Personal information

No personal information available

Activities

Collapse all

Works (1)

On the Role of AlO x Thickness in AlO x /SiN y : H Layer Stacks Regarding Light- and Elevated Temperature-Induced Degradation and Hydrogen Diffusion in c-Si

IEEE Journal of Photovoltaics
2021-07 | Journal article
DOI: 10.1109/JPHOTOV.2021.3075850
Contributors: Andreas Schmid; Christian Fischer; Daniel Skorka; Axel Herguth; Clemens Winter; Annika Zuschlag; Giso Hahn
Source: check_circle
Crossref
How many people are using ORCID?