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Works (17)

A multi-instance learning based approach for whitefly pest detection

Indonesian Journal of Electrical Engineering and Computer Science
2023-08-01 | Journal article
Contributors: Lal Chand; Amardeep Singh Dhiman; Sikander Singh
Source: check_circle
Crossref

Test architecture optimization algorithms for coarse-grain partitioned 3D system-on-chip

Computers and Electrical Engineering
2022-07 | Journal article
Part of ISSN: 0045-7906
Contributors: Harpreet Vohra; Amardeep Singh
Source: Self-asserted source
0000-0002-4746-1205

Big Data Computing with Distributed Computing Frameworks

Lecture Notes in Networks and Systems
2019 | Book chapter
EID:

2-s2.0-85063231847

Contributors: Bhathal, G.S.; Singh, A.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

Big Data Solution: Improvised Distributions Framework of Hadoop

Proceedings of the 2nd International Conference on Intelligent Computing and Control Systems, ICICCS 2018
2019 | Conference paper
EID:

2-s2.0-85063769093

Contributors: Bhathal, G.S.; Dhiman, A.S.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

Test data compression using hierarchical block merging technique

IET Computers and Digital Techniques
2018 | Journal article
EID:

2-s2.0-85049384163

Contributors: Vohra, H.; Singh, A.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

Enhanced secure trusted AODV (ESTA) protocol to mitigate blackhole attack in mobile Ad hoc networks

Future Internet
2015 | Journal article
EID:

2-s2.0-85006201115

Contributors: Singh, D.; Singh, A.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

Emerging web tools and their applications in bioinformatics

Bioinformatics: Concepts, Methodologies, Tools, and Applications
2013 | Book chapter
EID:

2-s2.0-84944045062

Contributors: Singh, S.; Singh, A.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

Emerging web tools and their applications in bioinformatics

Business Organizations and Collaborative Web: Practices, Strategies and Patterns
2011 | Book chapter
EID:

2-s2.0-84899398188

Contributors: Singh, S.; Singh, A.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

Imaging of the parafoveal capillary network and its integrity analysis using fractal dimension

Biomedical Optics Express
2011 | Journal article
EID:

2-s2.0-79960747660

Contributors: Schmoll, T.; Singh, A.S.G.; Blatter, C.; Schriefl, S.; Ahlers, C.; Schmidt-Erfurth, U.; Leitgeb, R.A.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

Detection and segmentation of lines and words in Gurmukhi handwritten text

2010 IEEE 2nd International Advance Computing Conference, IACC 2010
2010 | Conference paper
EID:

2-s2.0-77951149568

Contributors: Kumar, R.; Singh, A.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

Flicker stimulated retinal perfusion changes assessed with high speed Doppler tomography

Progress in Biomedical Optics and Imaging - Proceedings of SPIE
2010 | Conference paper
EID:

2-s2.0-79953063372

Contributors: Schmoll, T.; Singh, A.S.G.; Frily, K.; Blatter, C.; Villiger, M.; Pache, C.; Lasser, T.; Leitgeb, R.A.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

Generating test patterns for FPGA circuits: A quantum computing approach

International Journal of Computational Methods
2009 | Journal article
EID:

2-s2.0-65149095378

Contributors: Singh, A.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

DNA computing approach for automated test pattern generation for digital circuits

International Journal of Systems Science
2008 | Journal article
EID:

2-s2.0-38349109655

Contributors: Singh, A.; Kaur, M.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

DNA and quantum based algorithms for VLSI circuits testing

Natural Computing
2005 | Journal article
EID:

2-s2.0-14844321535

Contributors: Singh, A.; Bharadwaj, L.M.; Harpreet, S.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

Applying Quantum Search to Automated Test Pattern Generation for VLSI Circuits

Parallel and Distributed Computing, Applications and Technologies, PDCAT Proceedings
2003 | Conference paper
EID:

2-s2.0-1642488953

Contributors: Singh, S.; Singh, A.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

Quantum Search Algorithm for Automated Test Pattern Generation in VLSI Testing

Proceedings of the International Conference on VLSI
2003 | Conference paper
EID:

2-s2.0-1642359213

Contributors: Singh, A.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier

Computing Optimum Bayesian Confidence Interval with Applications

Proceedings of the Joint Conference on Information Sciences
2000 | Conference paper
EID:

2-s2.0-1642313842

Contributors: Gewali, L.P.; Singh, A.K.; Ntafos, S.
Source: Self-asserted source
0000-0002-4746-1205 via Scopus - Elsevier