ICs

Proceedings - International Test Conference
2019 | Conference paper
EID:

2-s2.0-85062407909

Part of ISSN: 10893539
Contributors: Kapatsori, C.; Liu, Y.; Antonopoulos, A.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Hardware-based Real-time Workload Forensics via Frame-level TLB Profiling

Proceedings of the IEEE VLSI Test Symposium
2019 | Conference paper
EID:

2-s2.0-85069186990

Contributors: Zhang, Y.; Zhou, L.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Machine learning-based hotspot detection: Fallacies, pitfalls and marching orders

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
2019 | Conference paper
EID:

2-s2.0-85077803604

Part of ISSN: 10923152
Contributors: Reddy, G.R.; Madkour, K.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Machine Learning-based Noise Classification and Decomposition in RF Transceivers

Proceedings of the IEEE VLSI Test Symposium
2019 | Conference paper
EID:

2-s2.0-85069203060

Contributors: Neethirajan, D.; Xanthopoulos, C.; Subramani, K.; Schaub, K.; Leventhal, I.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

On the use of Bayesian Networks for Resource-Efficient Self-Calibration of Analog/RF ICs

Proceedings - International Test Conference
2019 | Conference paper
EID:

2-s2.0-85062430197

Part of ISSN: 10893539
Contributors: Andraud, M.; Galindez, L.; Lu, Y.; Makris, Y.; Verhelst, M.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Post-Production Calibration of Analog/RF ICs: Recent Developments and A Fully Integrated Solution

SMACD 2019 - 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Proceedings
2019 | Conference paper
EID:

2-s2.0-85071549253

Contributors: Antonopoulos, A.; Volanis, G.; Lu, Y.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Revisiting capacitor-based trojan design

Proceedings - 2019 IEEE International Conference on Computer Design, ICCD 2019
2019 | Conference paper
EID:

2-s2.0-85081157541

Contributors: Bidmeshki, M.M.; Subramani, K.S.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Subtle anomaly detection of microscopic probes using deep learning based image completion

Proceedings - International Test Conference
2019 | Conference paper
EID:

2-s2.0-85081574118

Part of ISSN: 10893539
Contributors: Ikeda, K.; Schaub, K.; Leventhal, I.; Makris, Y.; Xanthopoulos, C.; Neethirajan, D.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Trusted and Secure Design of Analog/RF ICs: Recent Developments

2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
2019 | Conference paper
EID:

2-s2.0-85073718881

Contributors: Subramani, K.; Volanis, G.; Bidmeshki, M.-M.; Antonopoulos, A.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

VIPER: A versatile and intuitive pattern GenERator for early design space exploration

Proceedings - International Test Conference
2019 | Conference paper
EID:

2-s2.0-85081552888

Part of ISSN: 10893539
Contributors: Reddy, G.R.; Bidmeshki, M.-M.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Wafer-Level Adaptive V<inf>min</inf> Calibration Seed Forecasting

Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
2019 | Conference paper
EID:

2-s2.0-85066610649

Contributors: Xanthopoulos, C.; Neethirajan, D.; Boddikurapati, S.; Nahar, A.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Enhanced hotspot detection through synthetic pattern generation and design of experiments

Proceedings of the IEEE VLSI Test Symposium
2018 | Conference paper
EID:

2-s2.0-85048367436

Contributors: Reddy, G.R.; Xanthopoulos, C.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Hardware-assisted rootkit detection via on-line statistical fingerprinting of process execution

Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
2018 | Conference paper
EID:

2-s2.0-85048824116

Contributors: Zhou, L.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Special session on machine learning: How will machine learning transform test?

Proceedings of the IEEE VLSI Test Symposium
2018 | Conference paper
EID:

2-s2.0-85048361520

Contributors: Makris, Y.; Nahar, A.; Stratigopoulos, H.-G.; Hutner, M.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Towards a Cross-Layer Framework for Accurate Power Modeling of Microprocessor Designs

2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2018
2018 | Conference paper
EID:

2-s2.0-85054473132

Contributors: Zaman, M.; Shihab, M.M.; Coskun, A.K.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Towards provably-secure performance locking

Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
2018 | Conference paper
EID:

2-s2.0-85048771054

Contributors: Zaman, M.; Sengupta, A.; Liu, D.; Sinanoglu, O.; Makris, Y.; Rajendran, J.J.V.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

A field programmable transistor array featuring single-cycle partial/full dynamic reconfiguration

Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
2017 | Conference paper
EID:

2-s2.0-85020161608

Contributors: Tian, J.; Reddy, G.R.; Wang, J.; Swartz, W.; Makris, Y.; Sechen, C.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

ACE: Adaptive channel estimation for detecting analog/RF trojans in WLAN transceivers

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
2017 | Conference paper
EID:

2-s2.0-85043508145

Part of ISSN: 10923152
Contributors: Subramani, K.S.; Antonopoulos, A.; Abotabl, A.A.; Nosratinia, A.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Automated die inking: A pattern recognition-based approach

Proceedings - International Test Conference
2017 | Conference paper
EID:

2-s2.0-85046425476

Part of ISSN: 10893539
Contributors: Xanthopoulos, C.; Sarson, P.; Reiter, H.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Data Secrecy Protection Through Information Flow Tracking in Proof-Carrying Hardware IP - Part I: Framework Fundamentals

IEEE Transactions on Information Forensics and Security
2017 | Journal article
EID:

2-s2.0-85029233527

Part of ISSN: 15566013
Contributors: Jin, Y.; Guo, X.; Dutta, R.G.; Bidmeshki, M.-M.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Data Secrecy Protection Through Information Flow Tracking in Proof-Carrying Hardware IP - Part II: Framework Automation

IEEE Transactions on Information Forensics and Security
2017 | Journal article
EID:

2-s2.0-85029215077

Part of ISSN: 15566013
Contributors: Bidmeshki, M.-M.; Guo, X.; Dutta, R.G.; Jin, Y.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Foreword

Proceedings of the IEEE VLSI Test Symposium
2017 | Conference paper
EID:

2-s2.0-85020226640

Contributors: Makris, Y.; Ravi, S.; Majumdar, A.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Hardware trojans in analog, mixed-signal, and RF ICs

The Hardware Trojan War: Attacks, Myths, and Defenses
2017 | Book chapter
EID:

2-s2.0-85042674562

Contributors: Antonopoulos, A.; Kapatsori, C.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Hardware-based on-line intrusion detection via system call routine fingerprinting

Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
2017 | Conference paper
EID:

2-s2.0-85020195313

Contributors: Zhou, L.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Hardware-based workload forensics and malware detection in microprocessors

Proceedings - 2016 17th International Workshop on Microprocessor and SOC Test and Verification, MTV 2016
2017 | Conference paper
EID:

2-s2.0-85017249889

Contributors: Zhou, L.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

INFECT: INconspicuous FEC-based Trojan: A hardware attack on an 802.11a/g wireless network

Proceedings of the 2017 IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2017
2017 | Conference paper
EID:

2-s2.0-85025157888

Contributors: Subramani, K.S.; Antonopoulos, A.; Abotabl, A.A.; Nosratinia, A.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Information flow tracking in analog/mixed-signal designs through proof-carrying hardware IP

Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
2017 | Conference paper
EID:

2-s2.0-85020174510

Contributors: Bidmeshki, M.-M.; Antonopoulos, A.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Knob non-idealities in learning-based post-production tuning of analog/RF ICs: Impact &amp; remedies

Proceedings of the IEEE VLSI Test Symposium
2017 | Conference paper
EID:

2-s2.0-85020172789

Contributors: Lu, Y.; Volanis, G.; Subramani, K.S.; Antonopoulos, A.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Security and trust in the analog/mixed-signal/RF domain: A survey and a perspective

Proceedings of the European Test Workshop
2017 | Conference paper
EID:

2-s2.0-85026904210

Part of ISSN: 15581780 15301877
Contributors: Antonopoulos, A.; Kapatsori, C.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Silicon Demonstration of Hardware Trojan Design and Detection in Wireless Cryptographic ICs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2017 | Journal article
EID:

2-s2.0-85007087179

Part of ISSN: 10638210
Contributors: Liu, Y.; Jin, Y.; Nosratinia, A.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier

Trusted Analog/Mixed-Signal/RF ICs: A Survey and a Perspective

IEEE Design and Test
2017 | Journal article
EID:

2-s2.0-85028931609

Part of ISSN: 21682356
Contributors: Antonopoulos, A.; Kapatsori, C.; Makris, Y.
Source: Self-asserted source
Yiorgos Makris via Scopus - Elsevier
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Peer review (3 reviews for 1 publication/grant)

Review activity for Journal of electronic testing. (3)