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On the Role of AlO x Thickness in AlO x /SiN y : H Layer Stacks Regarding Light- and Elevated Temperature-Induced Degradation and Hydrogen Diffusion in c-Si

IEEE Journal of Photovoltaics
2021-07 | Journal article
Contributors: Andreas Schmid; Christian Fischer; Daniel Skorka; Axel Herguth; Clemens Winter; Annika Zuschlag; Giso Hahn
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