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A Wafer Map Yield Prediction Based on Machine Learning for Productivity Enhancement

IEEE Transactions on Semiconductor Manufacturing
2019-11 | Journal article
DOI: 10.1109/TSM.2019.2945482
Contributors: Sung-Ju Jang; Jong-Seong Kim; Tae-Woo Kim; Hyun-Jin Lee; Seungbum Ko
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A Productivity-Oriented Wafer Map Optimization Using Yield Model Based on Machine Learning

IEEE Transactions on Semiconductor Manufacturing
2019-02 | Journal article
DOI: 10.1109/TSM.2018.2870253
Contributors: Jong-Seong Kim; Sung-Ju Jang; Tae-Woo Kim; Hyun-Jin Lee; Jong-Bae Lee
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